Reker J, Meyers T, Vidor FF, Hilleringmann U. Inorganic p-channel thin-film transistors using CuO nanoparticles. In: du Plessis M, ed. Fifth Conference on Sensors, MEMS, and Electro-Optic Systems. SPIE; 2019. doi:10.1117/12.2500644
LibreCat: /record/39408
DOI: 10.1117/12.2500644

Hilleringmann U, Reker J, Vidor FF, Meyers T, Joubert TH, Bezuidenhout P. Nanoparticles and organic semiconductors for flexible electronics. In: du Plessis M, ed. Fifth Conference on Sensors, MEMS, and Electro-Optic Systems. SPIE; 2019. doi:10.1117/12.2500218
LibreCat: /record/39415
DOI: 10.1117/12.2500218

Temme J, Meyers T, Reker J, et al. Improved organic thin-film transistor performance by dielectric layer patterning. In: du Plessis M, ed. Fifth Conference on Sensors, MEMS, and Electro-Optic Systems. SPIE; 2019. doi:10.1117/12.2500286
LibreCat: /record/39416
DOI: 10.1117/12.2500286

Vidor FF, Meyers T, Reker J, Müller K, Wirth GI, Hilleringmann U. Mechanical deformation on nanoparticle-based thin-film transistors. In: du Plessis M, ed. Fifth Conference on Sensors, MEMS, and Electro-Optic Systems. SPIE; 2019. doi:10.1117/12.2502393
LibreCat: /record/39419
DOI: 10.1117/12.2502393

Schwabe T, Balke A, Bezuidenhout P, et al. Oxygen detection with zinc oxide nanoparticle structures. In: du Plessis M, ed. Fifth Conference on Sensors, MEMS, and Electro-Optic Systems. SPIE; 2019. doi:10.1117/12.2501507
LibreCat: /record/39426
DOI: 10.1117/12.2501507

Kruger J, Bezuidenhout PH, Hilleringmann U, Joubert T-H. Characterization of inkjet-printed dielectric on different substrates. In: du Plessis M, ed. Fifth Conference on Sensors, MEMS, and Electro-Optic Systems. SPIE; 2019. doi:10.1117/12.2502489
LibreCat: /record/39424
DOI: 10.1117/12.2502489

Lange S, Bueker M-J, Sievers D, et al. Method of superposing a multiple driven magnetic field to minimize stray fields around the receiver for inductive wireless power transmission. In: Smart Systems Integration; 13th International Conference and Exhibition on Integration Issues of Miniaturized Systems. ; 2019:1-4.
LibreCat: /record/39942

Schroeder D, Hangmann C, Hedayat C, Otto T, Hilleringmann U. Characterization of H-field Probes regarding Unwanted Field Suppression using Different Calibration Structures. In: Smart Systems Integration; 13th International Conference and Exhibition on Integration Issues of Miniaturized Systems. ; 2019:1-4.
LibreCat: /record/39940

Schmidt M, Petrov D, Hedayat C, Hilleringmann U, Otto T. Wireless power supply for a RFID based sensor platform. In: Smart Systems Integration; 13th International Conference and Exhibition on Integration Issues of Miniaturized Systems. ; 2019:1-4.
LibreCat: /record/39943

Kruger J, Bezuidenhout PH, Hilleringmann U, Joubert T-H. Characterization of inkjet-printed dielectric on different substrates. In: du Plessis M, ed. Fifth Conference on Sensors, MEMS, and Electro-Optic Systems. SPIE; 2019. doi:10.1117/12.2502489
LibreCat: /record/39423
DOI: 10.1117/12.2502489

Petrov D, Schmidt M, Hilleringmann U, Hedayat C, Otto T. RFID based sensor platform for industry 4.0 application. In: Smart Systems Integration; 13th International Conference and Exhibition on Integration Issues of Miniaturized Systems. ; 2019:1-4.
LibreCat: /record/39944

Hilleringmann U. Silizium-Halbleitertechnologie. Springer Fachmedien Wiesbaden; 2018. doi:10.1007/978-3-658-23444-7
LibreCat: /record/39898
DOI: 10.1007/978-3-658-23444-7

Hilleringmann U. Ätztechnik. In: Silizium-Halbleitertechnologie. Springer Fachmedien Wiesbaden; 2018. doi:10.1007/978-3-658-23444-7_5
LibreCat: /record/39428
DOI: 10.1007/978-3-658-23444-7_5

Becker TE, Vidor FF, Wirth GI, Meyers T, Reker J, Hilleringmann U. Time domain electrical characterization in zinc oxide nanoparticle thin-film transistors. In: 2018 IEEE 19th Latin-American Test Symposium (LATS). IEEE; 2018. doi:10.1109/latw.2018.8349695
LibreCat: /record/39436
DOI: 10.1109/latw.2018.8349695

Becker TE, Vidor FF, Wirth GI, Meyers T, Reker J, Hilleringmann U. Time domain electrical characterization in zinc oxide nanoparticle thin-film transistors. In: 2018 IEEE 19th Latin-American Test Symposium (LATS). IEEE; 2018. doi:10.1109/latw.2018.8349695
LibreCat: /record/39437
DOI: 10.1109/latw.2018.8349695

Hilleringmann U. Oxidation des Siliziums. In: Silizium-Halbleitertechnologie. Springer Fachmedien Wiesbaden; 2018. doi:10.1007/978-3-658-23444-7_3
LibreCat: /record/39429
DOI: 10.1007/978-3-658-23444-7_3

Vollbrecht J, Oechsle P, Stepen A, et al. Liquid crystalline dithienothiophene derivatives for organic electronics. Organic Electronics. 2018;61:266-275. doi:10.1016/j.orgel.2018.06.002
LibreCat: /record/39430
DOI: 10.1016/j.orgel.2018.06.002

Kleine A, Hilleringmann U. Surface Cleaning and Modification by High Intense UV-Irradition for TiO2 Nanoparticle Films in Dye Sensitized Solar Cells. Renewable Energy and Power Quality Journal. Published online 2017:102-107. doi:10.24084/repqj14.238
LibreCat: /record/39470
DOI: 10.24084/repqj14.238

Meyers T, Vidor FF, Puls C, Hilleringmann U. Low-voltage C 8 -BTBT thin-film transistors for flexible electronics. Materials Today: Proceedings. 2017;4:2-6. doi:10.1016/j.matpr.2017.09.192
LibreCat: /record/39451
DOI: 10.1016/j.matpr.2017.09.192

Vidor FF, Wirth GI, Hilleringmann U. Zinc Oxide Transistors. In: ZnO Thin-Film Transistors for Cost-Efficient Flexible Electronics. Springer International Publishing; 2017. doi:10.1007/978-3-319-72556-7_4
LibreCat: /record/39438
DOI: 10.1007/978-3-319-72556-7_4