Optical Arbitrary Waveform Measurement (OAWM) on the Silicon Photonic Platform
D. Fang, A. Zazzi, J. Müller, D. Daniel, C. Füllner, P. Marin-Palomo, A.T. Mashayekh, A.D. Das, M. Weizel, S. Gudyriev, W. Freude, S. Randel, J.C. Scheytt, J. Witzens, C. Koos, OSA Technical Digest (2021).
LibreCat: /record/29212
DOI: 10.1109/JLT.2021.3130764