AFM-IR investigation of thin PECVD SiO<i><sub>x</sub></i> films on a polypropylene substrate in the surface-sensitive mode
H. Müller, H. Stadler, T. de los Arcos, A. Keller, G. Grundmeier, Beilstein Journal of Nanotechnology 15 (2024) 603–611.

AFM-IR investigation of thin PECVD SiO x films on a polypropylene substrate in the surface-sensitive mode
H. Müller, H. Stadler, M.T. de los Arcos de Pedro, A. Keller, G. Grundmeier, Beilstein Journal of Nanotechnology 15 (2024) 603–611.

The role of sulfonate groups and hydrogen bonding in the proton conductivity of two coordination networks
A. Javed, F. Steinke, S. Wöhlbrandt, H. Bunzen, N. Stock, M. Tiemann, Beilstein Journal of Nanotechnology 13 (2022) 437–443.

Scanning transmission helium ion microscopy on carbon nanomembranes
D. Emmrich, A. Wolff, N. Meyerbröker, J. Lindner, A. Beyer, A. Gölzhäuser, Beilstein Journal of Nanotechnology (2021) 222–231.