Sander, Tom, et al. “Detection of Defects on Irregular Structured Surfaces by Image Processing Methods for Feature Extraction.”10.1109/icit46573.2021.9453646__22nd IEEE International Conference on Industrial Technology (ICIT), IEEE, 2021, doi:10.1109/icit46573.2021.9453646.
LibreCat: /record/22481
DOI: 10.1109/icit46573.2021.9453646