Deposition of ZnO nanoparticles for thin-film transistors by doctor blade process
J. Reker, T. Meyers, F.F. Vidor, U. Hilleringmann, in: 2017 IEEE AFRICON, IEEE, 2017.
LibreCat: /record/39452
DOI: 10.1109/afrcon.2017.8095556

Design and Implementation of a High Temperature Control Monitoring Applied to Micro Thermoelectric Generators
S.C.S. Jucá, P.C.M. Carvalho, R.I.S. Pereira, D. Petrov, U. Hilleringmann, Renewable Energy and Power Quality Journal (2017) 712–717.
LibreCat: /record/39507
DOI: 10.24084/repqj11.425

Increasing the Efficiency of Solar Cells by Combining Silicon- and Dye Sensitized Devices
B. Ohms, A. Kleine, U. Hilleringmann, Renewable Energy and Power Quality (2017) 469–473.
LibreCat: /record/39525
DOI: 10.24084/repqj10.349

Self-aligned ZnO nanoparticle-based TFTs for flexible electronics
F.F. Vidor, G.I. Wirth, T. Meyers, J. Reker, U. Hilleringmann, in: 2017 IEEE AFRICON, IEEE, 2017.
LibreCat: /record/39453
DOI: 10.1109/afrcon.2017.8095558

Conclusion and Future Perspectives
F.F. Vidor, G.I. Wirth, U. Hilleringmann, in: ZnO Thin-Film Transistors for Cost-Efficient Flexible Electronics, Springer International Publishing, Cham, 2017.
LibreCat: /record/39443
DOI: 10.1007/978-3-319-72556-7_7

TEGs as self-sufficient power supply for sensors and microelectromechanical systems
M. Schönhoff, U. Hilleringmann, in: M. du Plessis (Ed.), SPIE Proceedings, SPIE, 2017.
LibreCat: /record/39462
DOI: 10.1117/12.2243133

Complementary field-effect transistors for flexible electronics
U. Hilleringmann, F.F. Vidor, T. Meyers, in: M. du Plessis (Ed.), SPIE Proceedings, SPIE, 2017.
LibreCat: /record/39455
DOI: 10.1117/12.2243001

Mass production of magnesium silicide as a TEG material
M. Schonhoff, U. Hilleringmann, J. de Boor, in: 2017 IEEE AFRICON, IEEE, 2017.
LibreCat: /record/39463
DOI: 10.1109/afrcon.2017.8095620

ZnO Thin-Film Transistors for Cost-Efficient Flexible Electronics
F.F. Vidor, G.I. Wirth, U. Hilleringmann, ZnO Thin-Film Transistors for Cost-Efficient Flexible Electronics, Springer International Publishing, Cham, 2017.
LibreCat: /record/39929
DOI: 10.1007/978-3-319-72556-7

Inverter circuits on freestanding flexible substrate using ZnO nanoparticles for cost-efficient electronics
F.F. Vidor, T. Meyers, K. Müller, G.I. Wirth, U. Hilleringmann, Solid-State Electronics 137 (2017) 16–21.
LibreCat: /record/39450
DOI: 10.1016/j.sse.2017.07.011

Organic Thin-Film Transistors for AMOLED Applications
Th. Meyers, J. Vollbrecht, F. Vidor, J. Reker, H.-S. Kitzerow, U. Hilleringmann, in: IEEE Xplore, MikroSystemTechnik 2017, IEEE, Munich, 2017, pp. 1–4.
LibreCat: /record/40635

Improvements
F.F. Vidor, G.I. Wirth, U. Hilleringmann, in: ZnO Thin-Film Transistors for Cost-Efficient Flexible Electronics, Springer International Publishing, Cham, 2017.
LibreCat: /record/39440
DOI: 10.1007/978-3-319-72556-7_6

