X-ray absorption and magnetic circular dichroism studies of annealed magnetic tunnel junctions
J. Schmalhorst, M. Sacher, A. Thomas, H. Brückl, G. Reiss, K. Starke, Journal of Applied Physics 97 (2005).

X-ray absorption and magnetic circular dichroism studies of annealed magnetic tunnel junctions
J. Schmalhorst, M. Sacher, A. Thomas, H. Brückl, G. Reiss, K. Starke, Journal of Applied Physics 97 (2005).

Influence of noble-gas ion irradiation on alumina barrier of magnetic tunnel junctions
M. Sacher, J. Sauerwald, J. Schmalhorst, G. Reiss, Journal of Applied Physics 98 (2005).

Capacitance and tunneling spectroscopy of InAs quantum dots
K.H. Schmidt, C. Bock, M. Versen, U. Kunze, D. Reuter, A.D. Wieck, Journal of Applied Physics (2004) 5715–5721.

Thermal annealing of junctions with amorphous and polycrystalline ferromagnetic electrodes
T. Dimopoulos, G. Gieres, J. Wecker, N. Wiese, M. Sacher, Journal of Applied Physics 96 (2004) 6382–6386.

Fabrication of two-dimensional electron systems by focused ion beam doping of III/V semiconductor heterostructures
C. Meier, D. Reuter, C. Riedesel, A.D. Wieck, Journal of Applied Physics 93 (2003) 6100–6106.

Fabrication of two-dimensional electron systems by focused ion beam doping of III/V semiconductor heterostructures
C. Meier, D. Reuter, C. Riedesel, A.D. Wieck, Journal of Applied Physics (2003) 6100–6106.

Increased mobility anisotropy in selectively doped AlxGxAs/GaAs heterostructures with high electron densities
D. Reuter, M. Versen, M.D. Schneider, A.D. Wieck, Journal of Applied Physics (2002) 321–325.

Modifying diffusion anisotropies: Cap layer induced changes in spreading anisotropies
D. Reuter, G. Gerth, J. Kirschner, Journal of Applied Physics (2002) 5374–5377.

Depth profile of the implantation-enhanced intermixing of Ga+ focused ion beam in AlAs/GaAs quantum wells
S. Eshlaghi, C. Meier, D. Suter, D. Reuter, A.D. Wieck, Journal of Applied Physics 86 (1999) 6605–6607.

Bistability in polymerdispersed ferroelectric liquid crystals
H. Molsen, H.-S. Kitzerow, Journal of Applied Physics 75 (1994) 710–716.