@articleBussone_Schott_Biermanns_Davydok_Reuter_Carbone_Schülli_Wieck_Pietsch_2013, title=Grazing-incidence X-ray diffraction of single GaAs nanowires at locations defined by focused ion beams, volume=46, DOI=10.1107/s0021889813004226, number=4, journal=Journal of Applied Crystallography, publisher=International Union of Crystallography (IUCr), author=Bussone, Genziana and Schott, Rüdiger and Biermanns, Andreas and Davydok, Anton and Reuter, Dirk and Carbone, Gerardina and Schülli, Tobias U. and Wieck, Andreas D. and Pietsch, Ullrich, year=2013, pages=887–892 
LibreCat: /record/7286
DOI: 10.1107/s0021889813004226