Integration of ZnO nanoparticle transistors on freestanding flexible substrates
F.F. Vidor, T. Meyers, U. Hilleringmann, in: M. du Plessis (Ed.), SPIE Proceedings, SPIE, 2017.
LibreCat: /record/39457
DOI: 10.1117/12.2243134

Organic Thin-Film Transistors for AMOLED Applications
T. Meyers, J. Vollbrecht, F. Vidor, J. Reker, H.-S. Kitzerow, U. Hilleringmann, in: MikroSystemTechnik 2017; Congress, 2017, pp. 1–4.
LibreCat: /record/39460

Event Driven Modeling and Characterization of the Second Order Voltage Switched Charge Pump PLL
E. Ali, C. Hangmann, C. Hedayat, F. Haddad, W. Rahajandraibe, U. Hilleringmann, IEEE Transactions on Circuits and Systems I: Regular Papers 63 (2016) 347–358.
LibreCat: /record/39469
DOI: 10.1109/tcsi.2015.2512759

Influence of Traps on the Characteristics of ZnO Nanoparticles Thin-Film Transistors
F.F. Vidor, T. Meyers, G.I. Wirth, U. Hilleringmann, in: Micro-Nano-Integration; 6. GMM-Workshop, 2016, pp. 1–6.
LibreCat: /record/39472

Self-aligning integration technique for organic electronics
T. Meyers, F.F. Vidor, S.F. Kaijage, U. Hilleringmann, in: Micro-Nano-Integration; 6. GMM-Workshop, 2016, pp. 1–4.
LibreCat: /record/39473

Low-voltage DNTT-based thin-film transistors and inverters for flexible electronics
T. Meyers, F.F. Vidor, K. Brassat, J.K.N. Lindner, U. Hilleringmann, Microelectronic Engineering 174 (2016) 35–39.
LibreCat: /record/39447
DOI: 10.1016/j.mee.2016.12.018

Microstructured Metal Layers in Dye Sensitized Solar Cells
A. Kleine, U. Hilleringmann, in: Micro-Nano-Integration; 6. GMM-Workshop, 2016, pp. 1–6.
LibreCat: /record/39475

ZnO nanoparticle thin-film transistors on flexible substrate using spray-coating technique
F.F. Vidor, T. Meyers, G.I. Wirth, U. Hilleringmann, Microelectronic Engineering 159 (2016) 155–158.
LibreCat: /record/39466
DOI: 10.1016/j.mee.2016.02.059

Inverter Circuits Using ZnO Nanoparticle Based Thin-Film Transistors for Flexible Electronic Applications
F. Vidor, T. Meyers, U. Hilleringmann, Nanomaterials 6 (2016).
LibreCat: /record/39467
DOI: 10.3390/nano6090154

Organic Field-Effect and Nanoparticle Thin-Film Transistors: Static Model
A. Romero, J. Gonzalez, U. Hilleringmann, P. Gloesekoetter, in: ANALOG 2016; 15. ITG/GMM-Symposium, 2016, pp. 1–6.
LibreCat: /record/39476

Influence of UV irradiation and humidity on a low-cost ZnO nanoparticle TFT for flexible electronics
F.F. Vidor, T. Meyers, U. Hilleringmann, G.I. Wirth, in: 2015 IEEE 15th International Conference on Nanotechnology (IEEE-NANO), IEEE, 2016.
LibreCat: /record/39480
DOI: 10.1109/nano.2015.7388836

Improved rf design using precise 3d near-field measurements and near-field to far-field transformations
C. Hangmann, T. Mager, S. Khan, C. Hedayat, U. Hilleringmann, in: Smart System Integration-International Conference and Exhibition on Integration Issues of Miniaturized Systems, 2016.
LibreCat: /record/39478

High-Q whispering gallery microdisk resonators based on silicon oxynitride
T. Hett, S. Krämmer, U. Hilleringmann, H. Kalt, A. Zrenner, Journal of Luminescence 191 (2016) 131–134.
LibreCat: /record/39456
DOI: 10.1016/j.jlumin.2016.11.016

