Grazing-incidence X-ray diffraction of single GaAs nanowires at locations defined by focused ion beams
G. Bussone, R. Schott, A. Biermanns, A. Davydok, D. Reuter, G. Carbone, T.U. Schülli, A.D. Wieck, U. Pietsch, Journal of Applied Crystallography 46 (2013) 887–892.
LibreCat: /record/7286
DOI: 10.1107/s0021889813004226