J. Bürger, T. Riedl, and J. K. N. Lindner, “Influence of lens aberrations, specimen thickness and tilt on differential phase contrast STEM images,” Ultramicroscopy, 2020.

J. Bürger, T. Riedl, and J. Lindner, “Influence of lens aberrations, specimen thickness and tilt on differential phase contrast STEM images,”10.1016/j.ultramic.2020.113118__Ultramicroscopy, vol. 219, Art. no. 113118, 2020, doi:10.1016/j.ultramic.2020.113118 .

M. Versen, B. Klehn, U. Kunze, D. Reuter, and A. . Wieck, “Nanoscale devices fabricated by direct machining of GaAs with an atomic force microscope,” Ultramicroscopy, pp. 159–163, 2002.

S. Skaberna, M. Versen, B. Klehn, U. Kunze, D. Reuter, and A. D. Wieck, “Fabrication of a quantum point contact by the dynamic plowing technique and wet-chemical etching,” Ultramicroscopy, pp. 153–157, 2002.