@articleHilleringmann_Goser_2002, title=Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon, volume=19, DOI=10.1016/0167-9317(92)90425-q, number=1–4, journal=Microelectronic Engineering, publisher=Elsevier BV, author=Hilleringmann, Ulrich and Goser, K., year=2002, pages=211–214 
LibreCat: /record/39914
DOI: 10.1016/0167-9317(92)90425-q

@articleHorstmann_Hilleringmann_Goser_2002, title=Characterisation of sub-100 nm-MOS-transistors processed by optical lithography and a sidewall-etchback technique, volume=30, DOI=10.1016/0167-9317(95)00280-4, number=1–4, journal=Microelectronic Engineering, publisher=Elsevier BV, author=Horstmann, J.T. and Hilleringmann, Ulrich and Goser, K., year=2002, pages=431–434 
LibreCat: /record/39899
DOI: 10.1016/0167-9317(95)00280-4

@articleMankowski_Hilleringmann_Schumacher_2002, title=A novel insulation technique for smart power switching devices and very high voltage ICs above 10 kV, volume=53, DOI=10.1016/s0167-9317(00)00370-1, number=1–4, journal=Microelectronic Engineering, publisher=Elsevier BV, author=Mankowski, V. and Hilleringmann, Ulrich and Schumacher, K., year=2002, pages=525–528 
LibreCat: /record/39882
DOI: 10.1016/s0167-9317(00)00370-1

@articleHorstmann_Hilleringmann_Goser_2002, title=1/f-Noise of sub-100 nm-MOS-transistors fabricated by a special deposition and etchback technique, volume=53, DOI=10.1016/s0167-9317(00)00299-9, number=1–4, journal=Microelectronic Engineering, publisher=Elsevier BV, author=Horstmann, J.T. and Hilleringmann, Ulrich and Goser, K., year=2002, pages=213–216 
LibreCat: /record/39879
DOI: 10.1016/s0167-9317(00)00299-9

@articleHilleringmann_Knospe_Heite_Schumacher_Goser_2002, title=A silicon based technology for monolithic integration of waveguides and VLSI CMOS circuits, volume=15, DOI=10.1016/0167-9317(91)90231-2, number=1–4, journal=Microelectronic Engineering, publisher=Elsevier BV, author=Hilleringmann, Ulrich and Knospe, K. and Heite, C. and Schumacher, K. and Goser, K., year=2002, pages=289–292 
LibreCat: /record/39919
DOI: 10.1016/0167-9317(91)90231-2

@articleSoennecken_Hilleringmann_Goser_2002, title=Floating gate structures as nonvolatile analog memory cells in 1.0;cm-LOCOS-CMOS technology with PZT dielectrica, volume=15, DOI=10.1016/0167-9317(91)90299-s, number=1–4, journal=Microelectronic Engineering, publisher=Elsevier BV, author=Soennecken, A. and Hilleringmann, Ulrich and Goser, K., year=2002, pages=633–636 
LibreCat: /record/39920
DOI: 10.1016/0167-9317(91)90299-s

@articleHilleringmann_Goser_2002, title=Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon, volume=19, DOI=10.1016/0167-9317(92)90425-q, number=1–4, journal=Microelectronic Engineering, publisher=Elsevier BV, author=Hilleringmann, Ulrich and Goser, K., year=2002, pages=211–214 
LibreCat: /record/39915
DOI: 10.1016/0167-9317(92)90425-q

@articleAdams_Hilleringmann_Goser_2002, title=CMOS compatible micromachining by dry silicon-etching techniques, volume=19, DOI=10.1016/0167-9317(92)90420-v, number=1–4, journal=Microelectronic Engineering, publisher=Elsevier BV, author=Adams, S. and Hilleringmann, Ulrich and Goser, K., year=2002, pages=191–194 
LibreCat: /record/39916
DOI: 10.1016/0167-9317(92)90420-v

@articleHorstmann_Hilleringmann_Goser_2002, title=Matching analysis of deposition defined 50-nm MOSFET’s, volume=45, DOI=10.1109/16.658845, number=1, journal=IEEE Transactions on Electron Devices, publisher=Institute of Electrical and Electronics Engineers (IEEE), author=Horstmann, J.T. and Hilleringmann, Ulrich and Goser, K.F., year=2002, pages=299–306 
LibreCat: /record/39348
DOI: 10.1109/16.658845

@articleMankowski_Hilleringmann_Schumacher_2002, title=12 kV low current cascaded light triggered switch on one silicon chip, volume=46, DOI=10.1016/s0167-9317(99)00122-7, number=1–4, journal=Microelectronic Engineering, publisher=Elsevier BV, author=Mankowski, V. and Hilleringmann, Ulrich and Schumacher, K., year=2002, pages=413–417 
LibreCat: /record/39889
DOI: 10.1016/s0167-9317(99)00122-7

