Low temperature fabrication of a ZnO nanoparticle thin-film transistor suitable for flexible electronics
F.F. Vidor, G.I. Wirth, U. Hilleringmann, Microelectronics Reliability 54 (2014) 2760–2765.
LibreCat: /record/39483
DOI: 10.1016/j.microrel.2014.07.147

Dynamic reliability management: Reconfiguring reliability-levels of hardware designs at runtime
J. Anwer, S. Meisner, M. Platzner, in: Reconfigurable Computing and FPGAs (ReConFig), 2013 International Conference On, 2013, pp. 1–6.
LibreCat: /record/10620
DOI: 10.1109/ReConFig.2013.6732280

Non-perturbing cavitation detection / monitoring in sonochemical reactors
P. Bornmann, T. Hemsel, W. Sextro, T. Maeda, T. Morita, in: Ultrasonics Symposium (IUS), 2012 IEEE International, 2012, pp. 1141–1144.
LibreCat: /record/9783
DOI: 10.1109/ULTSYM.2012.0284

Increasing the reliability of a self-optimizing railway guidance system
C. Sondermann-Wölke, J. Geisler, W. Sextro, in: Reliability and Maintainability Symposium (RAMS), 2010 Proceedings - Annual, 2010, pp. 1–6.
LibreCat: /record/9763
DOI: 10.1109/RAMS.2010.5448080

Probabilistic planning integrated in a multi-level dependability concept for mechatronic systems
B. Klöpper, C. Sondermann-Wölke, C. Romaus, H. Vöcking, in: Computational Intelligence in Control and Automation, 2009. CICA 2009. IEEE Symposium On, 2009, pp. 104–111.
LibreCat: /record/9736
DOI: 10.1109/CICA.2009.4982790

Verlässlichkeitorientierte Technologiebewertung innovativer Aktortechnologien am Beispiel von Formgedächtnislegierungen
T. Müller, F. Schiedeck, T. Hemsel, in: 2. Tagung Des DVM -- Arbeitskreis Zuverlässigkeit Mechatronischer Und Adaptronischer Systeme: Absicherung Der Systemzuverlässigkeit, Koblenz, 2008.
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