Letmathe, Sebastian, Yuanhua Feng, and André Uhde. “Semiparametric GARCH Models with Long Memory Applied to Value at Risk and Expected Shortfall.”https://doi.org/10.21314/JOR.2022.044__Journal of Risk, n.d.https://doi.org/10.21314/JOR.2022.044 .
LibreCat: /record/29317
DOI: 10.21314/JOR.2022.044