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DOI: 10.1016/j.vibspec.2021.103256

de los Arcos T, Müller H, Wang F, et al. Review of infrared spectroscopy techniques for the determination of internal structure in thin SiO2 films. Vibrational Spectroscopy. Published online 2021. doi:10.1016/j.vibspec.2021.103256
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DOI: 10.1016/j.vibspec.2021.103256

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