Scharnberg, M., V. Zaporojtchenko, R. Adelung, F. Faupel, C. Pannemann, T. Diekmann, and Ulrich Hilleringmann. “Tuning the Threshold Voltage of Organic Field-Effect Transistors by an Electret Encapsulating Layer.”https://doi.org/10.1063/1.2426926__Applied Physics Letters 90, no. 1 (2007).https://doi.org/10.1063/1.2426926 .
LibreCat: /record/39561
DOI: 10.1063/1.2426926

Jiang, Jianliang, Ulrich Hilleringmann, and Xiaoping Shui. “Electro-Thermo-Mechanical Analytical Modeling of Multilayer Cantilever Microactuator.”https://doi.org/10.1016/j.sna.2007.03.012__Sensors and Actuators A: Physical 137, no. 2 (2007): 302–7.https://doi.org/10.1016/j.sna.2007.03.012 .
LibreCat: /record/39563
DOI: 10.1016/j.sna.2007.03.012

Wiegand, C., C. Hedayat, W. John, Lj. Radic-Weissenfeld, and Ulrich Hilleringmann. “Nonlinear Identification of Complex Systems Using Radial Basis Function Networks and Model Order Reduction.”https://doi.org/10.1109/isemc.2007.145__In 2007 IEEE International Symposium on Electromagnetic Compatibility. IEEE, 2007.https://doi.org/10.1109/isemc.2007.145 .
LibreCat: /record/39567
DOI: 10.1109/isemc.2007.145

Scholz, P., M. Dierkes, and Ulrich Hilleringmann. “I-3 Low-Cost Transceiver Unit for SAW-Sensors Using Customized Hardware Components.”https://doi.org/10.1109/ultsym.2006.223__In 2006 IEEE Ultrasonics Symposium. IEEE, 2007.https://doi.org/10.1109/ultsym.2006.223 .
LibreCat: /record/39573
DOI: 10.1109/ultsym.2006.223

Pannemann, C., T. Diekmann, Ulrich Hilleringmann, U. Schurmann, M. Scharnberg, V. Zaporojtchenko, R. Adelung, and F. Faupel. “Encapsulating the Active Layer of Organic Thin-Film Transistors.”https://doi.org/10.1109/polytr.2005.1596488__In Polytronic 2005 - 5th International Conference on Polymers and Adhesives in Microelectronics and Photonics. IEEE, 2006.https://doi.org/10.1109/polytr.2005.1596488 .
LibreCat: /record/39842
DOI: 10.1109/polytr.2005.1596488

Pannemann, Ch., T. Diekmann, and Ulrich Hilleringmann. “Degradation of Organic Field-Effect Transistors Made of Pentacene.”https://doi.org/10.1557/jmr.2004.0267__Journal of Materials Research 19, no. 7 (2005): 1999–2002.https://doi.org/10.1557/jmr.2004.0267 .
LibreCat: /record/39846
DOI: 10.1557/jmr.2004.0267

Pannemann, Ch., T. Diekmann, and Ulrich Hilleringmann. “On the Degradation of Organic Field-Effect Transistors.”https://doi.org/10.1109/icm.2004.1434210__In Proceedings. The 16th International Conference on Microelectronics, 2004. ICM 2004. IEEE, 2005.https://doi.org/10.1109/icm.2004.1434210 .
LibreCat: /record/39848
DOI: 10.1109/icm.2004.1434210

Pannemann, Ch., T. Diekmann, and Ulrich Hilleringmann. “Degradation of Organic Field-Effect Transistors Made of Pentacene.”https://doi.org/10.1557/jmr.2004.0267__Journal of Materials Research 19, no. 7 (2005): 1999–2002.https://doi.org/10.1557/jmr.2004.0267 .
LibreCat: /record/39349
DOI: 10.1557/jmr.2004.0267

Scharnberg, M., J. Hu, J. Kanzow, K. Rätzke, R. Adelung, F. Faupel, C. Pannemann, Ulrich Hilleringmann, S. Meyer, and J. Pflaum. “Radiotracer Measurements as a Sensitive Tool for the Detection of Metal Penetration in Molecular-Based Organic Electronics.”https://doi.org/10.1063/1.1849845__Applied Physics Letters 86, no. 2 (2005).https://doi.org/10.1063/1.1849845 .
LibreCat: /record/39574
DOI: 10.1063/1.1849845

Scholz, R., A.-D. Müller, F. Müller, I. Thurzo, B. A. Paez, L. Mancera, D. R. T. Zahn, C. Pannemann, and Ulrich Hilleringmann. “Comparison between the Charge Carrier Mobilities in Pentacene OFET Structures as Obtained from Electrical Characterization and Potentiometry.”https://doi.org/10.1117/12.617004__In SPIE Proceedings, edited by Zhenan Bao and David J. Gundlach. SPIE, 2005.https://doi.org/10.1117/12.617004 .
LibreCat: /record/39835
DOI: 10.1117/12.617004