Flexible Electronics: Integration Processes for Organic and Inorganic Semiconductor-Based Thin-Film Transistors
F. Vidor, T. Meyers, U. Hilleringmann, Electronics 4 (2015) 480–506.
LibreCat: /record/39479
DOI: 10.3390/electronics4030480

Silicon Nanoparticles contacted by metal nanogaps for FET applications
K. Wolff, U. Hilleringmann, in: 2015.
LibreCat: /record/39571

Nanometer Scale Electronic Device Integration Using Side-Wall Deposition and Etch-Back Technology
U. Hilleringmann, F. Assion, F.F. Vidor, G.I. Wirth, Journal of Machine to Machine Communications 1 (2015) 197–214.
LibreCat: /record/39495
DOI: 10.13052/jmmc2246-137x.131

Application of side-wall deposition and etch-back technology for nanometer scale device integration
U. Hilleringmann, F.F. Vidor, F. Assion, in: Proceedings of the 2nd Pan African International Conference on Science, Computing and Telecommunications (PACT 2014), IEEE, 2015.
LibreCat: /record/39492
DOI: 10.1109/scat.2014.7055128

Extended event-driven modeling of a :3-fractional-N PLL including non-ideal effects
C. Hangmann, C. Hedayat, U. Hilleringmann, in: 2014 21st IEEE International Conference on Electronics, Circuits and Systems (ICECS), IEEE, 2015.
LibreCat: /record/39490
DOI: 10.1109/icecs.2014.7049931

Fast and accurate event-driven simulation of a mixed-signal system using the example of a PLL
C. Hangmann, C. Hedayat, U. Hilleringmann, in: Proc. Int. Conf. Exhib. Integr. Issues Miniatured Syst., 2015.
LibreCat: /record/39482

Low temperature fabrication of a ZnO nanoparticle thin-film transistor suitable for flexible electronics
F.F. Vidor, G.I. Wirth, U. Hilleringmann, Microelectronics Reliability 54 (2014) 2760–2765.
LibreCat: /record/39483
DOI: 10.1016/j.microrel.2014.07.147

Stability Analysis of a Charge Pump Phase-Locked Loop Using Autonomous Difference Equations
C. Hangmann, C. Hedayat, U. Hilleringmann, IEEE Transactions on Circuits and Systems I: Regular Papers 61 (2014) 2569–2577.
LibreCat: /record/39484
DOI: 10.1109/tcsi.2014.2333331

Anodized Aluminum as Effective and Cheap Alternative Substrate for Thermoelectric Generators
F. Assion, V. Geneiß, M. Schönhoff, C. Hedayat, U. Hilleringmann, in: A. Amaldi, F. Tang (Eds.), Proceedings of the 11th European Conference on Thermoelectrics, Springer International Publishing, Cham, 2014, pp. 83–88.
LibreCat: /record/39497

A Flexible Measurement System for the Characterization of Thermoelectric Materials
M. Schönhoff, F. Assion, U. Hilleringmann, in: A. Amaldi, F. Tang (Eds.), Proceedings of the 11th European Conference on Thermoelectrics, Springer International Publishing, Cham, 2014, pp. 53–60.
LibreCat: /record/39498

Replacing TCO electrodes in dye sensitized solar cells by metal grids
U. Hilleringmann, A. Kleine, in: M. du Plessis (Ed.), SPIE Proceedings, SPIE, 2014.
LibreCat: /record/39500
DOI: 10.1117/12.2063218

Lithografie
U. Hilleringmann, in: Silizium-Halbleitertechnologie, Springer Fachmedien Wiesbaden, Wiesbaden, 2014.
LibreCat: /record/39501
DOI: 10.1007/978-3-8348-2085-3_4

Random telegraph signal in nanoparticulated ZnO thin-film transistors
F. Vidor, G. Wirth, U. Hilleringmann, in: The 40th International Conference on Micro and Nano Engineering (MN14), 2014.
LibreCat: /record/39503

