Titanium disilicide as hot side metallization layer for thermoelectric generators
U. Hilleringmann, M. Schonhoff, F. Assion, in: 2013 Africon, IEEE, 2014.
LibreCat: /record/39518
DOI: 10.1109/afrcon.2013.6757616

Self-organization of nanospheres in trenches on silicon surfaces
K. Brassat, F. Assion, U. Hilleringmann, J. Lindner, Physica Status Solidi (A) 210 (2013) 1485–1489.
LibreCat: /record/4098
DOI: 10.1002/pssa.201200899

Self-organization of nanospheres in trenches on silicon surfaces
K. Brassat, F. Assion, U. Hilleringmann, J.K.N. Lindner, Physica Status Solidi (a) 210 (2013) 1485–1489.
LibreCat: /record/39506
DOI: 10.1002/pssa.201200899

Titanium Disilicide as High-Temperature Contact Material for Thermoelectric Generators
F. Assion, M. Schönhoff, U. Hilleringmann, Journal of Electronic Materials 42 (2013) 1932–1935.
LibreCat: /record/39508
DOI: 10.1007/s11664-013-2478-2

Enhanced organic light-emitting diode based on a columnar liquid crystal by integration in a microresonator
O. Kasdorf, J. Vollbrecht, B. Ohms, U. Hilleringmann, H. Bock, H.-S. Kitzerow, International Journal of Energy Research 38 (2013) 452–458.
LibreCat: /record/39485
DOI: 10.1002/er.3127

Design and implementation of a measurement system for automatically measurement of electrical parameters of thermoelectric generators
D. Petrov, F. Assion, U. Hilleringmann, MRS Proceedings 1490 (2013) 191–196.
LibreCat: /record/39514
DOI: 10.1557/opl.2013.318

Formation and Properties of TiSi<sub>2</sub> as Contact Material for High-Temperature Thermoelectric Generators
F. Assion, M. Schönhoff, U. Hilleringmann, MRS Proceedings 1490 (2013) 97–102.
LibreCat: /record/39523
DOI: 10.1557/opl.2012.1557

Electrical characterization of rubber mixture sheets based on a coaxial probe method in combination with 3D electromagnetic simulation model
K. Kanwar, C. Fischer, V. Geneiss, T. Mager, U. Ballhausen, C. Hedayat, U. Hilleringmann, in: 2012 IEEE International Conference on RFID-Technologies and Applications (RFID-TA), IEEE, 2013.
LibreCat: /record/39524
DOI: 10.1109/rfid-ta.2012.6404507

Enhanced event-driven modeling of a CP-PLL with nonlinearities and nonidealities
C. Hangmann, C. Hedayat, U. Hilleringmann, in: 2013 IEEE 56th International Midwest Symposium on Circuits and Systems (MWSCAS), IEEE, 2013.
LibreCat: /record/39511
DOI: 10.1109/mwscas.2013.6674647

Resistivity reduction in flexible dye sensitized solar cells by UV irradiation and carbon nanotubes
U. Hilleringmann, B. Ohms, A. Kleine, in: 2013 IEEE International Conference on Industrial Technology (ICIT), IEEE, 2013.
LibreCat: /record/39509
DOI: 10.1109/icit.2013.6505770

Characterization and Analysis of the Hysteresis in a ZnO Nanoparticle Thin-Film Transistor
F.F. Vidor, G. Wirth, F. Assion, K. Wolff, U. Hilleringmann, IEEE Transactions on Nanotechnology 12 (2013) 296–303.
LibreCat: /record/39504
DOI: 10.1109/tnano.2012.2236891

Design and analysis of UHF RFID tag for a rubber transmission belt based on 3D electrical model
K. Kanwar, V. Geneiss, T. Mager, S. Scheele, U. Ballhausen, C. Hedayat, U. Hilleringmann, in: 2013 21st International Conference on Software, Telecommunications and Computer Networks - (SoftCOM 2013), IEEE, 2013.
LibreCat: /record/39516
DOI: 10.1109/softcom.2013.6671864

Designing output-power-optimized thermoelectric generators via analytic and finite element method modelling
F. Assion, C. Fischer, M. Schonhof, U. Hilleringmann, C. Hedayat, in: 2013 IEEE International Conference on Industrial Technology (ICIT), IEEE, 2013.
LibreCat: /record/39515
DOI: 10.1109/icit.2013.6505756

