Schaude J, Hausotte T. Atomic Force Microscope with an Adjustable Probe Direction and Integrated Sensing and Actuation. Nanomanufacturing and Metrology. 2022;5(2):139-148. doi:10.1007/s41871-022-00143-9
LibreCat: /record/34214
DOI: 10.1007/s41871-022-00143-9