Embedded UHF RFID tag design process for rubber transmission belt using 3D model
K. Kanwar, T. Mager, U. Hilleringmann, V. Geneiss, C. Hedayat, in: 2014 IEEE RFID Technology and Applications Conference (RFID-TA), IEEE, 2014.
LibreCat: /record/39494
DOI: 10.1109/rfid-ta.2014.6934208

Modeling and characterization of CP-PLL phase noise in presence of dead zone
C. Hangmann, I. Wullner, C. Hedayat, U. Hilleringmann, in: 2014 IEEE 12th International New Circuits and Systems Conference (NEWCAS), IEEE, 2014.
LibreCat: /record/39486
DOI: 10.1109/newcas.2014.6934054

Titanium disilicide as hot side metallization layer for thermoelectric generators
U. Hilleringmann, M. Schonhoff, F. Assion, in: 2013 Africon, IEEE, 2014.
LibreCat: /record/39518
DOI: 10.1109/afrcon.2013.6757616

Self-organization of nanospheres in trenches on silicon surfaces
K. Brassat, F. Assion, U. Hilleringmann, J. Lindner, Physica Status Solidi (A) 210 (2013) 1485–1489.
LibreCat: /record/4098
DOI: 10.1002/pssa.201200899

Self-organization of nanospheres in trenches on silicon surfaces
K. Brassat, F. Assion, U. Hilleringmann, J.K.N. Lindner, Physica Status Solidi (a) 210 (2013) 1485–1489.
LibreCat: /record/39506
DOI: 10.1002/pssa.201200899

Titanium Disilicide as High-Temperature Contact Material for Thermoelectric Generators
F. Assion, M. Schönhoff, U. Hilleringmann, Journal of Electronic Materials 42 (2013) 1932–1935.
LibreCat: /record/39508
DOI: 10.1007/s11664-013-2478-2

Enhanced organic light-emitting diode based on a columnar liquid crystal by integration in a microresonator
O. Kasdorf, J. Vollbrecht, B. Ohms, U. Hilleringmann, H. Bock, H.-S. Kitzerow, International Journal of Energy Research 38 (2013) 452–458.
LibreCat: /record/39485
DOI: 10.1002/er.3127

Design and implementation of a measurement system for automatically measurement of electrical parameters of thermoelectric generators
D. Petrov, F. Assion, U. Hilleringmann, MRS Proceedings 1490 (2013) 191–196.
LibreCat: /record/39514
DOI: 10.1557/opl.2013.318

Formation and Properties of TiSi<sub>2</sub> as Contact Material for High-Temperature Thermoelectric Generators
F. Assion, M. Schönhoff, U. Hilleringmann, MRS Proceedings 1490 (2013) 97–102.
LibreCat: /record/39523
DOI: 10.1557/opl.2012.1557

Electrical characterization of rubber mixture sheets based on a coaxial probe method in combination with 3D electromagnetic simulation model
K. Kanwar, C. Fischer, V. Geneiss, T. Mager, U. Ballhausen, C. Hedayat, U. Hilleringmann, in: 2012 IEEE International Conference on RFID-Technologies and Applications (RFID-TA), IEEE, 2013.
LibreCat: /record/39524
DOI: 10.1109/rfid-ta.2012.6404507

Enhanced event-driven modeling of a CP-PLL with nonlinearities and nonidealities
C. Hangmann, C. Hedayat, U. Hilleringmann, in: 2013 IEEE 56th International Midwest Symposium on Circuits and Systems (MWSCAS), IEEE, 2013.
LibreCat: /record/39511
DOI: 10.1109/mwscas.2013.6674647

Resistivity reduction in flexible dye sensitized solar cells by UV irradiation and carbon nanotubes
U. Hilleringmann, B. Ohms, A. Kleine, in: 2013 IEEE International Conference on Industrial Technology (ICIT), IEEE, 2013.
LibreCat: /record/39509
DOI: 10.1109/icit.2013.6505770

