Vidor, Fábio, Thorsten Meyers, and Ulrich Hilleringmann. “Inverter Circuits Using ZnO Nanoparticle Based Thin-Film Transistors for Flexible Electronic Applications.”https://doi.org/10.3390/nano6090154__Nanomaterials 6, no. 9 (2016).https://doi.org/10.3390/nano6090154 .
LibreCat: /record/39467
DOI: 10.3390/nano6090154

Romero, Adrian, Jesus Gonzalez, Ulrich Hilleringmann, and Peter Gloesekoetter. “Organic Field-Effect and Nanoparticle Thin-Film Transistors: Static Model.” In ANALOG 2016; 15. ITG/GMM-Symposium, 1–6, 2016.
LibreCat: /record/39476

Vidor, F. F., T. Meyers, Ulrich Hilleringmann, and G. I. Wirth. “Influence of UV Irradiation and Humidity on a Low-Cost ZnO Nanoparticle TFT for Flexible Electronics.”https://doi.org/10.1109/nano.2015.7388836__In 2015 IEEE 15th International Conference on Nanotechnology (IEEE-NANO). IEEE, 2016.https://doi.org/10.1109/nano.2015.7388836 .
LibreCat: /record/39480
DOI: 10.1109/nano.2015.7388836

Hangmann, C, T Mager, S Khan, C Hedayat, and Ulrich Hilleringmann. “Improved Rf Design Using Precise 3d Near-Field Measurements and near-Field to Far-Field Transformations.” In Smart System Integration-International Conference and Exhibition on Integration Issues of Miniaturized Systems, 2016.
LibreCat: /record/39478

Hett, T., S. Krämmer, Ulrich Hilleringmann, H. Kalt, and A. Zrenner. “High-Q Whispering Gallery Microdisk Resonators Based on Silicon Oxynitride.”https://doi.org/10.1016/j.jlumin.2016.11.016__Journal of Luminescence 191 (2016): 131–34.https://doi.org/10.1016/j.jlumin.2016.11.016 .
LibreCat: /record/39456
DOI: 10.1016/j.jlumin.2016.11.016

Vidor, Fábio, Thorsten Meyers, and Ulrich Hilleringmann. “Flexible Electronics: Integration Processes for Organic and Inorganic Semiconductor-Based Thin-Film Transistors.”https://doi.org/10.3390/electronics4030480__Electronics 4, no. 3 (2015): 480–506.https://doi.org/10.3390/electronics4030480 .
LibreCat: /record/39479
DOI: 10.3390/electronics4030480

Wolff, K, and Ulrich Hilleringmann. “Silicon Nanoparticles Contacted by Metal Nanogaps for FET Applications,” 2015.
LibreCat: /record/39571

Hilleringmann, Ulrich, F. Assion, F. F. Vidor, and G. I. Wirth. “Nanometer Scale Electronic Device Integration Using Side-Wall Deposition and Etch-Back Technology.”https://doi.org/10.13052/jmmc2246-137x.131__Journal of Machine to Machine Communications 1, no. 3 (2015): 197–214.https://doi.org/10.13052/jmmc2246-137x.131 .
LibreCat: /record/39495
DOI: 10.13052/jmmc2246-137x.131

Hilleringmann, Ulrich, F.F. Vidor, and F. Assion. “Application of Side-Wall Deposition and Etch-Back Technology for Nanometer Scale Device Integration.”https://doi.org/10.1109/scat.2014.7055128__In Proceedings of the 2nd Pan African International Conference on Science, Computing and Telecommunications (PACT 2014). IEEE, 2015.https://doi.org/10.1109/scat.2014.7055128 .
LibreCat: /record/39492
DOI: 10.1109/scat.2014.7055128

Hangmann, Christian, Christian Hedayat, and Ulrich Hilleringmann. “Extended Event-Driven Modeling of a :3-Fractional-N PLL Including Non-Ideal Effects.”https://doi.org/10.1109/icecs.2014.7049931__In 2014 21st IEEE International Conference on Electronics, Circuits and Systems (ICECS). IEEE, 2015.https://doi.org/10.1109/icecs.2014.7049931 .
LibreCat: /record/39490
DOI: 10.1109/icecs.2014.7049931