Enhanced organic light-emitting diode based on a columnar liquid crystal by integration in a microresonator
O. Kasdorf, J. Vollbrecht, B. Ohms, U. Hilleringmann, H. Bock, H.-S. Kitzerow, International Journal of Energy Research 38 (2013) 452–458.
LibreCat: /record/39707
DOI: 10.1002/er.3127

Surface tension and its role for vertical wet etching of silicon
A. Brockmeier, F.J.S. Rodriguez, M. Harrison, U. Hilleringmann, Journal of Micromechanics and Microengineering 22 (2012).
LibreCat: /record/39520
DOI: 10.1088/0960-1317/22/12/125012

Surface tension and its role for vertical wet etching of silicon
A. Brockmeier, F.J.S. Rodriguez, M. Harrison, U. Hilleringmann, Journal of Micromechanics and Microengineering 22 (2012).
LibreCat: /record/39522
DOI: 10.1088/0960-1317/22/12/125012

Mikrosystemtechnik auf Silizium
U. Hilleringmann, Mikrosystemtechnik Auf Silizium, Vieweg+Teubner Verlag, Wiesbaden, 2012.
LibreCat: /record/39512
DOI: 10.1007/978-3-322-92766-8

Study on the Performance Enhancement of ZnO Nanoparticles Thin-Film Transistors
F.F. Vidor, G.I. Wirth, K. Wolff, U. Hilleringmann, ECS Transactions 39 (2011) 109–115.
LibreCat: /record/39533
DOI: 10.1149/1.3615183

Solution processed inverter based on zinc oxide nanoparticle thin-film transistors with poly(4-vinylphenol) gate dielectric
K. Wolff, U. Hilleringmann, Solid-State Electronics 62 (2011) 110–114.
LibreCat: /record/39527
DOI: 10.1016/j.sse.2011.01.046

Characterization of SiON integrated waveguides via FTIR and AFM measurements
T. Frers, T. Hett, U. Hilleringmann, G. Berth, A. Widhalm, A. Zrenner, in: 2011 Semiconductor Conference Dresden, IEEE, 2011.
LibreCat: /record/39536
DOI: 10.1109/scd.2011.6068744

Modeling and simulation of arbitrary ordered nonlinear charge-pump phase-locked loops
C. Wiegand, C. Hangmann, C. Hedayat, U. Hilleringmann, in: 2011 Semiconductor Conference Dresden, IEEE, 2011.
LibreCat: /record/39528
DOI: 10.1109/scd.2011.6068711

Semiconductor nanoparticles for electronic device integration on foils
U. Hilleringmann, K. Wolff, F. Assion, F.F. Vidor, G.I. Wirth, in: IEEE Africon ’11, IEEE, 2011.
LibreCat: /record/39530
DOI: 10.1109/afrcon.2011.6071983

Plane wave spectrum expansion from near-field measurements on no-planar lattices
C. Reinhold, C. Hangmann, T. Mager, C. Hedayat, U. Hilleringmann, in: Proc. 5th Int. Conf. on Electromagnetic Near-Field Characterization and Imaging (ICONIC) 2011, 2011, pp. 1–4.
LibreCat: /record/39537

Piezoelectric sensor array with evaluation electronic for counting grains in seed drills
S. Meyer zu Hoberge, U. Hilleringmann, C. Jochheim, M. Liebich, in: IEEE Africon ’11, IEEE, 2011.
LibreCat: /record/39529
DOI: 10.1109/afrcon.2011.6072063

Telemetric surface acoustic wave sensor for humidity
M. Dierkes, U. Hilleringmann, Advances in Radio Science 1 (2010) 131–133.
LibreCat: /record/39871
DOI: 10.5194/ars-1-131-2003

Non-linear behaviour of charge-pump phase-locked loops
C. Wiegand, C. Hedayat, U. Hilleringmann, Advances in Radio Science 8 (2010) 161–166.
LibreCat: /record/39539
DOI: 10.5194/ars-8-161-2010

Organic Field-Effect-Transistors with Pentacene for radio-controlled-price-tag applications
C. Pannemannn, T. Diekmann, U. Hilleringmann, Advances in Radio Science 1 (2010) 219–221.
LibreCat: /record/39869
DOI: 10.5194/ars-1-219-2003