Characterization and Analysis of the Hysteresis in a ZnO Nanoparticle Thin-Film Transistor
F.F. Vidor, G. Wirth, F. Assion, K. Wolff, U. Hilleringmann, IEEE Transactions on Nanotechnology 12 (2013) 296–303.
LibreCat: /record/39504
DOI: 10.1109/tnano.2012.2236891

Design and analysis of UHF RFID tag for a rubber transmission belt based on 3D electrical model
K. Kanwar, V. Geneiss, T. Mager, S. Scheele, U. Ballhausen, C. Hedayat, U. Hilleringmann, in: 2013 21st International Conference on Software, Telecommunications and Computer Networks - (SoftCOM 2013), IEEE, 2013.
LibreCat: /record/39516
DOI: 10.1109/softcom.2013.6671864

Designing output-power-optimized thermoelectric generators via analytic and finite element method modelling
F. Assion, C. Fischer, M. Schonhof, U. Hilleringmann, C. Hedayat, in: 2013 IEEE International Conference on Industrial Technology (ICIT), IEEE, 2013.
LibreCat: /record/39515
DOI: 10.1109/icit.2013.6505756

Enhanced organic light-emitting diode based on a columnar liquid crystal by integration in a microresonator
O. Kasdorf, J. Vollbrecht, B. Ohms, U. Hilleringmann, H. Bock, H.-S. Kitzerow, International Journal of Energy Research 38 (2013) 452–458.
LibreCat: /record/39707
DOI: 10.1002/er.3127

Surface tension and its role for vertical wet etching of silicon
A. Brockmeier, F.J.S. Rodriguez, M. Harrison, U. Hilleringmann, Journal of Micromechanics and Microengineering 22 (2012).
LibreCat: /record/39520
DOI: 10.1088/0960-1317/22/12/125012

Surface tension and its role for vertical wet etching of silicon
A. Brockmeier, F.J.S. Rodriguez, M. Harrison, U. Hilleringmann, Journal of Micromechanics and Microengineering 22 (2012).
LibreCat: /record/39522
DOI: 10.1088/0960-1317/22/12/125012

Mikrosystemtechnik auf Silizium
U. Hilleringmann, Mikrosystemtechnik Auf Silizium, Vieweg+Teubner Verlag, Wiesbaden, 2012.
LibreCat: /record/39512
DOI: 10.1007/978-3-322-92766-8

Study on the Performance Enhancement of ZnO Nanoparticles Thin-Film Transistors
F.F. Vidor, G.I. Wirth, K. Wolff, U. Hilleringmann, ECS Transactions 39 (2011) 109–115.
LibreCat: /record/39533
DOI: 10.1149/1.3615183

Solution processed inverter based on zinc oxide nanoparticle thin-film transistors with poly(4-vinylphenol) gate dielectric
K. Wolff, U. Hilleringmann, Solid-State Electronics 62 (2011) 110–114.
LibreCat: /record/39527
DOI: 10.1016/j.sse.2011.01.046

Characterization of SiON integrated waveguides via FTIR and AFM measurements
T. Frers, T. Hett, U. Hilleringmann, G. Berth, A. Widhalm, A. Zrenner, in: 2011 Semiconductor Conference Dresden, IEEE, 2011.
LibreCat: /record/39536
DOI: 10.1109/scd.2011.6068744

Modeling and simulation of arbitrary ordered nonlinear charge-pump phase-locked loops
C. Wiegand, C. Hangmann, C. Hedayat, U. Hilleringmann, in: 2011 Semiconductor Conference Dresden, IEEE, 2011.
LibreCat: /record/39528
DOI: 10.1109/scd.2011.6068711

Semiconductor nanoparticles for electronic device integration on foils
U. Hilleringmann, K. Wolff, F. Assion, F.F. Vidor, G.I. Wirth, in: IEEE Africon ’11, IEEE, 2011.
LibreCat: /record/39530
DOI: 10.1109/afrcon.2011.6071983