Hangmann, C, C Hedayat, and Ulrich Hilleringmann. “Fast and Accurate Event-Driven Simulation of a Mixed-Signal System Using the Example of a PLL.” In Proc. Int. Conf. Exhib. Integr. Issues Miniatured Syst., 2015.
LibreCat: /record/39482

Vidor, F.F., G.I. Wirth, and Ulrich Hilleringmann. “Low Temperature Fabrication of a ZnO Nanoparticle Thin-Film Transistor Suitable for Flexible Electronics.”https://doi.org/10.1016/j.microrel.2014.07.147__Microelectronics Reliability 54, no. 12 (2014): 2760–65.https://doi.org/10.1016/j.microrel.2014.07.147 .
LibreCat: /record/39483
DOI: 10.1016/j.microrel.2014.07.147

Hangmann, Christian, Christian Hedayat, and Ulrich Hilleringmann. “Stability Analysis of a Charge Pump Phase-Locked Loop Using Autonomous Difference Equations.”https://doi.org/10.1109/tcsi.2014.2333331__IEEE Transactions on Circuits and Systems I: Regular Papers 61, no. 9 (2014): 2569–77.https://doi.org/10.1109/tcsi.2014.2333331 .
LibreCat: /record/39484
DOI: 10.1109/tcsi.2014.2333331

Assion, F., V. Geneiß, M. Schönhoff, C. Hedayat, and Ulrich Hilleringmann. “Anodized Aluminum as Effective and Cheap Alternative Substrate for Thermoelectric Generators.” In Proceedings of the 11th European Conference on Thermoelectrics, edited by Andrea Amaldi and Francois Tang, 83–88. Cham: Springer International Publishing, 2014.
LibreCat: /record/39497

Schönhoff, M., F. Assion, and Ulrich Hilleringmann. “A Flexible Measurement System for the Characterization of Thermoelectric Materials.” In Proceedings of the 11th European Conference on Thermoelectrics, edited by Andrea Amaldi and Francois Tang, 53–60. Cham: Springer International Publishing, 2014.
LibreCat: /record/39498

Hilleringmann, Ulrich, and André Kleine. “Replacing TCO Electrodes in Dye Sensitized Solar Cells by Metal Grids.”https://doi.org/10.1117/12.2063218__In SPIE Proceedings, edited by Monuko du Plessis. SPIE, 2014.https://doi.org/10.1117/12.2063218 .
LibreCat: /record/39500
DOI: 10.1117/12.2063218

Hilleringmann, Ulrich. “Lithografie.”https://doi.org/10.1007/978-3-8348-2085-3_4__In Silizium-Halbleitertechnologie. Wiesbaden: Springer Fachmedien Wiesbaden, 2014.https://doi.org/10.1007/978-3-8348-2085-3_4 .
LibreCat: /record/39501
DOI: 10.1007/978-3-8348-2085-3_4

Vidor, FF, GI Wirth, and Ulrich Hilleringmann. “Random Telegraph Signal in Nanoparticulated ZnO Thin-Film Transistors.” In The 40th International Conference on Micro and Nano Engineering (MN14), 2014.
LibreCat: /record/39503

Kanwar, Kelash, Thomas Mager, Ulrich Hilleringmann, Volker Geneiss, and Christian Hedayat. “Embedded UHF RFID Tag Design Process for Rubber Transmission Belt Using 3D Model.”https://doi.org/10.1109/rfid-ta.2014.6934208__In 2014 IEEE RFID Technology and Applications Conference (RFID-TA). IEEE, 2014.https://doi.org/10.1109/rfid-ta.2014.6934208 .
LibreCat: /record/39494
DOI: 10.1109/rfid-ta.2014.6934208

Hangmann, Christian, Ingo Wullner, Christian Hedayat, and Ulrich Hilleringmann. “Modeling and Characterization of CP-PLL Phase Noise in Presence of Dead Zone.”https://doi.org/10.1109/newcas.2014.6934054__In 2014 IEEE 12th International New Circuits and Systems Conference (NEWCAS). IEEE, 2014.https://doi.org/10.1109/newcas.2014.6934054 .
LibreCat: /record/39486
DOI: 10.1109/newcas.2014.6934054