Analysis and modeling of pseudo-short-channel effects in ZnO-nanoparticle thin-film transistors
K. Wolff, U. Hilleringmann, in: 2010 Proceedings of the European Solid State Device Research Conference, IEEE, 2010.
LibreCat: /record/39540
DOI: 10.1109/essderc.2010.5618383

Low-Temperature Integration of Nanoparticulate Zinc Oxide FETs on Glass Substrate
F. Assion, K. Wolff, U. Hilleringmann, in: Proceedings of the European Solid State Device Research Conference (ESSDERC), Seville, Spain, 2010, p. 17.
LibreCat: /record/39545

A Resonance PLL-based Tracking System for Capacitive Sensors-MEMS/NEMS
C. Wiegand, C. Hangmann, C. Hedayat, U. Hilleringmann, Smart System Integration SSI 2010 (2010).
LibreCat: /record/39544

Macro-modelling via radial basis functionen nets
C. Wiegand, C. Fischer, R. Kazemzadeh, C. Hedayat, W. John, U. Hilleringmann, Advances in Radio Science 6 (2010) 139–143.
LibreCat: /record/39558
DOI: 10.5194/ars-6-139-2008

Autonomous Sensor Nodes for Aircraft Structural Health Monitoring
T. Becker, M. Kluge, J. Schalk, K. Tiplady, C. Paget, U. Hilleringmann, T. Otterpohl, IEEE Sensors Journal 9 (2009) 1589–1595.
LibreCat: /record/39547
DOI: 10.1109/jsen.2009.2028775

Efficient Antenna Design of Inductive Coupled RFID-Systems with High Power Demand
C. Reinhold, P. Scholz, W. John, U. Hilleringmann, Journal of Communications 2 (2009).
LibreCat: /record/39559
DOI: 10.4304/jcm.2.6.14-23

N-type single nanoparticle ZnO transistors processed at low temperature
K. Wolff, U. Hilleringmann, in: 2009 Proceedings of the European Solid State Device Research Conference, IEEE, 2009.
LibreCat: /record/39548
DOI: 10.1109/essderc.2009.5331373

Lock Detection for Charge-Pump Phase-Locked Loops
C. Wiegand, C. Hedayat, U. Hilleringmann, Sophia Antipolis Microelectronics SAME (2009).
LibreCat: /record/39552

Dielectric layers for organic field effect transistors as gate dielectric and surface passivation
T. Diekmann, C. Pannemann, U. Hilleringmann, Physica Status Solidi (a) 205 (2008) 564–577.
LibreCat: /record/39556
DOI: 10.1002/pssa.200723406

Noise propagation for induced fast transient impulses on PCB-level
M. Taki, W. John, C. Hedayat, U. Hilleringmann, in: 2007 18th International Zurich Symposium on Electromagnetic Compatibility, IEEE, 2008.
LibreCat: /record/39568
DOI: 10.1109/emczur.2007.4388195

Power management for thermal energy harvesting in aircrafts
Th. Becker, M. Kluge, J. Schalk, T. Otterpohl, U. Hilleringmann, in: 2008 IEEE Sensors, IEEE, 2008.
LibreCat: /record/39555
DOI: 10.1109/icsens.2008.4716533

Analysis of Energy Transmission for Inductive Coupled RFID Tags
P. Scholz, C. Reinhold, W. John, U. Hilleringmann, in: 2007 IEEE International Conference on RFID, IEEE, 2008.
LibreCat: /record/39562
DOI: 10.1109/rfid.2007.346167

Antenna design of HF-RFID tags with high power requirement
P. Scholz, C. Reinhold, W. John, U. Hilleringmann, in: 2007.
LibreCat: /record/39570

Tuning the threshold voltage of organic field-effect transistors by an electret encapsulating layer
M. Scharnberg, V. Zaporojtchenko, R. Adelung, F. Faupel, C. Pannemann, T. Diekmann, U. Hilleringmann, Applied Physics Letters 90 (2007).
LibreCat: /record/39561
DOI: 10.1063/1.2426926

Electro-thermo-mechanical analytical modeling of multilayer cantilever microactuator
J. Jiang, U. Hilleringmann, X. Shui, Sensors and Actuators A: Physical 137 (2007) 302–307.
LibreCat: /record/39563
DOI: 10.1016/j.sna.2007.03.012

