In-Situ Determination of the Charging of Nanometer and Submicron Particles at High Temperatures
A. Schiel, A.P. Weber, G. Kasper, H.-J. Schmid, Particle &; Particle Systems Characterization 19 (2002) 410–418.

In-Situ Measurement of Local Particle Flux Densities in a Complex Two-Phase Flow
H.-J. Schmid, S. Veith, H. Umhauer, Particle &; Particle Systems Characterization 19 (2002).