Hilleringmann, Ulrich, and K. Goser. “Results of Monolithic Integration of Optical Waveguides, Photodiodes and CMOS Circuits on Silicon.”https://doi.org/10.1016/0167-9317(92)90425-q__Microelectronic Engineering 19, no. 1–4 (2002): 211–14.https://doi.org/10.1016/0167-9317(92)90425-q .
LibreCat: /record/39914
DOI: 10.1016/0167-9317(92)90425-q

Brass, E., Ulrich Hilleringmann, and K. Schumacher. “System Integration of Optical Devices and Analog CMOS Amplifiers.”https://doi.org/10.1109/4.297714__IEEE Journal of Solid-State Circuits 29, no. 8 (2002): 1006–10.https://doi.org/10.1109/4.297714 .
LibreCat: /record/39906
DOI: 10.1109/4.297714

Brass, E., Ulrich Hilleringmann, and K. Schumacher. “System Integration of Optical Devices and Analog CMOS Amplifiers.”https://doi.org/10.1109/4.297714__IEEE Journal of Solid-State Circuits 29, no. 8 (2002): 1006–10.https://doi.org/10.1109/4.297714 .
LibreCat: /record/39907
DOI: 10.1109/4.297714

Horstmann, J.T., Ulrich Hilleringmann, and K. Goser. “Characterisation of Sub-100 Nm-MOS-Transistors Processed by Optical Lithography and a Sidewall-Etchback Technique.”https://doi.org/10.1016/0167-9317(95)00280-4__Microelectronic Engineering 30, no. 1–4 (2002): 431–34.https://doi.org/10.1016/0167-9317(95)00280-4 .
LibreCat: /record/39899
DOI: 10.1016/0167-9317(95)00280-4

Goser, K., Ulrich Hilleringmann, U. Rueckert, and K. Schumacher. “VLSI Technologies for Artificial Neural Networks.”https://doi.org/10.1109/40.42985__IEEE Micro 9, no. 6 (2002): 28–44.https://doi.org/10.1109/40.42985 .
LibreCat: /record/39925
DOI: 10.1109/40.42985

Mankowski, V., Ulrich Hilleringmann, and K. Schumacher. “A Novel Insulation Technique for Smart Power Switching Devices and Very High Voltage ICs above 10 KV.”https://doi.org/10.1016/s0167-9317(00)00370-1__Microelectronic Engineering 53, no. 1–4 (2002): 525–28.https://doi.org/10.1016/s0167-9317(00)00370-1 .
LibreCat: /record/39882
DOI: 10.1016/s0167-9317(00)00370-1

Horstmann, J.T., Ulrich Hilleringmann, and K. Goser. “/f-Noise of Sub-100 Nm-MOS-Transistors Fabricated by a Special Deposition and Etchback Technique.”https://doi.org/10.1016/s0167-9317(00)00299-9__Microelectronic Engineering 53, no. 1–4 (2002): 213–16.https://doi.org/10.1016/s0167-9317(00)00299-9 .
LibreCat: /record/39879
DOI: 10.1016/s0167-9317(00)00299-9

Horstmann, J.T., Ulrich Hilleringmann, and K. Goser. “Noise Analysis of Sub-100 Nm-MOS-Transistors Fabricated by a Special Deposition and Etchback Technique.”https://doi.org/10.1109/iecon.2000.972560__In 2000 26th Annual Conference of the IEEE Industrial Electronics Society. IECON 2000. 2000 IEEE International Conference on Industrial Electronics, Control and Instrumentation. 21st Century Technologies and Industrial Opportunities (Cat. No.001). IEEE, 2002.https://doi.org/10.1109/iecon.2000.972560 .
LibreCat: /record/39880
DOI: 10.1109/iecon.2000.972560

Horstmann, J.T., Ulrich Hilleringmann, and K. Goser. “Noise Analysis of Sub-100 Nm-MOS-Transistors Fabricated by a Special Deposition and Etchback Technique.”https://doi.org/10.1109/iecon.2000.972560__In 2000 26th Annual Conference of the IEEE Industrial Electronics Society. IECON 2000. 2000 IEEE International Conference on Industrial Electronics, Control and Instrumentation. 21st Century Technologies and Industrial Opportunities (Cat. No.001). IEEE, 2002.https://doi.org/10.1109/iecon.2000.972560 .
LibreCat: /record/39881
DOI: 10.1109/iecon.2000.972560

Hilleringmann, Ulrich, K. Knospe, C. Heite, K. Schumacher, and K. Goser. “A Silicon Based Technology for Monolithic Integration of Waveguides and VLSI CMOS Circuits.”https://doi.org/10.1016/0167-9317(91)90231-2__Microelectronic Engineering 15, no. 1–4 (2002): 289–92.https://doi.org/10.1016/0167-9317(91)90231-2 .
LibreCat: /record/39919
DOI: 10.1016/0167-9317(91)90231-2