Plane wave spectrum expansion from near-field measurements on no-planar lattices
C. Reinhold, C. Hangmann, T. Mager, C. Hedayat, U. Hilleringmann, in: Proc. 5th Int. Conf. on Electromagnetic Near-Field Characterization and Imaging (ICONIC) 2011, 2011, pp. 1–4.
LibreCat: /record/39537

Piezoelectric sensor array with evaluation electronic for counting grains in seed drills
S. Meyer zu Hoberge, U. Hilleringmann, C. Jochheim, M. Liebich, in: IEEE Africon ’11, IEEE, 2011.
LibreCat: /record/39529
DOI: 10.1109/afrcon.2011.6072063

Telemetric surface acoustic wave sensor for humidity
M. Dierkes, U. Hilleringmann, Advances in Radio Science 1 (2010) 131–133.
LibreCat: /record/39871
DOI: 10.5194/ars-1-131-2003

Non-linear behaviour of charge-pump phase-locked loops
C. Wiegand, C. Hedayat, U. Hilleringmann, Advances in Radio Science 8 (2010) 161–166.
LibreCat: /record/39539
DOI: 10.5194/ars-8-161-2010

Organic Field-Effect-Transistors with Pentacene for radio-controlled-price-tag applications
C. Pannemannn, T. Diekmann, U. Hilleringmann, Advances in Radio Science 1 (2010) 219–221.
LibreCat: /record/39869
DOI: 10.5194/ars-1-219-2003

Analysis and modeling of pseudo-short-channel effects in ZnO-nanoparticle thin-film transistors
K. Wolff, U. Hilleringmann, in: 2010 Proceedings of the European Solid State Device Research Conference, IEEE, 2010.
LibreCat: /record/39540
DOI: 10.1109/essderc.2010.5618383

Low-Temperature Integration of Nanoparticulate Zinc Oxide FETs on Glass Substrate
F. Assion, K. Wolff, U. Hilleringmann, in: Proceedings of the European Solid State Device Research Conference (ESSDERC), Seville, Spain, 2010, p. 17.
LibreCat: /record/39545

A Resonance PLL-based Tracking System for Capacitive Sensors-MEMS/NEMS
C. Wiegand, C. Hangmann, C. Hedayat, U. Hilleringmann, Smart System Integration SSI 2010 (2010).
LibreCat: /record/39544

Macro-modelling via radial basis functionen nets
C. Wiegand, C. Fischer, R. Kazemzadeh, C. Hedayat, W. John, U. Hilleringmann, Advances in Radio Science 6 (2010) 139–143.
LibreCat: /record/39558
DOI: 10.5194/ars-6-139-2008

Autonomous Sensor Nodes for Aircraft Structural Health Monitoring
T. Becker, M. Kluge, J. Schalk, K. Tiplady, C. Paget, U. Hilleringmann, T. Otterpohl, IEEE Sensors Journal 9 (2009) 1589–1595.
LibreCat: /record/39547
DOI: 10.1109/jsen.2009.2028775

Efficient Antenna Design of Inductive Coupled RFID-Systems with High Power Demand
C. Reinhold, P. Scholz, W. John, U. Hilleringmann, Journal of Communications 2 (2009).
LibreCat: /record/39559
DOI: 10.4304/jcm.2.6.14-23

N-type single nanoparticle ZnO transistors processed at low temperature
K. Wolff, U. Hilleringmann, in: 2009 Proceedings of the European Solid State Device Research Conference, IEEE, 2009.
LibreCat: /record/39548
DOI: 10.1109/essderc.2009.5331373

Lock Detection for Charge-Pump Phase-Locked Loops
C. Wiegand, C. Hedayat, U. Hilleringmann, Sophia Antipolis Microelectronics SAME (2009).
LibreCat: /record/39552

