Hilleringmann, Ulrich, and K. Goser. “Results of Monolithic Integration of Optical Waveguides, Photodiodes and CMOS Circuits on Silicon.”10.1016/0167-9317(92)90425-q__Microelectronic Engineering, vol. 19, no. 1–4, Elsevier BV, 2002, pp. 211–14, doi:10.1016/0167-9317(92)90425-q.
LibreCat: /record/39914
DOI: 10.1016/0167-9317(92)90425-q

Brass, E., et al. “System Integration of Optical Devices and Analog CMOS Amplifiers.”10.1109/4.297714__IEEE Journal of Solid-State Circuits, vol. 29, no. 8, Institute of Electrical and Electronics Engineers (IEEE), 2002, pp. 1006–10, doi:10.1109/4.297714.
LibreCat: /record/39906
DOI: 10.1109/4.297714

Brass, E., et al. “System Integration of Optical Devices and Analog CMOS Amplifiers.”10.1109/4.297714__IEEE Journal of Solid-State Circuits, vol. 29, no. 8, Institute of Electrical and Electronics Engineers (IEEE), 2002, pp. 1006–10, doi:10.1109/4.297714.
LibreCat: /record/39907
DOI: 10.1109/4.297714

Horstmann, J. T., et al. “Characterisation of Sub-100 Nm-MOS-Transistors Processed by Optical Lithography and a Sidewall-Etchback Technique.”10.1016/0167-9317(95)00280-4__Microelectronic Engineering, vol. 30, no. 1–4, Elsevier BV, 2002, pp. 431–34, doi:10.1016/0167-9317(95)00280-4.
LibreCat: /record/39899
DOI: 10.1016/0167-9317(95)00280-4

Goser, K., et al. “VLSI Technologies for Artificial Neural Networks.”10.1109/40.42985__IEEE Micro, vol. 9, no. 6, Institute of Electrical and Electronics Engineers (IEEE), 2002, pp. 28–44, doi:10.1109/40.42985.
LibreCat: /record/39925
DOI: 10.1109/40.42985

Mankowski, V., et al. “A Novel Insulation Technique for Smart Power Switching Devices and Very High Voltage ICs above 10 KV.”10.1016/s0167-9317(00)00370-1__Microelectronic Engineering, vol. 53, no. 1–4, Elsevier BV, 2002, pp. 525–28, doi:10.1016/s0167-9317(00)00370-1.
LibreCat: /record/39882
DOI: 10.1016/s0167-9317(00)00370-1

Horstmann, J. T., et al. “/f-Noise of Sub-100 Nm-MOS-Transistors Fabricated by a Special Deposition and Etchback Technique.”10.1016/s0167-9317(00)00299-9__Microelectronic Engineering, vol. 53, no. 1–4, Elsevier BV, 2002, pp. 213–16, doi:10.1016/s0167-9317(00)00299-9.
LibreCat: /record/39879
DOI: 10.1016/s0167-9317(00)00299-9

Horstmann, J. T., et al. “Noise Analysis of Sub-100 Nm-MOS-Transistors Fabricated by a Special Deposition and Etchback Technique.”10.1109/iecon.2000.972560__2000 26th Annual Conference of the IEEE Industrial Electronics Society. IECON 2000. 2000 IEEE International Conference on Industrial Electronics, Control and Instrumentation. 21st Century Technologies and Industrial Opportunities (Cat. No.001), IEEE, 2002, doi:10.1109/iecon.2000.972560.
LibreCat: /record/39880
DOI: 10.1109/iecon.2000.972560

Horstmann, J. T., et al. “Noise Analysis of Sub-100 Nm-MOS-Transistors Fabricated by a Special Deposition and Etchback Technique.”10.1109/iecon.2000.972560__2000 26th Annual Conference of the IEEE Industrial Electronics Society. IECON 2000. 2000 IEEE International Conference on Industrial Electronics, Control and Instrumentation. 21st Century Technologies and Industrial Opportunities (Cat. No.001), IEEE, 2002, doi:10.1109/iecon.2000.972560.
LibreCat: /record/39881
DOI: 10.1109/iecon.2000.972560

