AI Assisted Interference Classification to Improve EMC Troubleshooting in Electronic System Development
J. Maalouly, D. Hemker, C. Hedayat, C. Rückert, I. Kaufmann, M. Olbrich, S. Lange, H. Mathis, in: 2022 Kleinheubach Conference, IEEE, Miltenberg, Germany, 2022.
LibreCat: /record/34140

Far-field prediction combining simulations with near-field measurements for EMI assessment of PCBs
D. Schroder, S. Lange, C. Hangmann, C. Hedayat, in: Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis, 1st ed.,  The Institution of Engineering and Technology (IET), Croyton, UK, 2020, pp. 315-346 (32).
LibreCat: /record/21542
DOI: 10.1049/pbcs072e_ch14