@inproceedingsHunger_Hellebrand_Czutro_Polian_Becker_2009, place=Stuttgart, Germany, title=Robustheitsanalyse stark fehlersicherer Schaltungen mit SAT-basierter Testmustererzeugung, booktitle=3. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”, author=Hunger, Marc and Hellebrand, Sybille and Czutro, Alexander and Polian, Ilia and Becker, Bernd, year=2009 

@bookCoym_Hellebrand_Ludwig_Straube_Wunderlich_G. Zoellin_2008, place=20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (Poster), Wien, Österreich, title=Ein verfeinertes elektrisches Modell für Teilchentreffer und dessen Auswirkung auf die Bewertung der Schaltungsempfindlichkeit, author=Coym, Torsten and Hellebrand, Sybille and Ludwig, Stefan and Straube, Bernd and Wunderlich, Hans-Joachim and G. Zoellin, Christian, year=2008 

@bookAmgalan_Hachmann_Hellebrand_Wunderlich_2008, place=20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Wien, Österreich, title=Testen mit Rücksetzpunkten - ein Ansatz zur Verbesserung der Ausbeute bei robusten Schaltungen, author=Amgalan, Uranmandakh and Hachmann, Christian and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2008 

@inproceedingsOehler_Bosio_di Natale_Hellebrand_2008, place=Rhodos, Greece, title=A Modular Memory BIST for Optimized Memory Repair, DOI=10.1109/iolts.2008.30, booktitle=14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster), publisher=IEEE, author=Oehler, Philipp and Bosio, Alberto and di Natale, Giorgio and Hellebrand, Sybille, year=2008 

@inproceedingsAmgalan_Hachmann_Hellebrand_Wunderlich_2008, place=San Diego, CA, USA, title=Signature Rollback - A Technique for Testing Robust Circuits, DOI=10.1109/vts.2008.34, booktitle=26th IEEE VLSI Test Symposium (VTS’08), publisher=IEEE, author=Amgalan, Uranmandakh and Hachmann, Christian and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2008, pages=125–130 

@inproceedingsHunger_Hellebrand_2008, place=Rhodos, Greece, title=Verification and Analysis of Self-Checking Properties through ATPG, DOI=10.1109/iolts.2008.32, booktitle=14th IEEE International On-Line Testing Symposium (IOLTS’08), publisher=IEEE, author=Hunger, Marc and Hellebrand, Sybille, year=2008 

@inproceedingsHunger_Hellebrand_2008, place=Ingolstadt, Germany, title=Analyse selbstprüfender Schaltungen – Nachweis von Fehlersicherheit und Selbsttestbarkeit mit ATPG, booktitle=2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”, author=Hunger, Marc and Hellebrand, Sybille, year=2008 

@inproceedingsOehler_Bosio_Di Natale_Hellebrand_2008, place=Ingolstadt, Germany, title=Modularer Selbsttest und optimierte Reparaturanalyse, booktitle=2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”, author=Oehler, Philipp and Bosio, Alberto and Di Natale, Giorgio and Hellebrand, Sybille, year=2008 

@bookHellebrand_2007, place=5th IEEE East-West Design \'26; Test Symposium, Yerevan, Armenia (Invited Talk), title=Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing, author=Hellebrand, Sybille, year=2007 

@bookAli_Welzl_Hessler_Hellebrand_2007, place=DATE 2007 Friday Workshop on Diagnostic Services in Network-on-Chips, Nice, France, (Poster), title=An End-to-End Reliability Protocol to Address Transient Faults in Network on Chips, author=Ali, Muhammad and Welzl, Michael and Hessler, Sven and Hellebrand, Sybille, year=2007 

@bookOehler_Hellebrand_Wunderlich_2007, place=17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Erlangen, Germany, title=An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy, author=Oehler, Philipp and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2007 

@bookHellebrand_2007, place=ForschungsForum Paderborn, 10. Ausgabe, Paderborn, Germany, title=Qualitätssicherung für Nanochips - Wie IT-Produkte zuverlässig werden, author=Hellebrand, Sybille, year=2007 

@inproceedingsHellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, place=Rome, Italy, title=A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction, DOI=10.1109/dft.2007.43, booktitle=22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT’07), publisher=IEEE, author=Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd, year=2007, pages=50–58 

@inproceedingsOehler_Hellebrand_Wunderlich_2007, place=Krakow, Poland, title=Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair, DOI=10.1109/ddecs.2007.4295278, booktitle=10th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS’07), publisher=IEEE, author=Oehler, Philipp and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2007, pages=185–190 

@inproceedingsOehler_Hellebrand_Wunderlich_2007, place=Freiburg, Germany, title=An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy, DOI=10.1109/ets.2007.10, booktitle=12th IEEE European Test Symposium (ETS’07), publisher=IEEE, author=Oehler, Philipp and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2007, pages=91–96 

@inproceedingsHellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, place=Bled, Slovenia, title=Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance, booktitle=43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper), author=Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd, year=2007 

@articleHellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, title=Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance, volume=37, number=4 (124), journal=Informacije MIDEM, Ljubljana (Invited Paper), author=Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd, year=2007, pages=212–219 

@articleAli_Hessler_Welzl_Hellebrand_2007, title=An Efficient Fault Tolerant Mechanism to Deal with Permanent and Transient Failures in a Network on Chip, volume=1, number=2, journal=International Journal on High Performance Systems Architecture, author=Ali, Muhammad and Hessler, Sven and Welzl, Michael and Hellebrand, Sybille, year=2007, pages=113–123 

@inproceedingsAli_Welzl_Hessler_Hellebrand_2007, place=Las Vegas, Nevada, USA, title=A Fault Tolerant Mechanism for Handling Permanent and Transient Failures in a Network on Chip, booktitle=4th International Conference on Information Technology: New Generations (ITNG’07), author=Ali, Muhammad and Welzl, Michael and Hessler, Sven and Hellebrand, Sybille, year=2007, pages=1027–1032 

@inproceedingsBecker_Polian_Hellebrand_Straube_Wunderlich_2007, place=Munich, Germany, title=Test und Zuverlässigkeit nanoelektronischer Systeme, booktitle=1. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”, author=Becker, Bernd and Polian, Ilia and Hellebrand, Sybille and Straube, Bernd and Wunderlich, Hans-Joachim, year=2007