Dielectric layers for organic field effect transistors as gate dielectric and surface passivation
T. Diekmann, C. Pannemann, U. Hilleringmann, Physica Status Solidi (a) 205 (2008) 564–577.
LibreCat: /record/39556
DOI: 10.1002/pssa.200723406

Noise propagation for induced fast transient impulses on PCB-level
M. Taki, W. John, C. Hedayat, U. Hilleringmann, in: 2007 18th International Zurich Symposium on Electromagnetic Compatibility, IEEE, 2008.
LibreCat: /record/39568
DOI: 10.1109/emczur.2007.4388195

Power management for thermal energy harvesting in aircrafts
Th. Becker, M. Kluge, J. Schalk, T. Otterpohl, U. Hilleringmann, in: 2008 IEEE Sensors, IEEE, 2008.
LibreCat: /record/39555
DOI: 10.1109/icsens.2008.4716533

Analysis of Energy Transmission for Inductive Coupled RFID Tags
P. Scholz, C. Reinhold, W. John, U. Hilleringmann, in: 2007 IEEE International Conference on RFID, IEEE, 2008.
LibreCat: /record/39562
DOI: 10.1109/rfid.2007.346167

Antenna design of HF-RFID tags with high power requirement
P. Scholz, C. Reinhold, W. John, U. Hilleringmann, in: 2007.
LibreCat: /record/39570

Tuning the threshold voltage of organic field-effect transistors by an electret encapsulating layer
M. Scharnberg, V. Zaporojtchenko, R. Adelung, F. Faupel, C. Pannemann, T. Diekmann, U. Hilleringmann, Applied Physics Letters 90 (2007).
LibreCat: /record/39561
DOI: 10.1063/1.2426926

Electro-thermo-mechanical analytical modeling of multilayer cantilever microactuator
J. Jiang, U. Hilleringmann, X. Shui, Sensors and Actuators A: Physical 137 (2007) 302–307.
LibreCat: /record/39563
DOI: 10.1016/j.sna.2007.03.012

Nonlinear Identification of Complex Systems Using Radial Basis Function Networks and Model Order Reduction
C. Wiegand, C. Hedayat, W. John, Lj. Radic-Weissenfeld, U. Hilleringmann, in: 2007 IEEE International Symposium on Electromagnetic Compatibility, IEEE, 2007.
LibreCat: /record/39567
DOI: 10.1109/isemc.2007.145

6I-3 Low-Cost Transceiver Unit for SAW-Sensors Using Customized Hardware Components
P. Scholz, M. Dierkes, U. Hilleringmann, in: 2006 IEEE Ultrasonics Symposium, IEEE, 2007.
LibreCat: /record/39573
DOI: 10.1109/ultsym.2006.223

Encapsulating the active Layer of organic Thin-Film Transistors
C. Pannemann, T. Diekmann, U. Hilleringmann, U. Schurmann, M. Scharnberg, V. Zaporojtchenko, R. Adelung, F. Faupel, in: Polytronic 2005 - 5th International Conference on Polymers and Adhesives in Microelectronics and Photonics, IEEE, 2006.
LibreCat: /record/39842
DOI: 10.1109/polytr.2005.1596488

Degradation of organic field-effect transistors made of pentacene
Ch. Pannemann, T. Diekmann, U. Hilleringmann, Journal of Materials Research 19 (2005) 1999–2002.
LibreCat: /record/39846
DOI: 10.1557/jmr.2004.0267

On the degradation of organic field-effect transistors
Ch. Pannemann, T. Diekmann, U. Hilleringmann, in: Proceedings. The 16th International Conference on Microelectronics, 2004. ICM 2004., IEEE, 2005.
LibreCat: /record/39848
DOI: 10.1109/icm.2004.1434210

Degradation of organic field-effect transistors made of pentacene
Ch. Pannemann, T. Diekmann, U. Hilleringmann, Journal of Materials Research 19 (2005) 1999–2002.
LibreCat: /record/39349
DOI: 10.1557/jmr.2004.0267

