Kampmann, Matthias, and Sybille Hellebrand. “Design-for-FAST: Supporting X-Tolerant Compaction during Faster-than-at-Speed Test.”10.1109/ddecs.2017.7934564__20th IEEE International Symposium on Design &; Diagnostics of Electronic Circuits &; Systems (DDECS’17), IEEE, 2017, doi:10.1109/ddecs.2017.7934564.
LibreCat: /record/10576
DOI: 10.1109/ddecs.2017.7934564