Angelico R, Burgemeister D, Ceglie A, Olsson U, Palazzo G, Schmidt C. Deuterium NMR Study of Slow Relaxation Dynamics in a Polymer-like Micelles System after Flow-Induced Orientation. The Journal of Physical Chemistry B. 2003;107(38):10325-10328. doi:10.1021/jp0356259
LibreCat: /record/35360
DOI: 10.1021/jp0356259

Pannemann Ch, Diekmann T, Hilleringmann U. Nanometer scale organic thin film transistors with Pentacene. Microelectronic Engineering. 2003;67-68:845-852. doi:10.1016/s0167-9317(03)00146-1
LibreCat: /record/39851
DOI: 10.1016/s0167-9317(03)00146-1

Schönstein I, Müller J, Hilleringmann U, Goser K. Characterization of submicron NMOS devices due to visible light emission. Microelectronic Engineering. 2002;21(1-4):363-366. doi:10.1016/0167-9317(93)90092-j
LibreCat: /record/39912
DOI: 10.1016/0167-9317(93)90092-j

Hilleringmann U, Goser K. Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon. Microelectronic Engineering. 2002;19(1-4):211-214. doi:10.1016/0167-9317(92)90425-q
LibreCat: /record/39914
DOI: 10.1016/0167-9317(92)90425-q

Horstmann JT, Hilleringmann U, Goser K. Characterisation of sub-100 nm-MOS-transistors processed by optical lithography and a sidewall-etchback technique. Microelectronic Engineering. 2002;30(1-4):431-434. doi:10.1016/0167-9317(95)00280-4
LibreCat: /record/39899
DOI: 10.1016/0167-9317(95)00280-4

Mankowski V, Hilleringmann U, Schumacher K. A novel insulation technique for smart power switching devices and very high voltage ICs above 10 kV. Microelectronic Engineering. 2002;53(1-4):525-528. doi:10.1016/s0167-9317(00)00370-1
LibreCat: /record/39882
DOI: 10.1016/s0167-9317(00)00370-1

Horstmann JT, Hilleringmann U, Goser K. 1/f-Noise of sub-100 nm-MOS-transistors fabricated by a special deposition and etchback technique. Microelectronic Engineering. 2002;53(1-4):213-216. doi:10.1016/s0167-9317(00)00299-9
LibreCat: /record/39879
DOI: 10.1016/s0167-9317(00)00299-9

Hilleringmann U, Knospe K, Heite C, Schumacher K, Goser K. A silicon based technology for monolithic integration of waveguides and VLSI CMOS circuits. Microelectronic Engineering. 2002;15(1-4):289-292. doi:10.1016/0167-9317(91)90231-2
LibreCat: /record/39919
DOI: 10.1016/0167-9317(91)90231-2

Soennecken A, Hilleringmann U, Goser K. Floating gate structures as nonvolatile analog memory cells in 1.0;cm-LOCOS-CMOS technology with PZT dielectrica. Microelectronic Engineering. 2002;15(1-4):633-636. doi:10.1016/0167-9317(91)90299-s
LibreCat: /record/39920
DOI: 10.1016/0167-9317(91)90299-s

Hilleringmann U, Goser K. Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon. Microelectronic Engineering. 2002;19(1-4):211-214. doi:10.1016/0167-9317(92)90425-q
LibreCat: /record/39915
DOI: 10.1016/0167-9317(92)90425-q

Adams S, Hilleringmann U, Goser K. CMOS compatible micromachining by dry silicon-etching techniques. Microelectronic Engineering. 2002;19(1-4):191-194. doi:10.1016/0167-9317(92)90420-v
LibreCat: /record/39916
DOI: 10.1016/0167-9317(92)90420-v

Mankowski V, Hilleringmann U, Schumacher K. 12 kV low current cascaded light triggered switch on one silicon chip. Microelectronic Engineering. 2002;46(1-4):413-417. doi:10.1016/s0167-9317(99)00122-7
LibreCat: /record/39889
DOI: 10.1016/s0167-9317(99)00122-7

Hilleringmann U, Vieregge T, Horstmann JT. A structure definition technique for 25 nm lines of silicon and related materials. Microelectronic Engineering. 2002;53(1-4):569-572. doi:10.1016/s0167-9317(00)00380-4
LibreCat: /record/39877
DOI: 10.1016/s0167-9317(00)00380-4

Buey J, Espinet P, Kitzerow H-S, Strauss J. Metallomesogens presenting blue phases in a glassy state and in metallomesogen/nematic mixtures. Chemical Communications. 1999;(5):441-442. doi:10.1039/a900374f
LibreCat: /record/40223
DOI: 10.1039/a900374f

Schmidt G, Müller S, Lindner P, Schmidt C, Richtering W. Shear Orientation of Lyotropic Hexagonal Phases. The Journal of Physical Chemistry B. 1998;102(3):507-513. doi:10.1021/jp9725745
LibreCat: /record/35373
DOI: 10.1021/jp9725745

Kratzat K, Schmidt C, Finkelmann H. A Doubly Branched Nonionic Oligooxyethylene V-Amphiphile: Effect of Molecular Geometry on Liquid-Crystalline Phase Behavior, 3. Journal of Colloid and Interface Science. 1994;163(1):190-198. doi:10.1006/jcis.1994.1095
LibreCat: /record/35384
DOI: 10.1006/jcis.1994.1095

Herzog B, Huber K, Rennie AR. Characterization of Worm-like Micelles Containing Solubilized Dye-Molecules by Light Scattering Techniques. Journal of Colloid and Interface Science. 1994;164(2):370-381. doi:10.1006/jcis.1994.1179
LibreCat: /record/42055
DOI: 10.1006/jcis.1994.1179

Maloney C, Huber K. Mixtures of Polyacrylic Acid and Nonionic Surfactants at the Water/Air Interface. Journal of Colloid and Interface Science. 1994;164(2):463-470. doi:10.1006/jcis.1994.1189
LibreCat: /record/42054
DOI: 10.1006/jcis.1994.1189

Huber K. Interactions in mixed interfaces of binary surfactant solutions. Journal of Colloid and Interface Science. 1991;147(2):321-332. doi:10.1016/0021-9797(91)90164-4
LibreCat: /record/42057
DOI: 10.1016/0021-9797(91)90164-4