Radiotracer measurements as a sensitive tool for the detection of metal penetration in molecular-based organic electronics
M. Scharnberg, J. Hu, J. Kanzow, K. Rätzke, R. Adelung, F. Faupel, C. Pannemann, U. Hilleringmann, S. Meyer, J. Pflaum, Applied Physics Letters 86 (2005).
LibreCat: /record/39574
DOI: 10.1063/1.1849845

Comparison between the charge carrier mobilities in pentacene OFET structures as obtained from electrical characterization and potentiometry
R. Scholz, A.-D. Müller, F. Müller, I. Thurzo, B.A. Paez, L. Mancera, D.R.T. Zahn, C. Pannemann, U. Hilleringmann, in: Z. Bao, D.J. Gundlach (Eds.), SPIE Proceedings, SPIE, 2005.
LibreCat: /record/39835
DOI: 10.1117/12.617004

Comparison between the charge carrier mobilities in pentacene OFET structures as obtained from electrical characterization and potentiometry
R. Scholz, A.-D. Müller, F. Müller, I. Thurzo, B.A. Paez, L. Mancera, D.R.T. Zahn, C. Pannemann, U. Hilleringmann, in: Z. Bao, D.J. Gundlach (Eds.), SPIE Proceedings, SPIE, 2005.
LibreCat: /record/39834
DOI: 10.1117/12.617004

Ätztechnik
U. Hilleringmann, in: Silizium-Halbleitertechnologie, Vieweg+Teubner Verlag, Wiesbaden, 2004, pp. 65–90.
LibreCat: /record/39850
DOI: 10.1007/978-3-322-94072-8_5

Imprint structured organic thin film transistors as driving circuit in single-use sensor applications
U. Hilleringmann, C. Pannemann, in: G. Zhang, H. Zhao, Z. Wang (Eds.), Fifth International Symposium on Instrumentation and Control Technology, SPIE, 2004.
LibreCat: /record/39872
DOI: 10.1117/12.521463

Piezoresistive pressure sensors in CVD diamond for high-temperature applications
R. Otterbach, U. Hilleringmann, in: G. Zhang, H. Zhao, Z. Wang (Eds.), Fifth International Symposium on Instrumentation and Control Technology, SPIE, 2004.
LibreCat: /record/39873
DOI: 10.1117/12.521928

Masking and etching of silicon and related materials for geometries down to 25 nm
U. Hilleringmann, T. Vieregge, J.T. Horstmann, in: IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.999), IEEE, 2003.
LibreCat: /record/39887
DOI: 10.1109/iecon.1999.822171

Matching analysis of NMOS-transistors with a channel length down to 30 nm
J.T. Horstmann, U. Hilleringmann, K. Goser, in: IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.999), IEEE, 2003.
LibreCat: /record/39888
DOI: 10.1109/iecon.1999.822163

Negative differential resistance in ultrashort bulk MOSFETs
G. Wirth, U. Hilleringmann, J.T. Horstmann, K. Goser, in: IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.999), IEEE, 2003.
LibreCat: /record/39885
DOI: 10.1109/iecon.1999.822164

Nanometer scale organic thin film transistors with Pentacene
Ch. Pannemann, T. Diekmann, U. Hilleringmann, Microelectronic Engineering 67–68 (2003) 845–852.
LibreCat: /record/39851
DOI: 10.1016/s0167-9317(03)00146-1

Optoelectronic system integration on silicon: waveguides, photodetectors, and VLSI CMOS circuits on one chip
U. Hilleringmann, K. Goser, IEEE Transactions on Electron Devices 42 (2002) 841–846.
LibreCat: /record/39904
DOI: 10.1109/16.381978

Characterization of submicron NMOS devices due to visible light emission
I. Schönstein, J. Müller, U. Hilleringmann, K. Goser, Microelectronic Engineering 21 (2002) 363–366.
LibreCat: /record/39912
DOI: 10.1016/0167-9317(93)90092-j