J. Reker, T. Meyers, F. F. Vidor, and U. Hilleringmann, “Inorganic p-channel thin-film transistors using CuO nanoparticles,”10.1117/12.2500644__in Fifth Conference on Sensors, MEMS, and Electro-Optic Systems, 2019, doi:10.1117/12.2500644 .
LibreCat: /record/39408
DOI: 10.1117/12.2500644

U. Hilleringmann, J. Reker, F. F. Vidor, T. Meyers, T. H. Joubert, and P. Bezuidenhout, “Nanoparticles and organic semiconductors for flexible electronics,”10.1117/12.2500218__in Fifth Conference on Sensors, MEMS, and Electro-Optic Systems, 2019, doi:10.1117/12.2500218 .
LibreCat: /record/39415
DOI: 10.1117/12.2500218

J. Temme et al., “Improved organic thin-film transistor performance by dielectric layer patterning,”10.1117/12.2500286__in Fifth Conference on Sensors, MEMS, and Electro-Optic Systems, 2019, doi:10.1117/12.2500286 .
LibreCat: /record/39416
DOI: 10.1117/12.2500286

F. F. Vidor, T. Meyers, J. Reker, K. Müller, G. I. Wirth, and U. Hilleringmann, “Mechanical deformation on nanoparticle-based thin-film transistors,”10.1117/12.2502393__in Fifth Conference on Sensors, MEMS, and Electro-Optic Systems, 2019, doi:10.1117/12.2502393 .
LibreCat: /record/39419
DOI: 10.1117/12.2502393

T. Schwabe et al., “Oxygen detection with zinc oxide nanoparticle structures,”10.1117/12.2501507__in Fifth Conference on Sensors, MEMS, and Electro-Optic Systems, 2019, doi:10.1117/12.2501507 .
LibreCat: /record/39426
DOI: 10.1117/12.2501507

J. Kruger, P. H. Bezuidenhout, U. Hilleringmann, and T.-H. Joubert, “Characterization of inkjet-printed dielectric on different substrates,”10.1117/12.2502489__in Fifth Conference on Sensors, MEMS, and Electro-Optic Systems, 2019, doi:10.1117/12.2502489 .
LibreCat: /record/39424
DOI: 10.1117/12.2502489

S. Lange et al., “Method of superposing a multiple driven magnetic field to minimize stray fields around the receiver for inductive wireless power transmission,” in Smart Systems Integration; 13th International Conference and Exhibition on Integration Issues of Miniaturized Systems, 2019, pp. 1–4.
LibreCat: /record/39942

D. Schroeder, C. Hangmann, C. Hedayat, T. Otto, and U. Hilleringmann, “Characterization of H-field Probes regarding Unwanted Field Suppression using Different Calibration Structures,” in Smart Systems Integration; 13th International Conference and Exhibition on Integration Issues of Miniaturized Systems, 2019, pp. 1–4.
LibreCat: /record/39940

M. Schmidt, D. Petrov, C. Hedayat, U. Hilleringmann, and T. Otto, “Wireless power supply for a RFID based sensor platform,” in Smart Systems Integration; 13th International Conference and Exhibition on Integration Issues of Miniaturized Systems, 2019, pp. 1–4.
LibreCat: /record/39943

J. Kruger, P. H. Bezuidenhout, U. Hilleringmann, and T.-H. Joubert, “Characterization of inkjet-printed dielectric on different substrates,”10.1117/12.2502489__in Fifth Conference on Sensors, MEMS, and Electro-Optic Systems, 2019, doi:10.1117/12.2502489 .
LibreCat: /record/39423
DOI: 10.1117/12.2502489

D. Petrov, M. Schmidt, U. Hilleringmann, C. Hedayat, and T. Otto, “RFID based sensor platform for industry 4.0 application,” in Smart Systems Integration; 13th International Conference and Exhibition on Integration Issues of Miniaturized Systems, 2019, pp. 1–4.
LibreCat: /record/39944

U. Hilleringmann, Silizium-Halbleitertechnologie. Wiesbaden: Springer Fachmedien Wiesbaden, 2018.
LibreCat: /record/39898
DOI: 10.1007/978-3-658-23444-7

U. Hilleringmann, “Ätztechnik,” in Silizium-Halbleitertechnologie, Wiesbaden: Springer Fachmedien Wiesbaden, 2018.
LibreCat: /record/39428
DOI: 10.1007/978-3-658-23444-7_5

T. E. Becker, F. F. Vidor, G. I. Wirth, T. Meyers, J. Reker, and U. Hilleringmann, “Time domain electrical characterization in zinc oxide nanoparticle thin-film transistors,”10.1109/latw.2018.8349695__2018, doi:10.1109/latw.2018.8349695 .
LibreCat: /record/39436
DOI: 10.1109/latw.2018.8349695

T. E. Becker, F. F. Vidor, G. I. Wirth, T. Meyers, J. Reker, and U. Hilleringmann, “Time domain electrical characterization in zinc oxide nanoparticle thin-film transistors,”10.1109/latw.2018.8349695__2018, doi:10.1109/latw.2018.8349695 .
LibreCat: /record/39437
DOI: 10.1109/latw.2018.8349695

U. Hilleringmann, “Oxidation des Siliziums,” in Silizium-Halbleitertechnologie, Wiesbaden: Springer Fachmedien Wiesbaden, 2018.
LibreCat: /record/39429
DOI: 10.1007/978-3-658-23444-7_3

J. Vollbrecht et al., “Liquid crystalline dithienothiophene derivatives for organic electronics,”10.1016/j.orgel.2018.06.002__Organic Electronics, vol. 61, pp. 266–275, 2018, doi:10.1016/j.orgel.2018.06.002 .
LibreCat: /record/39430
DOI: 10.1016/j.orgel.2018.06.002

A. Kleine and U. Hilleringmann, “Surface Cleaning and Modification by High Intense UV-Irradition for TiO2 Nanoparticle Films in Dye Sensitized Solar Cells,”10.24084/repqj14.238__Renewable Energy and Power Quality Journal, pp. 102–107, 2017, doi:10.24084/repqj14.238 .
LibreCat: /record/39470
DOI: 10.24084/repqj14.238

T. Meyers, F. F. Vidor, C. Puls, and U. Hilleringmann, “Low-voltage C 8 -BTBT thin-film transistors for flexible electronics,”10.1016/j.matpr.2017.09.192__Materials Today: Proceedings, vol. 4, pp. 2–6, 2017, doi:10.1016/j.matpr.2017.09.192 .
LibreCat: /record/39451
DOI: 10.1016/j.matpr.2017.09.192

F. F. Vidor, G. I. Wirth, and U. Hilleringmann, “Zinc Oxide Transistors,” in ZnO Thin-Film Transistors for Cost-Efficient Flexible Electronics, Cham: Springer International Publishing, 2017.
LibreCat: /record/39438
DOI: 10.1007/978-3-319-72556-7_4