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Vidor FF, Wirth GI, Hilleringmann U. Low temperature fabrication of a ZnO nanoparticle thin-film transistor suitable for flexible electronics. Microelectronics Reliability. 2014;54(12):2760-2765. doi:10.1016/j.microrel.2014.07.147
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Krupp A, Müller W. Classification Trees for Functional Coverage and Random Test Generation. In: Proceedings of the Design Automation &; Test in Europe Conference. IEEE; 2006. doi:10.1109/DATE.2006.243902
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