@articleBecker_Polian_Hellebrand_Straube_Wunderlich_2006, title=DFG-Projekt RealTest - Test und Zuverlässigkeit nanoelektronischer Systeme, volume=48, number=5, journal=it - Information Technology, author=Becker, Bernd and Polian, Ilia and Hellebrand, Sybille and Straube, Bernd and Wunderlich, Hans-Joachim, year=2006, pages=305–311 

@bookOehler_Hellebrand_2005, place=Kleinheubachertagung 2005, Miltenberg, Germany, title=A Low Power Design for Embedded DRAMs with Online Consistency Checking, author=Oehler, Philipp and Hellebrand, Sybille, year=2005 

@bookAli_Welzl_Hellebrand_2005, place=17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria, title=Dynamic Routing: A Prerequisite for Reliable NoCs, author=Ali, Muhammad and Welzl, Michael and Hellebrand, Sybille, year=2005 

@bookOehler_Hellebrand_2005, place=17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria, title=Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study, author=Oehler, Philipp and Hellebrand, Sybille, year=2005 

@inproceedingsAli_Welzl_Zwicknagl_Hellebrand_2005, place=Islamabad, Pakistan, title=Considerations for Fault-Tolerant Networks on Chips, DOI=10.1109/icm.2005.1590063, booktitle=IEEE International Conference on Microelectronics (ICM’05), publisher=IEEE, author=Ali, Muhammad and Welzl, Michael and Zwicknagl, Martin and Hellebrand, Sybille, year=2005 

@inproceedingsOehler_Hellebrand_2005, place=Tallinn, Estonia, title=Low Power Embedded DRAMs with High Quality Error Correcting Capabilities, DOI=10.1109/ets.2005.28, booktitle=10th IEEE European Test Symposium (ETS’05), publisher=IEEE, author=Oehler, Philipp and Hellebrand, Sybille, year=2005, pages=148–153 

@inproceedingsAli_Welzl_Hellebrand_2005, place=Oulu, Finland, title=A Dynamic Routing Mechanism for Network on Chip, DOI=10.1109/norchp.2005.1596991, booktitle=23rd IEEE NORCHIP Conference, publisher=IEEE, author=Ali, Muhammad and Welzl, Michael and Hellebrand, Sybille, year=2005, pages=70–73 

@inproceedingsLiu Jing_Ruehrup_Schindelhauer_Volbert_Dierkes_Bellgardt_Ibers_Hilleringmann_2004, place=Tilburg, Netherlands, title=Sensor Networks with More Features Using Less Hardware, booktitle=GOR/NGB Conference Tilburg 2004, author=Liu Jing, Michelle and Ruehrup, Stefan and Schindelhauer, Christian and Volbert, Klaus and Dierkes, Martin and Bellgardt, Andreas and Ibers, Rüdiger and Hilleringmann, Ulrich, year=2004 

@bookBreu_Fahringer_Fensel_Hellebrand_Middeldorp_Scherzer_2004, place=OCG Journal, pp. 28-29, title=Im Westen viel Neues - Informatik an der Universität Innsbruck, author=Breu, Ruth and Fahringer, Thomas and Fensel, Dieter and Hellebrand, Sybille and Middeldorp, Aart and Scherzer, Otmar, year=2004 

@bookHellebrand_Wuertenberger_S. Tautermann_2004, place=9th IEEE European Test Symposium, Ajaccio, Corsica, France, title=Data Compression for Multiple Scan Chains Using Dictionaries with Corrections, author=Hellebrand, Sybille and Wuertenberger, Armin and S. Tautermann, Christofer, year=2004 

@inproceedingsWuertenberger_S. Tautermann_Hellebrand_2004, place=Charlotte, NC, USA, title=Data Compression for Multiple Scan Chains Using Dictionaries with Corrections, DOI=10.1109/test.2004.1387357, booktitle=IEEE International Test Conference (ITC’04), publisher=IEEE, author=Wuertenberger, Armin and S. Tautermann, Christofer and Hellebrand, Sybille, year=2004, pages=926–935 

@bookBreu_Hellebrand_Welzl_2003, place=Handouts ACS/IEEE Workshop on Practice and Experience with Java in Education, Tunis, Tunisia, title=Experiences from Teaching Software Development in a Java Environment, author=Breu, Ruth and Hellebrand, Sybille and Welzl, Michael, year=2003 

@inproceedingsWuertenberger_S. Tautermann_Hellebrand_2003, place=Charlotte, NC, USA, title=A Hybrid Coding Strategy for Optimized Test Data Compression, DOI=10.1109/test.2003.1270870, booktitle=IEEE International Test Conference (ITC’03), publisher=IEEE, author=Wuertenberger, Armin and S. Tautermann, Christofer and Hellebrand, Sybille, year=2003, pages=451–459 

@bookHellebrand_Wuertenberger_2002, place=IEEE International Workshop on Test Resource Partitioning, Baltimore, MD, USA, title=Alternating Run-Length Coding: A Technique for Improved Test Data Compression, author=Hellebrand, Sybille and Wuertenberger, Armin, year=2002 

@articleHellebrand_Wunderlich_A. Ivaniuk_V. Klimets_N. Yarmolik_2002, title=Efficient Online and Offline Testing of Embedded DRAMs, volume=51, DOI=10.1109/tc.2002.1017700, number=7, journal=IEEE Transactions on Computers, publisher=IEEE, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and A. Ivaniuk, Alexander and V. Klimets, Yuri and N. Yarmolik, Vyacheslav, year=2002, pages=801–809 

@articleHellebrand_Liang_Wunderlich_2002, title=Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST, volume=18, number=2, journal=Journal of Electronic Testing - Theory and Applications (JETTA), author=Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim, year=2002, pages=157–168 

@articleLiang_Hellebrand_Wunderlich_2002, title=A Mixed-Mode BIST Scheme Based on Folding Compression, volume=17, number=2, journal=Journal on Computer Science and Technology, author=Liang, Huaguo and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2002, pages=203–212 

@bookLiang_Hellebrand_Wunderlich_2001, place=IEEE European Test Workshop, Stockholm, Sweden, title=Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST, author=Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2001 

@inproceedingsLiang_Hellebrand_Wunderlich_2001, place=Baltimore, MD, USA, title=Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST, DOI=10.1109/test.2001.966712, booktitle=IEEE International Test Conference (ITC’01), publisher=IEEE, author=Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2001, pages=894–902 

@articleLiang_Hellebrand_Wunderlich_2001, title=Deterministic BIST Scheme Based on Reseeding of Folding Counters, volume=38, number=8, journal=Journal of Computer Research and Development, (Jisuanji Yanjiu yu Fazhan), author=Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2001, pages=931