Goser, K., Ulrich Hilleringmann, U. Rueckert, and K. Schumacher. “VLSI Technologies for Artificial Neural Networks.”https://doi.org/10.1109/40.42985__IEEE Micro 9, no. 6 (2002): 28–44.https://doi.org/10.1109/40.42985 .
LibreCat: /record/39926
DOI: 10.1109/40.42985

Blum, F., A. Denisenko, R. Job, D. Borchert, W. Weber, J.V. Borany, Ulrich Hilleringmann, and W.R. Fahrner. “Nuclear Radiation Detectors on Various Type Diamonds.”https://doi.org/10.1109/iecon.1998.724097__In IECON ’98. Proceedings of the 24th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.980). IEEE, 2002.https://doi.org/10.1109/iecon.1998.724097 .
LibreCat: /record/39892
DOI: 10.1109/iecon.1998.724097

Soennecken, A., Ulrich Hilleringmann, and K. Goser. “Floating Gate Structures as Nonvolatile Analog Memory Cells in 1.0;cm-LOCOS-CMOS Technology with PZT Dielectrica.”https://doi.org/10.1016/0167-9317(91)90299-s__Microelectronic Engineering 15, no. 1–4 (2002): 633–36.https://doi.org/10.1016/0167-9317(91)90299-s .
LibreCat: /record/39920
DOI: 10.1016/0167-9317(91)90299-s

Hilleringmann, Ulrich, and K. Goser. “Results of Monolithic Integration of Optical Waveguides, Photodiodes and CMOS Circuits on Silicon.”https://doi.org/10.1016/0167-9317(92)90425-q__Microelectronic Engineering 19, no. 1–4 (2002): 211–14.https://doi.org/10.1016/0167-9317(92)90425-q .
LibreCat: /record/39915
DOI: 10.1016/0167-9317(92)90425-q

Adams, S., Ulrich Hilleringmann, and K. Goser. “CMOS Compatible Micromachining by Dry Silicon-Etching Techniques.”https://doi.org/10.1016/0167-9317(92)90420-v__Microelectronic Engineering 19, no. 1–4 (2002): 191–94.https://doi.org/10.1016/0167-9317(92)90420-v .
LibreCat: /record/39916
DOI: 10.1016/0167-9317(92)90420-v

Horstmann, J.T., Ulrich Hilleringmann, and K.F. Goser. “Matching Analysis of Deposition Defined 50-Nm MOSFET’s.”https://doi.org/10.1109/16.658845__IEEE Transactions on Electron Devices 45, no. 1 (2002): 299–306.https://doi.org/10.1109/16.658845 .
LibreCat: /record/39348
DOI: 10.1109/16.658845

Goser, K., Ulrich Hilleringmann, and U. Rueckert. “Applications and Implementations of Neural Networks in Microelectronics-Overview and Status.”https://doi.org/10.1109/cmpeur.1991.257442__In [1991] Proceedings, Advanced Computer Technology, Reliable Systems and Applications. IEEE Comput. Soc. Press, 2002.https://doi.org/10.1109/cmpeur.1991.257442 .
LibreCat: /record/39923
DOI: 10.1109/cmpeur.1991.257442

Mankowski, V., Ulrich Hilleringmann, and K. Schumacher. “KV Low Current Cascaded Light Triggered Switch on One Silicon Chip.”https://doi.org/10.1016/s0167-9317(99)00122-7__Microelectronic Engineering 46, no. 1–4 (2002): 413–17.https://doi.org/10.1016/s0167-9317(99)00122-7 .
LibreCat: /record/39889
DOI: 10.1016/s0167-9317(99)00122-7

Horstmann, J.T., Ulrich Hilleringmann, and K.F. Goser. “Matching Analysis of Deposition Defined 50-Nm MOSFET’s.”https://doi.org/10.1109/16.658845__IEEE Transactions on Electron Devices 45, no. 1 (2002): 299–306.https://doi.org/10.1109/16.658845 .
LibreCat: /record/39891
DOI: 10.1109/16.658845

Wirth, G, Ulrich Hilleringmann, J.T Horstmann, and K Goser. “Mesoscopic Transport Phenomena in Ultrashort Channel MOSFETs.”https://doi.org/10.1016/s0038-1101(99)00060-x__Solid-State Electronics 43, no. 7 (2002): 1245–50.https://doi.org/10.1016/s0038-1101(99)00060-x .
LibreCat: /record/39886
DOI: 10.1016/s0038-1101(99)00060-x