Influence of lens aberrations, specimen thickness and tilt on differential phase contrast STEM images
J. Bürger, T. Riedl, J.K.N. Lindner, Ultramicroscopy (2020).
LibreCat: /record/20892
DOI: 10.1016/j.ultramic.2020.113118

Influence of lens aberrations, specimen thickness and tilt on differential phase contrast STEM images
J. Bürger, T. Riedl, J. Lindner, Ultramicroscopy 219 (2020).
LibreCat: /record/34088
DOI: 10.1016/j.ultramic.2020.113118

Nanoscale devices fabricated by direct machining of GaAs with an atomic force microscope
M. Versen, B. Klehn, U. Kunze, D. Reuter, A.. Wieck, Ultramicroscopy (2002) 159–163.
LibreCat: /record/8772
DOI: 10.1016/s0304-3991(99)00127-8

Fabrication of a quantum point contact by the dynamic plowing technique and wet-chemical etching
S. Skaberna, M. Versen, B. Klehn, U. Kunze, D. Reuter, A. D. Wieck, Ultramicroscopy (2002) 153–157.
LibreCat: /record/8773
DOI: 10.1016/s0304-3991(99)00126-6