Preuss, M., Schmidt, W. G., Seino, K., &; Bechstedt, F. (2004). Methylchloride adsorbed on Si(001): an ab initio study. Applied Surface Science, 234, 155–161.https://doi.org/10.1016/j.apsusc.2004.05.041 
LibreCat: /record/13715
DOI: 10.1016/j.apsusc.2004.05.041

Fleischer, K., Chandola, S., Esser, N., Richter, W., McGilp, J. ., Schmidt, W. G.,https://doi.org/10.1016/j.apsusc.2004.05.114__Bernholc, J. (2004). Atomic indium nanowires on Si(111): the (4 × 1)–(8 × 2) phase transition studied with reflectance anisotropy spectroscopy. Applied Surface Science, 234, 302–306.https://doi.org/10.1016/j.apsusc.2004.05.114 
LibreCat: /record/13716
DOI: 10.1016/j.apsusc.2004.05.114

Schmidt, W. G., Bechstedt, F., &; Bernholc, J. (2002). GaAs(001) surface reconstructions: geometries, chemical bonding and optical properties. Applied Surface Science, 190, 264–268.https://doi.org/10.1016/s0169-4332(01)00862-5 
LibreCat: /record/13738
DOI: 10.1016/s0169-4332(01)00862-5

Hingerl, K., Balderas-Navarro, R. ., Bonanni, A., Tichopadek, P., &; Schmidt, W. (2002). On the origin of resonance features in reflectance difference data of silicon. Applied Surface Science, 175–176, 769–776.https://doi.org/10.1016/s0169-4332(01)00114-3 
LibreCat: /record/13752
DOI: 10.1016/s0169-4332(01)00114-3

Hingerl, K., Balderas-Navarro, R. ., Bonanni, A., Tichopadek, P., &; Schmidt, W. G. (2001). On the origin of resonance features in reflectance difference data of silicon. Applied Surface Science, 175–176, 769–776.https://doi.org/10.1016/s0169-4332(01)00114-3 
LibreCat: /record/13847
DOI: 10.1016/s0169-4332(01)00114-3

Schmidt, W. G., Bernholc, J., &; Bechstedt, F. (2000). (001) Surfaces of GaP and InP: structural motifs, electronic states and optical signatures. Applied Surface Science, 166, 179–184.https://doi.org/10.1016/s0169-4332(00)00406-2 
LibreCat: /record/13757
DOI: 10.1016/s0169-4332(00)00406-2

Frisch, A. M., Vogt, P., Visbeck, S., Hannappel, T., Willig, F., Braun, W.,https://doi.org/10.1016/s0169-4332(00)00431-1__Esser, N. (2000). Angle Resolved Photoemission Spectroscopy of the InP(001) surface. Applied Surface Science, 166, 224–230.https://doi.org/10.1016/s0169-4332(00)00431-1 
LibreCat: /record/13758
DOI: 10.1016/s0169-4332(00)00431-1

Schmidt, W. G., Käckell, P., &; Bechstedt, F. (1998). In-induced (4 × 2) reconstructions of GaAs(001) surfaces. Applied Surface Science, 123–124, 136–140.https://doi.org/10.1016/s0169-4332(97)00510-2 
LibreCat: /record/13774
DOI: 10.1016/s0169-4332(97)00510-2

Nilen, R. W. N., Connell, S. H., Schmidt, W. G., Britton, D. T., Verwoerd, W. S., Sellschop, J. P. F., &; Shrivastava, S. (1997). Electron-positron momentum density distribution in diamond. Applied Surface Science, 116, 330–334.https://doi.org/10.1016/s0169-4332(96)01078-1 
LibreCat: /record/13781
DOI: 10.1016/s0169-4332(96)01078-1

Käckell, P., Schmidt, W. G., &; Bechstedt, F. (1996). Se-induced 3d core-level shifts of GaAs(110). Applied Surface Science, 104–105, 141–146.https://doi.org/10.1016/s0169-4332(96)00135-3 
LibreCat: /record/13794
DOI: 10.1016/s0169-4332(96)00135-3