Khassanov, Artoem, Thomas Schmaltz, Hans-Georg Steinrück, Andreas Magerl, Andreas Hirsch, and Marcus Halik. “Interface Engineering of Molecular Charge Storage Dielectric Layers for Organic Thin-Film Memory Transistors.”https://doi.org/10.1002/admi.201400238__Advanced Materials Interfaces 1 (2014): 1400238.https://doi.org/10.1002/admi.201400238 .
LibreCat: /record/23638
DOI: 10.1002/admi.201400238

Schmaltz, Thomas, Artoem Khassanov, Hans-Georg Steinrück, Andreas Magerl, Andreas Hirsch, and Marcus Halik. “Tuning the Molecular Order of -Based Self-Assembled Monolayers in Field-Effect Transistors.”https://doi.org/10.1039/c4nr03557g__Nanoscale 6 (2014): 13022–27.https://doi.org/10.1039/c4nr03557g .
LibreCat: /record/23639
DOI: 10.1039/c4nr03557g

Steinrück, Hans-Georg, A. Magerl, M. Deutsch, and B.M. Ocko. “Pseudorotational Epitaxy of Self-Assembled Octadecyltrichlorosilane Monolayers on Sapphire (0001).”https://doi.org/10.1103/physrevlett.113.156101__Physical Review Letters 113 (2014): 156101.https://doi.org/10.1103/physrevlett.113.156101 .
LibreCat: /record/23640
DOI: 10.1103/physrevlett.113.156101

Wang, Zhenxing, Saeideh Mohammadzadeh, Thomas Schmaltz, Johannes Kirschner, Artoem Khassanov, Siegfried Eigler, Udo Mundloch, et al. “Region-Selective Self-Assembly of Functionalized Carbon Allotropes from Solution.”https://doi.org/10.1021/nn405488n__ACS Nano 7 (2013): 11427–34.https://doi.org/10.1021/nn405488n .
LibreCat: /record/23641
DOI: 10.1021/nn405488n

Schmaltz, Thomas, Atefeh Y. Amin, Artoem Khassanov, Timo Meyer-Friedrichsen, Hans-Georg Steinrück, Andreas Magerl, Juan José Segura, Kislon Voitchovsky, Francesco Stellacci, and Marcus Halik. “Low-Voltage Self-Assembled Monolayer Field-Effect Transistors on Flexible Substrates.”https://doi.org/10.1002/adma.201301176__Advanced Materials 25 (2013): 4511–14.https://doi.org/10.1002/adma.201301176 .
LibreCat: /record/23642
DOI: 10.1002/adma.201301176

Will, J., A. Gröschel, D. Kot, M. A. Schubert, C. Bergmann, Hans-Georg Steinrück, G. Kissinger, and A. Magerl. “Oxygen Diffusivity in Silicon Derived from Dynamical X-Ray Diffraction.”https://doi.org/10.1063/1.4792747__Journal of Applied Physics 7 (2013): 073508.https://doi.org/10.1063/1.4792747 .
LibreCat: /record/23643
DOI: 10.1063/1.4792747