Nonlinear Identification of Complex Systems Using Radial Basis Function Networks and Model Order Reduction
C. Wiegand, C. Hedayat, W. John, Lj. Radic-Weissenfeld, U. Hilleringmann, in: 2007 IEEE International Symposium on Electromagnetic Compatibility, IEEE, 2007.
LibreCat: /record/39567
DOI: 10.1109/isemc.2007.145

6I-3 Low-Cost Transceiver Unit for SAW-Sensors Using Customized Hardware Components
P. Scholz, M. Dierkes, U. Hilleringmann, in: 2006 IEEE Ultrasonics Symposium, IEEE, 2007.
LibreCat: /record/39573
DOI: 10.1109/ultsym.2006.223

Encapsulating the active Layer of organic Thin-Film Transistors
C. Pannemann, T. Diekmann, U. Hilleringmann, U. Schurmann, M. Scharnberg, V. Zaporojtchenko, R. Adelung, F. Faupel, in: Polytronic 2005 - 5th International Conference on Polymers and Adhesives in Microelectronics and Photonics, IEEE, 2006.
LibreCat: /record/39842
DOI: 10.1109/polytr.2005.1596488

Degradation of organic field-effect transistors made of pentacene
Ch. Pannemann, T. Diekmann, U. Hilleringmann, Journal of Materials Research 19 (2005) 1999–2002.
LibreCat: /record/39846
DOI: 10.1557/jmr.2004.0267

On the degradation of organic field-effect transistors
Ch. Pannemann, T. Diekmann, U. Hilleringmann, in: Proceedings. The 16th International Conference on Microelectronics, 2004. ICM 2004., IEEE, 2005.
LibreCat: /record/39848
DOI: 10.1109/icm.2004.1434210

Degradation of organic field-effect transistors made of pentacene
Ch. Pannemann, T. Diekmann, U. Hilleringmann, Journal of Materials Research 19 (2005) 1999–2002.
LibreCat: /record/39349
DOI: 10.1557/jmr.2004.0267

Radiotracer measurements as a sensitive tool for the detection of metal penetration in molecular-based organic electronics
M. Scharnberg, J. Hu, J. Kanzow, K. Rätzke, R. Adelung, F. Faupel, C. Pannemann, U. Hilleringmann, S. Meyer, J. Pflaum, Applied Physics Letters 86 (2005).
LibreCat: /record/39574
DOI: 10.1063/1.1849845

Comparison between the charge carrier mobilities in pentacene OFET structures as obtained from electrical characterization and potentiometry
R. Scholz, A.-D. Müller, F. Müller, I. Thurzo, B.A. Paez, L. Mancera, D.R.T. Zahn, C. Pannemann, U. Hilleringmann, in: Z. Bao, D.J. Gundlach (Eds.), SPIE Proceedings, SPIE, 2005.
LibreCat: /record/39835
DOI: 10.1117/12.617004

Comparison between the charge carrier mobilities in pentacene OFET structures as obtained from electrical characterization and potentiometry
R. Scholz, A.-D. Müller, F. Müller, I. Thurzo, B.A. Paez, L. Mancera, D.R.T. Zahn, C. Pannemann, U. Hilleringmann, in: Z. Bao, D.J. Gundlach (Eds.), SPIE Proceedings, SPIE, 2005.
LibreCat: /record/39834
DOI: 10.1117/12.617004

Ätztechnik
U. Hilleringmann, in: Silizium-Halbleitertechnologie, Vieweg+Teubner Verlag, Wiesbaden, 2004, pp. 65–90.
LibreCat: /record/39850
DOI: 10.1007/978-3-322-94072-8_5

Imprint structured organic thin film transistors as driving circuit in single-use sensor applications
U. Hilleringmann, C. Pannemann, in: G. Zhang, H. Zhao, Z. Wang (Eds.), Fifth International Symposium on Instrumentation and Control Technology, SPIE, 2004.
LibreCat: /record/39872
DOI: 10.1117/12.521463

Piezoresistive pressure sensors in CVD diamond for high-temperature applications
R. Otterbach, U. Hilleringmann, in: G. Zhang, H. Zhao, Z. Wang (Eds.), Fifth International Symposium on Instrumentation and Control Technology, SPIE, 2004.
LibreCat: /record/39873
DOI: 10.1117/12.521928