Scholz, R., A.-D. Müller, F. Müller, I. Thurzo, B. A. Paez, L. Mancera, D. R. T. Zahn, C. Pannemann, and Ulrich Hilleringmann. “Comparison between the Charge Carrier Mobilities in Pentacene OFET Structures as Obtained from Electrical Characterization and Potentiometry.”https://doi.org/10.1117/12.617004__In SPIE Proceedings, edited by Zhenan Bao and David J. Gundlach. SPIE, 2005.https://doi.org/10.1117/12.617004 .
LibreCat: /record/39834
DOI: 10.1117/12.617004

Hilleringmann, Ulrich. “Ätztechnik.”https://doi.org/10.1007/978-3-322-94072-8_5__In Silizium-Halbleitertechnologie, 65–90. Wiesbaden: Vieweg+Teubner Verlag, 2004.https://doi.org/10.1007/978-3-322-94072-8_5 .
LibreCat: /record/39850
DOI: 10.1007/978-3-322-94072-8_5

Hilleringmann, Ulrich, and C. Pannemann. “Imprint Structured Organic Thin Film Transistors as Driving Circuit in Single-Use Sensor Applications.”https://doi.org/10.1117/12.521463__In Fifth International Symposium on Instrumentation and Control Technology, edited by Guangjun Zhang, Huijie Zhao, and Zhongyu Wang. SPIE, 2004.https://doi.org/10.1117/12.521463 .
LibreCat: /record/39872
DOI: 10.1117/12.521463

Otterbach, Ralf, and Ulrich Hilleringmann. “Piezoresistive Pressure Sensors in CVD Diamond for High-Temperature Applications.”https://doi.org/10.1117/12.521928__In Fifth International Symposium on Instrumentation and Control Technology, edited by Guangjun Zhang, Huijie Zhao, and Zhongyu Wang. SPIE, 2004.https://doi.org/10.1117/12.521928 .
LibreCat: /record/39873
DOI: 10.1117/12.521928

Hilleringmann, Ulrich, T. Vieregge, and J.T. Horstmann. “Masking and Etching of Silicon and Related Materials for Geometries down to 25 Nm.”https://doi.org/10.1109/iecon.1999.822171__In IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.999). IEEE, 2003.https://doi.org/10.1109/iecon.1999.822171 .
LibreCat: /record/39887
DOI: 10.1109/iecon.1999.822171

Horstmann, J.T., Ulrich Hilleringmann, and K. Goser. “Matching Analysis of NMOS-Transistors with a Channel Length down to 30 Nm.”https://doi.org/10.1109/iecon.1999.822163__In IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.999). IEEE, 2003.https://doi.org/10.1109/iecon.1999.822163 .
LibreCat: /record/39888
DOI: 10.1109/iecon.1999.822163

Wirth, G., Ulrich Hilleringmann, J.T. Horstmann, and K. Goser. “Negative Differential Resistance in Ultrashort Bulk MOSFETs.”https://doi.org/10.1109/iecon.1999.822164__In IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.999). IEEE, 2003.https://doi.org/10.1109/iecon.1999.822164 .
LibreCat: /record/39885
DOI: 10.1109/iecon.1999.822164

Pannemann, Ch., T. Diekmann, and Ulrich Hilleringmann. “Nanometer Scale Organic Thin Film Transistors with Pentacene.”https://doi.org/10.1016/s0167-9317(03)00146-1__Microelectronic Engineering 67–68 (2003): 845–52.https://doi.org/10.1016/s0167-9317(03)00146-1 .
LibreCat: /record/39851
DOI: 10.1016/s0167-9317(03)00146-1

Hilleringmann, Ulrich, and K. Goser. “Optoelectronic System Integration on Silicon: Waveguides, Photodetectors, and VLSI CMOS Circuits on One Chip.”https://doi.org/10.1109/16.381978__IEEE Transactions on Electron Devices 42, no. 5 (2002): 841–46.https://doi.org/10.1109/16.381978 .
LibreCat: /record/39904
DOI: 10.1109/16.381978

Schönstein, I., J. Müller, Ulrich Hilleringmann, and K. Goser. “Characterization of Submicron NMOS Devices Due to Visible Light Emission.”https://doi.org/10.1016/0167-9317(93)90092-j__Microelectronic Engineering 21, no. 1–4 (2002): 363–66.https://doi.org/10.1016/0167-9317(93)90092-j .
LibreCat: /record/39912
DOI: 10.1016/0167-9317(93)90092-j