FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects
S. Hellebrand, T. Indlekofer, M. Kampmann, M. A. Kochte, C. Liu, H.-J. Wunderlich, in: IEEE International Test Conference (ITC’14), IEEE, Seattle, Washington, USA, 2014.

SAT-Based ATPG beyond Stuck-at Fault Testing
S. Hellebrand, H.-J. Wunderlich, DeGruyter Journal on Information Technology (It) 56 (2014) 165–172.

Adaptive Bayesian Diagnosis of Intermittent Faults
L. Rodriguez Gomez, A. Cook, T. Indlekofer, S. Hellebrand, H.-J. Wunderlich, Journal of Electronic Testing - Theory and Applications (JETTA) 30 (2014) 527–540.

A Scalable Formal Debugging Approach with Auto-Correction Capability based on Static Slicing and Dynamic Ranking for RTL Datapath Designs
B. Alizadeh, P. Behnam, S. Sadeghi-Kohan, IEEE Transactions on Computers (2014) 1–1.

An off-line MDSI interconnect BIST incorporated in BS 1149.1
M. Mohammadi, S. Sadeghi-Kohan, N. Masoumi, Z. Navabi, in: 2014 19th IEEE European Test Symposium (ETS), IEEE, 2014.

Improving polynomial datapath debugging with HEDs
S. Sadeghi-Kohan, P. Behnam, B. Alizadeh, M. Fujita, Z. Navabi, in: 2014 19th IEEE European Test Symposium (ETS), IEEE, 2014.

Analyzing and Quantifying Fault Tolerance Properties
S. Hellebrand, in: 14th IEEE Latin American Test Workshop - (LATW’13), IEEE, Cordoba, Argentina, 2013.

Adaptive Test and Diagnosis of Intermittent Faults
A. Cook, L. Rodriguez Gomez, S. Hellebrand, T. Indlekofer, H.-J. Wunderlich, Adaptive Test and Diagnosis of Intermittent Faults, 14th Latin American Test Workshop, Cordoba, Argentina, 2013.

BS 1149.1 extensions for an online interconnect fault detection and recovery
S. Sadeghi-Kohan, M. Namaki-Shoushtari, F. Javaheri, Z. Navabi, in: 2012 IEEE International Test Conference, IEEE, 2013.

A new structure for interconnect offline testing
S. Sadeghi-Kohan, S. Keshavarz, F. Zokaee, F. Farahmandi, Z. Navabi, in: East-West Design &;amp; Test Symposium (EWDTS 2013), IEEE, 2013.

Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test
A. Cook, S. Hellebrand, M. E. Imhof, A. Mumtaz, H.-J. Wunderlich, in: 13th IEEE Latin American Test Workshop (LATW’12), IEEE, Quito, Ecuador, 2012, pp. 1–4.

Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test
A. Cook, S. Hellebrand, H.-J. Wunderlich, in: 17th IEEE European Test Symposium (ETS’12), IEEE, Annecy, France, 2012, pp. 1–6.

Eingebaute Selbstdiagnose mit zufälligen und deterministischen Mustern
A. Cook, S. Hellebrand, H.-J. Wunderlich, Eingebaute Selbstdiagnose Mit Zufälligen Und Deterministischen Mustern, 24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany, 2012.

Diagnostic Test of Robust Circuits
A. Cook, S. Hellebrand, T. Indlekofer, H.-J. Wunderlich, in: 20th IEEE Asian Test Symposium (ATS’11), IEEE, New Delhi, India, 2011, pp. 285–290.

Towards Variation-Aware Test Methods
I. Polian, B. Becker, S. Hellebrand, H.-J. Wunderlich, P. Maxwell, in: 16th IEEE European Test Symposium Trondheim (ETS’11), IEEE, Trondheim, Norway, 2011.

Robuster Selbsttest mit Diagnose
A. Cook, S. Hellebrand, T. Indlekofer, H.-J. Wunderlich, in: 5. GMM/GI/ITG Fachtagung “Zuverlässigkeit Und Entwurf,” Hamburg, Germany, 2011, pp. 48–53.

Variation-Aware Fault Modeling
F. Hopsch, B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, H.-J. Wunderlich, SCIENCE CHINA Information Sciences, Science China Press, Co-Published with Springer 54 (2011) 1813–1826.

Virtual tester development using HDL/PLI
A. Kamran, N. Nemati, S. Sadeghi-Kohan, Z. Navabi, in: 2010 East-West Design &;amp; Test Symposium (EWDTS), IEEE, 2011.

Testdatenkompression mit Hilfe der Netzwerkinfrastruktur
V. Fröse, R. Ibers, S. Hellebrand, Testdatenkompression Mit Hilfe Der Netzwerkinfrastruktur, 22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany, 2010.

Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits
B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, H.-J. Wunderlich, in: 40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10), IEEE, Chicago, IL, USA, 2010.