Masking and etching of silicon and related materials for geometries down to 25 nm
U. Hilleringmann, T. Vieregge, J.T. Horstmann, in: IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.999), IEEE, 2003.
LibreCat: /record/39887
DOI: 10.1109/iecon.1999.822171

Matching analysis of NMOS-transistors with a channel length down to 30 nm
J.T. Horstmann, U. Hilleringmann, K. Goser, in: IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.999), IEEE, 2003.
LibreCat: /record/39888
DOI: 10.1109/iecon.1999.822163

Negative differential resistance in ultrashort bulk MOSFETs
G. Wirth, U. Hilleringmann, J.T. Horstmann, K. Goser, in: IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.999), IEEE, 2003.
LibreCat: /record/39885
DOI: 10.1109/iecon.1999.822164

Nanometer scale organic thin film transistors with Pentacene
Ch. Pannemann, T. Diekmann, U. Hilleringmann, Microelectronic Engineering 67–68 (2003) 845–852.
LibreCat: /record/39851
DOI: 10.1016/s0167-9317(03)00146-1

Optoelectronic system integration on silicon: waveguides, photodetectors, and VLSI CMOS circuits on one chip
U. Hilleringmann, K. Goser, IEEE Transactions on Electron Devices 42 (2002) 841–846.
LibreCat: /record/39904
DOI: 10.1109/16.381978

Characterization of submicron NMOS devices due to visible light emission
I. Schönstein, J. Müller, U. Hilleringmann, K. Goser, Microelectronic Engineering 21 (2002) 363–366.
LibreCat: /record/39912
DOI: 10.1016/0167-9317(93)90092-j

Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon
U. Hilleringmann, K. Goser, Microelectronic Engineering 19 (2002) 211–214.
LibreCat: /record/39914
DOI: 10.1016/0167-9317(92)90425-q

System integration of optical devices and analog CMOS amplifiers
E. Brass, U. Hilleringmann, K. Schumacher, IEEE Journal of Solid-State Circuits 29 (2002) 1006–1010.
LibreCat: /record/39906
DOI: 10.1109/4.297714

System integration of optical devices and analog CMOS amplifiers
E. Brass, U. Hilleringmann, K. Schumacher, IEEE Journal of Solid-State Circuits 29 (2002) 1006–1010.
LibreCat: /record/39907
DOI: 10.1109/4.297714

Characterisation of sub-100 nm-MOS-transistors processed by optical lithography and a sidewall-etchback technique
J.T. Horstmann, U. Hilleringmann, K. Goser, Microelectronic Engineering 30 (2002) 431–434.
LibreCat: /record/39899
DOI: 10.1016/0167-9317(95)00280-4

VLSI technologies for artificial neural networks
K. Goser, U. Hilleringmann, U. Rueckert, K. Schumacher, IEEE Micro 9 (2002) 28–44.
LibreCat: /record/39925
DOI: 10.1109/40.42985

A novel insulation technique for smart power switching devices and very high voltage ICs above 10 kV
V. Mankowski, U. Hilleringmann, K. Schumacher, Microelectronic Engineering 53 (2002) 525–528.
LibreCat: /record/39882
DOI: 10.1016/s0167-9317(00)00370-1

1/f-Noise of sub-100 nm-MOS-transistors fabricated by a special deposition and etchback technique
J.T. Horstmann, U. Hilleringmann, K. Goser, Microelectronic Engineering 53 (2002) 213–216.
LibreCat: /record/39879
DOI: 10.1016/s0167-9317(00)00299-9

Noise analysis of sub-100 nm-MOS-transistors fabricated by a special deposition and etchback technique
J.T. Horstmann, U. Hilleringmann, K. Goser, in: 2000 26th Annual Conference of the IEEE Industrial Electronics Society. IECON 2000. 2000 IEEE International Conference on Industrial Electronics, Control and Instrumentation. 21st Century Technologies and Industrial Opportunities (Cat. No.001), IEEE, 2002.
LibreCat: /record/39880
DOI: 10.1109/iecon.2000.972560

