Sander, Tom, Sven Lange, Ulrich Hilleringmann, Volker Geneis, Christian Hedayat, Harald Kuhn, and Franz-Barthold Gockel. “Detection of Defects on Irregular Structured Surfaces by Image Processing Methods for Feature Extraction.”https://doi.org/10.1109/icit46573.2021.9453646__In 22nd IEEE International Conference on Industrial Technology (ICIT). Valencia, Spain : IEEE, 2021.https://doi.org/10.1109/icit46573.2021.9453646 .
LibreCat: /record/22481
DOI: 10.1109/icit46573.2021.9453646