Hilleringmann, Ulrich, et al. “A Silicon Based Technology for Monolithic Integration of Waveguides and VLSI CMOS Circuits.”10.1016/0167-9317(91)90231-2__Microelectronic Engineering, vol. 15, no. 1–4, Elsevier BV, 2002, pp. 289–92, doi:10.1016/0167-9317(91)90231-2.
LibreCat: /record/39919
DOI: 10.1016/0167-9317(91)90231-2

Goser, K., et al. “VLSI Technologies for Artificial Neural Networks.”10.1109/40.42985__IEEE Micro, vol. 9, no. 6, Institute of Electrical and Electronics Engineers (IEEE), 2002, pp. 28–44, doi:10.1109/40.42985.
LibreCat: /record/39926
DOI: 10.1109/40.42985

Blum, F., et al. “Nuclear Radiation Detectors on Various Type Diamonds.”10.1109/iecon.1998.724097__IECON ’98. Proceedings of the 24th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.980), IEEE, 2002, doi:10.1109/iecon.1998.724097.
LibreCat: /record/39892
DOI: 10.1109/iecon.1998.724097

Soennecken, A., et al. “Floating Gate Structures as Nonvolatile Analog Memory Cells in 1.0;cm-LOCOS-CMOS Technology with PZT Dielectrica.”10.1016/0167-9317(91)90299-s__Microelectronic Engineering, vol. 15, no. 1–4, Elsevier BV, 2002, pp. 633–36, doi:10.1016/0167-9317(91)90299-s.
LibreCat: /record/39920
DOI: 10.1016/0167-9317(91)90299-s

Hilleringmann, Ulrich, and K. Goser. “Results of Monolithic Integration of Optical Waveguides, Photodiodes and CMOS Circuits on Silicon.”10.1016/0167-9317(92)90425-q__Microelectronic Engineering, vol. 19, no. 1–4, Elsevier BV, 2002, pp. 211–14, doi:10.1016/0167-9317(92)90425-q.
LibreCat: /record/39915
DOI: 10.1016/0167-9317(92)90425-q

Adams, S., et al. “CMOS Compatible Micromachining by Dry Silicon-Etching Techniques.”10.1016/0167-9317(92)90420-v__Microelectronic Engineering, vol. 19, no. 1–4, Elsevier BV, 2002, pp. 191–94, doi:10.1016/0167-9317(92)90420-v.
LibreCat: /record/39916
DOI: 10.1016/0167-9317(92)90420-v

Horstmann, J. T., et al. “Matching Analysis of Deposition Defined 50-Nm MOSFET’s.”10.1109/16.658845__IEEE Transactions on Electron Devices, vol. 45, no. 1, Institute of Electrical and Electronics Engineers (IEEE), 2002, pp. 299–306, doi:10.1109/16.658845.
LibreCat: /record/39348
DOI: 10.1109/16.658845

Goser, K., et al. “Applications and Implementations of Neural Networks in Microelectronics-Overview and Status.”10.1109/cmpeur.1991.257442__[1991] Proceedings, Advanced Computer Technology, Reliable Systems and Applications, IEEE Comput. Soc. Press, 2002, doi:10.1109/cmpeur.1991.257442.
LibreCat: /record/39923
DOI: 10.1109/cmpeur.1991.257442

Mankowski, V., et al. “KV Low Current Cascaded Light Triggered Switch on One Silicon Chip.”10.1016/s0167-9317(99)00122-7__Microelectronic Engineering, vol. 46, no. 1–4, Elsevier BV, 2002, pp. 413–17, doi:10.1016/s0167-9317(99)00122-7.
LibreCat: /record/39889
DOI: 10.1016/s0167-9317(99)00122-7

Horstmann, J. T., et al. “Matching Analysis of Deposition Defined 50-Nm MOSFET’s.”10.1109/16.658845__IEEE Transactions on Electron Devices, vol. 45, no. 1, Institute of Electrical and Electronics Engineers (IEEE), 2002, pp. 299–306, doi:10.1109/16.658845.
LibreCat: /record/39891
DOI: 10.1109/16.658845

Wirth, G., et al. “Mesoscopic Transport Phenomena in Ultrashort Channel MOSFETs.”10.1016/s0038-1101(99)00060-x__Solid-State Electronics, vol. 43, no. 7, Elsevier BV, 2002, pp. 1245–50, doi:10.1016/s0038-1101(99)00060-x.
LibreCat: /record/39886
DOI: 10.1016/s0038-1101(99)00060-x