Bildauswertendes Verfahren zur Evaluierung der Mikrostruktur von AlSi-Systemen
M. Neuser, G. Cichon, K.-P. Hoyer, M. Schaper, in: Bildauswertendes Verfahren zur Evaluierung der Mikrostruktur von AlSi-Systemen, Deutsche Gesellschaft für Materialkunde (DGM), Sankt Augustin, 2025, pp. 454–459.

A new Lagrangian approach to control affine systems with a quadratic Lagrange term
S. Leyendecker, S. Maslovskaya, S. Ober-Blöbaum, R.T.S.M. de Almagro, F.O. Szemenyei, Journal of Computational Dynamics 0 (2024) 0–0.

Machine learning of discrete field theories with guaranteed convergence and uncertainty quantification
C. Offen, (n.d.).

Konzipierung, Analyse und Realumsetzung eines mehrstufigen modellprädiktiven Lichtsignalanlagenregelungssystems
K. Malena, Konzipierung, Analyse und Realumsetzung eines mehrstufigen modellprädiktiven Lichtsignalanlagenregelungssystems, Heinz Nixdorf Institut, Universität Paderborn, 2024.

Model-based planning of test cases and test scenarios to support engineering of Cyber-Physical Systems
I. Gräßler, M. Ebel, J. Pottebaum, in: 2024 IEEE International Symposium on Systems Engineering (ISSE), IEEE, 2024.

Stimuliaccelerated polymeric drug delivery systems
T. Rust, D. Jung, K. Langer, D. Kuckling, Polymer International 72 (2023) 5–19.

Business Reputation Systems based on Blockchain Technology—A Risky Advance
S. Hemmrich, in: Proceedings of 31st European Conference on Information Systems (ECIS 2023), 2023.

Learning discrete Lagrangians for variational PDEs from data and detection of travelling waves
C. Offen, S. Ober-Blöbaum, in: F. Nielsen, F. Barbaresco (Eds.), Geometric Science of Information, Springer, Cham., 2023, pp. 569–579.

Integrating Prospective Scenarios in Life Cycle Engineering: Case Study of Lightweight Structures
M. Ostermann, J. Grenz, M. Triebus, F. Cerdas, T. Marten, T. Tröster, C. Herrmann, Energies 16 (2023).

Der Hauptschulabschluss als sozial selektiver Hauptzulieferer des Übergangssystems
C. Sommer, Berufsbildung. Zeitschrift Für Theorie-Praxis-Dialog 199 (2023) 9–13.

AI Assisted Interference Classification to Improve EMC Troubleshooting in Electronic System Development
J. Maalouly, D. Hemker, C. Hedayat, C. Rückert, I. Kaufmann, M. Olbrich, S. Lange, H. Mathis, in: 2022 Kleinheubach Conference, IEEE, Miltenberg, Germany, 2022.

AI-Based Assistance System for Manufacturing
S. Deppe, L. Brandt, M. Brünninghaus, J. Papenkordt, S. Heindorf, G. Tschirner-Vinke, (2022).

Family Climate and Social Adaptation of Adolescents in Community Samples: A Systematic Review
R. Kurock, N. Gruchel, S. Bonanati, H.M. Buhl, Adolescent Research Review (2022).

Composed Physics- and Data-driven System Identification for Non-autonomous Systems in Control Engineering
R.-S. Götte, J. Timmermann, in: 2022 3rd International Conference on Artificial Intelligence, Robotics and Control (AIRC), 2022, pp. 67–76.

Multi-Objective Physics-Guided Recurrent Neural Networks for Identifying Non-Autonomous Dynamical Systems
O. Schön, R.-S. Götte, J. Timmermann, in: 14th IFAC Workshop on Adaptive and Learning Control Systems (ALCOS 2022), 2022, pp. 19–24.

A continuous strategy for collisionless gathering
S. Li, C. Markarian, F. Meyer auf der Heide, P. Podlipyan, Theoretical Computer Science 852 (2021) 41–60.

The impact of the Gabriel subgraph of the visibility graph on the gathering of mobile autonomous robots
S. Li, F. Meyer auf der Heide, P. Podlipyan, Theoretical Computer Science 852 (2021) 29–40.

Adaptive Zero-Sequence Voltage Injection for Modular Solid-State Transformer to Compensate for Asymmetrical Fault Conditions
R. Unruh, J. Lange, F. Schafmeister, J. Böcker, in: 23rd European Conference on Power Electronics and Applications (EPE’21 ECCE Europe), IEEE, 2021.

V-model based development of cyber-physical systems and cyber-physical production systems
I. Gräßler, D. Wiechel, D. Roesmann, H. Thiele, in: Procedia CIRP, 2021, pp. 253–258.

Far-field prediction combining simulations with near-field measurements for EMI assessment of PCBs
D. Schroder, S. Lange, C. Hangmann, C. Hedayat, in: Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis, 1st ed.,  The Institution of Engineering and Technology (IET), Croyton, UK, 2020, pp. 315-346 (32).