Noise analysis of sub-100 nm-MOS-transistors fabricated by a special deposition and etchback technique
J.T. Horstmann, U. Hilleringmann, K. Goser, in: 2000 26th Annual Conference of the IEEE Industrial Electronics Society. IECON 2000. 2000 IEEE International Conference on Industrial Electronics, Control and Instrumentation. 21st Century Technologies and Industrial Opportunities (Cat. No.001), IEEE, 2002.
LibreCat: /record/39881
DOI: 10.1109/iecon.2000.972560

A silicon based technology for monolithic integration of waveguides and VLSI CMOS circuits
U. Hilleringmann, K. Knospe, C. Heite, K. Schumacher, K. Goser, Microelectronic Engineering 15 (2002) 289–292.
LibreCat: /record/39919
DOI: 10.1016/0167-9317(91)90231-2

VLSI technologies for artificial neural networks
K. Goser, U. Hilleringmann, U. Rueckert, K. Schumacher, IEEE Micro 9 (2002) 28–44.
LibreCat: /record/39926
DOI: 10.1109/40.42985

Nuclear radiation detectors on various type diamonds
F. Blum, A. Denisenko, R. Job, D. Borchert, W. Weber, J.V. Borany, U. Hilleringmann, W.R. Fahrner, in: IECON ’98. Proceedings of the 24th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.980), IEEE, 2002.
LibreCat: /record/39892
DOI: 10.1109/iecon.1998.724097

Floating gate structures as nonvolatile analog memory cells in 1.0;cm-LOCOS-CMOS technology with PZT dielectrica
A. Soennecken, U. Hilleringmann, K. Goser, Microelectronic Engineering 15 (2002) 633–636.
LibreCat: /record/39920
DOI: 10.1016/0167-9317(91)90299-s

Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon
U. Hilleringmann, K. Goser, Microelectronic Engineering 19 (2002) 211–214.
LibreCat: /record/39915
DOI: 10.1016/0167-9317(92)90425-q

CMOS compatible micromachining by dry silicon-etching techniques
S. Adams, U. Hilleringmann, K. Goser, Microelectronic Engineering 19 (2002) 191–194.
LibreCat: /record/39916
DOI: 10.1016/0167-9317(92)90420-v

Matching analysis of deposition defined 50-nm MOSFET's
J.T. Horstmann, U. Hilleringmann, K.F. Goser, IEEE Transactions on Electron Devices 45 (2002) 299–306.
LibreCat: /record/39348
DOI: 10.1109/16.658845

Applications and implementations of neural networks in microelectronics-overview and status
K. Goser, U. Hilleringmann, U. Rueckert, in: [1991] Proceedings, Advanced Computer Technology, Reliable Systems and Applications, IEEE Comput. Soc. Press, 2002.
LibreCat: /record/39923
DOI: 10.1109/cmpeur.1991.257442

12 kV low current cascaded light triggered switch on one silicon chip
V. Mankowski, U. Hilleringmann, K. Schumacher, Microelectronic Engineering 46 (2002) 413–417.
LibreCat: /record/39889
DOI: 10.1016/s0167-9317(99)00122-7

Matching analysis of deposition defined 50-nm MOSFET's
J.T. Horstmann, U. Hilleringmann, K.F. Goser, IEEE Transactions on Electron Devices 45 (2002) 299–306.
LibreCat: /record/39891
DOI: 10.1109/16.658845

Mesoscopic transport phenomena in ultrashort channel MOSFETs
G. Wirth, U. Hilleringmann, J.T. Horstmann, K. Goser, Solid-State Electronics 43 (2002) 1245–1250.
LibreCat: /record/39886
DOI: 10.1016/s0038-1101(99)00060-x

Structures with a minimum feature size of less than 100 nm in CVD-diamond for sensor applications
R. Otterbach, U. Hilleringmann, T.J. Horstmann, K. Goser, Diamond and Related Materials 10 (2002) 511–514.
LibreCat: /record/39876
DOI: 10.1016/s0925-9635(01)00373-9

A structure definition technique for 25 nm lines of silicon and related materials
U. Hilleringmann, T. Vieregge, J.T. Horstmann, Microelectronic Engineering 53 (2002) 569–572.
LibreCat: /record/39877
DOI: 10.1016/s0167-9317(00)00380-4

Reactive ion etching of CVD-diamond for piezoresistive pressure sensors
R. Otterbach, U. Hilleringmann, Diamond and Related Materials 11 (2002) 841–844.
LibreCat: /record/39874
DOI: 10.1016/s0925-9635(01)00703-8

