Ksenzov, D., Grigorian, S., Hendel, S., Bienert, F., Sacher, M., Heinzmann, U., &; Pietsch, U. (2009). Reflection of femtosecond pulses from soft X-ray free-electron laser by periodical multilayers. Physica Status Solidi (a), 206(8), 1875–1879.https://doi.org/10.1002/pssa.200881585 

Rill, C., Bauer, M., Bertagnolli, H., &; Kickelbick, G. (2008). Microemulsion approach to neodymium, europium, and ytterbium oxide/hydroxide colloids—Effects of precursors and preparation parameters on particle size and crystallinity. Journal of Colloid and Interface Science, 325(1), 179–186.https://doi.org/10.1016/j.jcis.2008.05.008 

Diekmann, T., Pannemann, C., &; Hilleringmann, U. (2008). Dielectric layers for organic field effect transistors as gate dielectric and surface passivation. Physica Status Solidi (a), 205(3), 564–577.https://doi.org/10.1002/pssa.200723406 

Kitzerow, H.-S., Lorenz, A., &; Matthias, H. (2007). Tuneable photonic crystals obtained by liquid crystal infiltration. Physica Status Solidi (a), 204(11), 3754–3767.https://doi.org/10.1002/pssa.200776404 

Kitzerow, H.-S., Lorenz, A., &; Matthias, H. (2007). Tuneable photonic crystals obtained by liquid crystal infiltration. Physica Status Solidi (a), 204(11), 3754–3767.https://doi.org/10.1002/pssa.200776404 

Bauer, M., &; Bertagnolli, H. (2007). The Amplitude Reduction Factor and the Cumulant Expansion Method:  Crucial Factors in the Structural Analysis of Alkoxide Precursors in Solution. The Journal of Physical Chemistry B, 111(49), 13756–13764.https://doi.org/10.1021/jp076386i 

Lages, S., Schweins, R., &; Huber, K. (2007). Temperature-Induced Collapse of Alkaline Earth CationPolyacrylate Anion Complexes. The Journal of Physical Chemistry B, 111(35), 10431–10437.https://doi.org/10.1021/jp068258k 

Jiang, J., Hilleringmann, U., &; Shui, X. (2007). Electro-thermo-mechanical analytical modeling of multilayer cantilever microactuator. Sensors and Actuators A: Physical, 137(2), 302–307.https://doi.org/10.1016/j.sna.2007.03.012 

Frank, C., Strey, R., Schmidt, C., &; Stubenrauch, C. (2006). Coexisting lamellar phases in water–oil–surfactant systems induced by the addition of an amphiphilic block copolymer. Journal of Colloid and Interface Science, 312(1), 76–86.https://doi.org/10.1016/j.jcis.2006.06.043 

Kramer, T., Scholz, S., Maskos, M., &; Huber, K. (2004). Colloid–polymer mixtures in solution with refractive index matched acrylate colloids. Journal of Colloid and Interface Science, 279(2), 447–457.https://doi.org/10.1016/j.jcis.2004.06.102 

Angelico, R., Burgemeister, D., Ceglie, A., Olsson, U., Palazzo, G., &; Schmidt, C. (2003). Deuterium NMR Study of Slow Relaxation Dynamics in a Polymer-like Micelles System after Flow-Induced Orientation. The Journal of Physical Chemistry B, 107(38), 10325–10328.https://doi.org/10.1021/jp0356259 

Pannemann, Ch., Diekmann, T., &; Hilleringmann, U. (2003). Nanometer scale organic thin film transistors with Pentacene. Microelectronic Engineering, 67–68, 845–852.https://doi.org/10.1016/s0167-9317(03)00146-1 

Schönstein, I., Müller, J., Hilleringmann, U., &; Goser, K. (2002). Characterization of submicron NMOS devices due to visible light emission. Microelectronic Engineering, 21(1–4), 363–366.https://doi.org/10.1016/0167-9317(93)90092-j 

Hilleringmann, U., &; Goser, K. (2002). Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon. Microelectronic Engineering, 19(1–4), 211–214.https://doi.org/10.1016/0167-9317(92)90425-q 

Horstmann, J. T., Hilleringmann, U., &; Goser, K. (2002). Characterisation of sub-100 nm-MOS-transistors processed by optical lithography and a sidewall-etchback technique. Microelectronic Engineering, 30(1–4), 431–434.https://doi.org/10.1016/0167-9317(95)00280-4 

Mankowski, V., Hilleringmann, U., &; Schumacher, K. (2002). A novel insulation technique for smart power switching devices and very high voltage ICs above 10 kV. Microelectronic Engineering, 53(1–4), 525–528.https://doi.org/10.1016/s0167-9317(00)00370-1 

Horstmann, J. T., Hilleringmann, U., &; Goser, K. (2002). 1/f-Noise of sub-100 nm-MOS-transistors fabricated by a special deposition and etchback technique. Microelectronic Engineering, 53(1–4), 213–216.https://doi.org/10.1016/s0167-9317(00)00299-9 

Hilleringmann, U., Knospe, K., Heite, C., Schumacher, K., &; Goser, K. (2002). A silicon based technology for monolithic integration of waveguides and VLSI CMOS circuits. Microelectronic Engineering, 15(1–4), 289–292.https://doi.org/10.1016/0167-9317(91)90231-2 

Soennecken, A., Hilleringmann, U., &; Goser, K. (2002). Floating gate structures as nonvolatile analog memory cells in 1.0;cm-LOCOS-CMOS technology with PZT dielectrica. Microelectronic Engineering, 15(1–4), 633–636.https://doi.org/10.1016/0167-9317(91)90299-s 

Hilleringmann, U., &; Goser, K. (2002). Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon. Microelectronic Engineering, 19(1–4), 211–214.https://doi.org/10.1016/0167-9317(92)90425-q