@articleRusser_Uddin_Awny_Thiede_Russer_2015, title=Near-field measurement of stochastic electromagnetic fields, volume=4, DOI=10.1109/memc.2015.7336761, number=3, journal=IEEE Electromagnetic Compatibility Magazine, publisher=Institute of Electrical and Electronics Engineers (IEEE), author=Russer, Johannes A. and Uddin, Nasir and Awny, Ahmed Sanaa and Thiede, Andreas and Russer, Peter, year=2015, pages=79–85