Metallisierung und Kontakte
U. Hilleringmann, in: Silizium-Halbleitertechnologie, Vieweg+Teubner Verlag, Wiesbaden, 2002, pp. 131–151.
LibreCat: /record/39875
DOI: 10.1007/978-3-322-94119-0_8

Nanometer Scale Lateral Structures of MOS Type Layers
U. Hilleringmann, T. Vieregge, J. Horstmann, in: Proceedings Micro. Tec, 2000, pp. 49–53.
LibreCat: /record/39884

High rate CVD-diamond etching for high temperature pressure sensor applications
R. Otterbach, U. Hilleringmann, in: 29th European Solid-State Device Research Conference, 1999, pp. 320–323.
LibreCat: /record/39890

Correlation Analysis of the Statistical Electrical Parameter Fluctuations in 50 nm MOS-Transistors
J.T. Horstmann, U. Hilleringmann, K. Goser, in: 28th European Solid-State Device Research Conference, 1998, pp. 512–515.
LibreCat: /record/39893

CMOS-compatible organic light-emitting diodes
L.M.H. Heinrich, J. Muller, U. Hilleringmann, K.F. Goser, A. Holmes, D.-H. Hwang, R. Stern, IEEE Transactions on Electron Devices 44 (1997) 1249–1252.
LibreCat: /record/39896
DOI: 10.1109/16.605463

Analyses of Sub 1/4-Micron MOS-Transistors by Visible Light Emission
J. Muller, G. Wirth, U. Hilleringmann, K. Goser, in: ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference, 1996, pp. 947–950.
LibreCat: /record/39902

Characterization and Matching Analysis of 50 nm-NMOS-Transistors
J.T. Horstmann, U. Hilleringmann, K. Goser, in: ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference, 1996, pp. 253–256.
LibreCat: /record/39900

ESSDERC’96, Bologna, Italy
J. Horstmann, U. Hilleringmann, K. Goser, in: Conf. Dig, 1996.
LibreCat: /record/39903

Conjugated Polymers for CMOS Compatible Applications
J. Muller, V. Mankowski, U. Hilleringmann, K. Goser, A. Holmes, O. Gelsen, R. Stern, in: ESSDERC ’95: Proceedings of the 25th European Solid State Device Research Conference, 1995, pp. 659–662.
LibreCat: /record/39905

Micromechanic Pressure Sensors with Optical Readout and CMOS-Amplifiers on Silicon
U. Hilleringmann, S. Adams, K. Goser, in: ESSDERC ’94: 24th European Solid State Device Research Conference, 1994, pp. 387–390.
LibreCat: /record/39908

Monolithic System Integration of Optical Devices, Photodetectors and Analog Transimpedance CMOS Amplifiers
E. Brab, U. Hilleringmann, K. Schumacher, in: ESSCIRC ’93: Nineteenth European Solid-State Circuits Conference, 1993, pp. 242–245.
LibreCat: /record/39909

Hot Carrier Monitoring in NMOS Transistors by Visible Light Emission
I. Schonstein, J. Muller, U. Hilleringmann, K. Goser, in: ESSDERC ’93: 23rd European Solid State Device Research Conference, 1993, pp. 421–424.
LibreCat: /record/39910

Micromechanic pressure sensors with optical readout and CMOS-preamplifiers on one silicon chip: Processing and first results
U. Hilleringmann, S. Adam, K. Goser, in: ESSDtRC’93, 1993.
LibreCat: /record/39913

A Silicon Technology for Monolithic Integration of Optical Waveguides, Photodetectors and VLSI CMOS Circuits
U. Hilleringmann, S. Adams, K. Goser, in: Proceedings ISSSE’92, 1992, pp. 304–307.
LibreCat: /record/39917

Electrooptical coupling of waveguides and VLSI circuits integrated on one silicon chip
S. Adams, U. Hilleringmann, K. Goser, in: EFOC LAN, 1992, pp. 92–92.
LibreCat: /record/39918

Application and implementation of neural networks in microelectronics
K. Goser, U. Hilleringmann, U. Rückert, in: A. Prieto (Ed.), Artificial Neural Networks, Springer Berlin Heidelberg, Berlin, Heidelberg, 1991, pp. 243–259.
LibreCat: /record/39922