Hilleringmann U, Schonhoff M, Assion F. Titanium disilicide as hot side metallization layer for thermoelectric generators. In: 2013 Africon. IEEE; 2014. doi:10.1109/afrcon.2013.6757616
LibreCat: /record/39518
DOI: 10.1109/afrcon.2013.6757616

Brassat K, Assion F, Hilleringmann U, Lindner J. Self-organization of nanospheres in trenches on silicon surfaces. physica status solidi (a). 2013;210(8):1485-1489. doi:10.1002/pssa.201200899
LibreCat: /record/4098
DOI: 10.1002/pssa.201200899

Brassat K, Assion F, Hilleringmann U, Lindner JKN. Self-organization of nanospheres in trenches on silicon surfaces. physica status solidi (a). 2013;210(8):1485-1489. doi:10.1002/pssa.201200899
LibreCat: /record/39506
DOI: 10.1002/pssa.201200899

Assion F, Schönhoff M, Hilleringmann U. Titanium Disilicide as High-Temperature Contact Material for Thermoelectric Generators. Journal of Electronic Materials. 2013;42(7):1932-1935. doi:10.1007/s11664-013-2478-2
LibreCat: /record/39508
DOI: 10.1007/s11664-013-2478-2

Kasdorf O, Vollbrecht J, Ohms B, Hilleringmann U, Bock H, Kitzerow H-S. Enhanced organic light-emitting diode based on a columnar liquid crystal by integration in a microresonator. International Journal of Energy Research. 2013;38(4):452-458. doi:10.1002/er.3127
LibreCat: /record/39485
DOI: 10.1002/er.3127

Petrov D, Assion F, Hilleringmann U. Design and implementation of a measurement system for automatically measurement of electrical parameters of thermoelectric generators. MRS Proceedings. 2013;1490:191-196. doi:10.1557/opl.2013.318
LibreCat: /record/39514
DOI: 10.1557/opl.2013.318

Assion F, Schönhoff M, Hilleringmann U. Formation and Properties of TiSi<sub>2</sub> as Contact Material for High-Temperature Thermoelectric Generators. MRS Proceedings. 2013;1490:97-102. doi:10.1557/opl.2012.1557
LibreCat: /record/39523
DOI: 10.1557/opl.2012.1557

Kanwar K, Fischer C, Geneiss V, et al. Electrical characterization of rubber mixture sheets based on a coaxial probe method in combination with 3D electromagnetic simulation model. In: 2012 IEEE International Conference on RFID-Technologies and Applications (RFID-TA). IEEE; 2013. doi:10.1109/rfid-ta.2012.6404507
LibreCat: /record/39524
DOI: 10.1109/rfid-ta.2012.6404507

Hangmann C, Hedayat C, Hilleringmann U. Enhanced event-driven modeling of a CP-PLL with nonlinearities and nonidealities. In: 2013 IEEE 56th International Midwest Symposium on Circuits and Systems (MWSCAS). IEEE; 2013. doi:10.1109/mwscas.2013.6674647
LibreCat: /record/39511
DOI: 10.1109/mwscas.2013.6674647

Hilleringmann U, Ohms B, Kleine A. Resistivity reduction in flexible dye sensitized solar cells by UV irradiation and carbon nanotubes. In: 2013 IEEE International Conference on Industrial Technology (ICIT). IEEE; 2013. doi:10.1109/icit.2013.6505770
LibreCat: /record/39509
DOI: 10.1109/icit.2013.6505770

Vidor FF, Wirth G, Assion F, Wolff K, Hilleringmann U. Characterization and Analysis of the Hysteresis in a ZnO Nanoparticle Thin-Film Transistor. IEEE Transactions on Nanotechnology. 2013;12(3):296-303. doi:10.1109/tnano.2012.2236891
LibreCat: /record/39504
DOI: 10.1109/tnano.2012.2236891

Kanwar K, Geneiss V, Mager T, et al. Design and analysis of UHF RFID tag for a rubber transmission belt based on 3D electrical model. In: 2013 21st International Conference on Software, Telecommunications and Computer Networks - (SoftCOM 2013). IEEE; 2013. doi:10.1109/softcom.2013.6671864
LibreCat: /record/39516
DOI: 10.1109/softcom.2013.6671864

Assion F, Fischer C, Schonhof M, Hilleringmann U, Hedayat C. Designing output-power-optimized thermoelectric generators via analytic and finite element method modelling. In: 2013 IEEE International Conference on Industrial Technology (ICIT). IEEE; 2013. doi:10.1109/icit.2013.6505756
LibreCat: /record/39515
DOI: 10.1109/icit.2013.6505756

Kasdorf O, Vollbrecht J, Ohms B, Hilleringmann U, Bock H, Kitzerow H-S. Enhanced organic light-emitting diode based on a columnar liquid crystal by integration in a microresonator. International Journal of Energy Research. 2013;38(4):452-458. doi:10.1002/er.3127
LibreCat: /record/39707
DOI: 10.1002/er.3127

Brockmeier A, Rodriguez FJS, Harrison M, Hilleringmann U. Surface tension and its role for vertical wet etching of silicon. Journal of Micromechanics and Microengineering. 2012;22(12). doi:10.1088/0960-1317/22/12/125012
LibreCat: /record/39520
DOI: 10.1088/0960-1317/22/12/125012

Brockmeier A, Rodriguez FJS, Harrison M, Hilleringmann U. Surface tension and its role for vertical wet etching of silicon. Journal of Micromechanics and Microengineering. 2012;22(12). doi:10.1088/0960-1317/22/12/125012
LibreCat: /record/39522
DOI: 10.1088/0960-1317/22/12/125012

Hilleringmann U. Mikrosystemtechnik Auf Silizium. Vieweg+Teubner Verlag; 2012. doi:10.1007/978-3-322-92766-8
LibreCat: /record/39512
DOI: 10.1007/978-3-322-92766-8

Vidor FF, Wirth GI, Wolff K, Hilleringmann U. Study on the Performance Enhancement of ZnO Nanoparticles Thin-Film Transistors. ECS Transactions. 2011;39(1):109-115. doi:10.1149/1.3615183
LibreCat: /record/39533
DOI: 10.1149/1.3615183

Wolff K, Hilleringmann U. Solution processed inverter based on zinc oxide nanoparticle thin-film transistors with poly(4-vinylphenol) gate dielectric. Solid-State Electronics. 2011;62(1):110-114. doi:10.1016/j.sse.2011.01.046
LibreCat: /record/39527
DOI: 10.1016/j.sse.2011.01.046

Frers T, Hett T, Hilleringmann U, Berth G, Widhalm A, Zrenner A. Characterization of SiON integrated waveguides via FTIR and AFM measurements. In: 2011 Semiconductor Conference Dresden. IEEE; 2011. doi:10.1109/scd.2011.6068744
LibreCat: /record/39536
DOI: 10.1109/scd.2011.6068744