@articleHorstmann_Hilleringmann_Goser_2002, title=Matching analysis of deposition defined 50-nm MOSFET’s, volume=45, DOI=10.1109/16.658845, number=1, journal=IEEE Transactions on Electron Devices, publisher=Institute of Electrical and Electronics Engineers (IEEE), author=Horstmann, J.T. and Hilleringmann, Ulrich and Goser, K.F., year=2002, pages=299–306 
LibreCat: /record/39891
DOI: 10.1109/16.658845

@articleWirth_Hilleringmann_Horstmann_Goser_2002, title=Mesoscopic transport phenomena in ultrashort channel MOSFETs, volume=43, DOI=10.1016/s0038-1101(99)00060-x, number=7, journal=Solid-State Electronics, publisher=Elsevier BV, author=Wirth, G and Hilleringmann, Ulrich and Horstmann, J.T and Goser, K, year=2002, pages=1245–1250 
LibreCat: /record/39886
DOI: 10.1016/s0038-1101(99)00060-x

@articleOtterbach_Hilleringmann_Horstmann_Goser_2002, title=Structures with a minimum feature size of less than 100 nm in CVD-diamond for sensor applications, volume=10, DOI=10.1016/s0925-9635(01)00373-9, number=3–7, journal=Diamond and Related Materials, publisher=Elsevier BV, author=Otterbach, R. and Hilleringmann, Ulrich and Horstmann, T.J. and Goser, K., year=2002, pages=511–514 
LibreCat: /record/39876
DOI: 10.1016/s0925-9635(01)00373-9

@articleHilleringmann_Vieregge_Horstmann_2002, title=A structure definition technique for 25 nm lines of silicon and related materials, volume=53, DOI=10.1016/s0167-9317(00)00380-4, number=1–4, journal=Microelectronic Engineering, publisher=Elsevier BV, author=Hilleringmann, Ulrich and Vieregge, T. and Horstmann, J.T., year=2002, pages=569–572 
LibreCat: /record/39877
DOI: 10.1016/s0167-9317(00)00380-4

@articleOtterbach_Hilleringmann_2002, title=Reactive ion etching of CVD-diamond for piezoresistive pressure sensors, volume=11, DOI=10.1016/s0925-9635(01)00703-8, number=3–6, journal=Diamond and Related Materials, publisher=Elsevier BV, author=Otterbach, R. and Hilleringmann, Ulrich, year=2002, pages=841–844 
LibreCat: /record/39874
DOI: 10.1016/s0925-9635(01)00703-8

@articleMahnken_2002, title=Strength difference in compression and tension and pressure dependence of yielding in elasto-plasticity, volume=190, DOI=10.1016/s0045-7825(00)00364-9, number=39, journal=Computer Methods in Applied Mechanics and Engineering, publisher=Elsevier BV, author=Mahnken, Rolf, year=2002, pages=5057–5080 
LibreCat: /record/45307
DOI: 10.1016/s0045-7825(00)00364-9

@articleMahnken_Steinmann_2002, title=A finite element algorithm for parameter identification of material models for fluid saturated porous media, volume=25, DOI=10.1002/nag.136, number=5, journal=International Journal for Numerical and Analytical Methods in Geomechanics, publisher=Wiley, author=Mahnken, Rolf and Steinmann, P., year=2002, pages=415–434 
LibreCat: /record/45413
DOI: 10.1002/nag.136

@articleMahnken_Kohlmeier_2002, title=Finite element simulation for rock salt with dilatancy boundary coupled to fluid permeation, volume=190, DOI=10.1016/s0045-7825(00)00317-0, number=32–33, journal=Computer Methods in Applied Mechanics and Engineering, publisher=Elsevier BV, author=Mahnken, Rolf and Kohlmeier, M., year=2002, pages=4259–4278 
LibreCat: /record/45412
DOI: 10.1016/s0045-7825(00)00317-0

@articleMahnken_Tikhomirov_Stein_2002, title=Implicit integration scheme and its consistent linearization for an elastoplastic-damage model with application to concrete, volume=75, DOI=10.1016/s0045-7949(99)00089-9, number=2, journal=Computers &;amp; Structures, publisher=Elsevier BV, author=Mahnken, Rolf and Tikhomirov, D. and Stein, E., year=2002, pages=135–143 
LibreCat: /record/45418
DOI: 10.1016/s0045-7949(99)00089-9

@articleMahnken_2002, title=A comprehensive study of a multiplicative elastoplasticity model coupled to damage including parameter identification, volume=74, DOI=10.1016/s0045-7949(98)00296-x, number=2, journal=Computers &;amp; Structures, publisher=Elsevier BV, author=Mahnken, Rolf, year=2002, pages=179–200 
LibreCat: /record/45422
DOI: 10.1016/s0045-7949(98)00296-x