Stubenrauch, Cosima, et al. “Lyotropic Mesophases Next to Highly Efficient Microemulsions:  A <sup>2</sup>H NMR Study.”10.1021/la0201725__Langmuir, vol. 18, no. 13, American Chemical Society (ACS), 2002, pp. 5027–30, doi:10.1021/la0201725.
LibreCat: /record/35364
DOI: 10.1021/la0201725

Schweins, R., and Klaus Huber. “Collapse of Sodium Polyacrylate Chains in Calcium Salt Solutions.”10.1007/s101890170093__The European Physical Journal E, vol. 5, no. 1, Springer Science and Business Media LLC, 2002, pp. 117–26, doi:10.1007/s101890170093.
LibreCat: /record/42039
DOI: 10.1007/s101890170093

Katzenstein, Armin, and Klaus Huber. “Model of Polydisperse Wormlike Stars and Its Application to Dyestuff Aggregates.”10.1021/la020143u__Langmuir, vol. 18, no. 18, American Chemical Society (ACS), 2002, pp. 7049–56, doi:10.1021/la020143u.
LibreCat: /record/42052
DOI: 10.1021/la020143u

Schönstein, I., et al. “Characterization of Submicron NMOS Devices Due to Visible Light Emission.”10.1016/0167-9317(93)90092-j__Microelectronic Engineering, vol. 21, no. 1–4, Elsevier BV, 2002, pp. 363–66, doi:10.1016/0167-9317(93)90092-j.
LibreCat: /record/39912
DOI: 10.1016/0167-9317(93)90092-j

Hilleringmann, Ulrich, and K. Goser. “Results of Monolithic Integration of Optical Waveguides, Photodiodes and CMOS Circuits on Silicon.”10.1016/0167-9317(92)90425-q__Microelectronic Engineering, vol. 19, no. 1–4, Elsevier BV, 2002, pp. 211–14, doi:10.1016/0167-9317(92)90425-q.
LibreCat: /record/39914
DOI: 10.1016/0167-9317(92)90425-q

Horstmann, J. T., et al. “Characterisation of Sub-100 Nm-MOS-Transistors Processed by Optical Lithography and a Sidewall-Etchback Technique.”10.1016/0167-9317(95)00280-4__Microelectronic Engineering, vol. 30, no. 1–4, Elsevier BV, 2002, pp. 431–34, doi:10.1016/0167-9317(95)00280-4.
LibreCat: /record/39899
DOI: 10.1016/0167-9317(95)00280-4

Mankowski, V., et al. “A Novel Insulation Technique for Smart Power Switching Devices and Very High Voltage ICs above 10 KV.”10.1016/s0167-9317(00)00370-1__Microelectronic Engineering, vol. 53, no. 1–4, Elsevier BV, 2002, pp. 525–28, doi:10.1016/s0167-9317(00)00370-1.
LibreCat: /record/39882
DOI: 10.1016/s0167-9317(00)00370-1

Horstmann, J. T., et al. “/f-Noise of Sub-100 Nm-MOS-Transistors Fabricated by a Special Deposition and Etchback Technique.”10.1016/s0167-9317(00)00299-9__Microelectronic Engineering, vol. 53, no. 1–4, Elsevier BV, 2002, pp. 213–16, doi:10.1016/s0167-9317(00)00299-9.
LibreCat: /record/39879
DOI: 10.1016/s0167-9317(00)00299-9

Hilleringmann, Ulrich, et al. “A Silicon Based Technology for Monolithic Integration of Waveguides and VLSI CMOS Circuits.”10.1016/0167-9317(91)90231-2__Microelectronic Engineering, vol. 15, no. 1–4, Elsevier BV, 2002, pp. 289–92, doi:10.1016/0167-9317(91)90231-2.
LibreCat: /record/39919
DOI: 10.1016/0167-9317(91)90231-2

Soennecken, A., et al. “Floating Gate Structures as Nonvolatile Analog Memory Cells in 1.0;cm-LOCOS-CMOS Technology with PZT Dielectrica.”10.1016/0167-9317(91)90299-s__Microelectronic Engineering, vol. 15, no. 1–4, Elsevier BV, 2002, pp. 633–36, doi:10.1016/0167-9317(91)90299-s.
LibreCat: /record/39920
DOI: 10.1016/0167-9317(91)90299-s

Hilleringmann, Ulrich, and K. Goser. “Results of Monolithic Integration of Optical Waveguides, Photodiodes and CMOS Circuits on Silicon.”10.1016/0167-9317(92)90425-q__Microelectronic Engineering, vol. 19, no. 1–4, Elsevier BV, 2002, pp. 211–14, doi:10.1016/0167-9317(92)90425-q.
LibreCat: /record/39915
DOI: 10.1016/0167-9317(92)90425-q

Adams, S., et al. “CMOS Compatible Micromachining by Dry Silicon-Etching Techniques.”10.1016/0167-9317(92)90420-v__Microelectronic Engineering, vol. 19, no. 1–4, Elsevier BV, 2002, pp. 191–94, doi:10.1016/0167-9317(92)90420-v.
LibreCat: /record/39916
DOI: 10.1016/0167-9317(92)90420-v

Mankowski, V., et al. “KV Low Current Cascaded Light Triggered Switch on One Silicon Chip.”10.1016/s0167-9317(99)00122-7__Microelectronic Engineering, vol. 46, no. 1–4, Elsevier BV, 2002, pp. 413–17, doi:10.1016/s0167-9317(99)00122-7.
LibreCat: /record/39889
DOI: 10.1016/s0167-9317(99)00122-7

Hilleringmann, Ulrich, et al. “A Structure Definition Technique for 25 Nm Lines of Silicon and Related Materials.”10.1016/s0167-9317(00)00380-4__Microelectronic Engineering, vol. 53, no. 1–4, Elsevier BV, 2002, pp. 569–72, doi:10.1016/s0167-9317(00)00380-4.
LibreCat: /record/39877
DOI: 10.1016/s0167-9317(00)00380-4

Inglés, Sergio Escudero, et al. “Time-Resolved Recording of Ionic Dyestuff Aggregation by Static Light Scattering.”10.1021/la9903649__Langmuir, vol. 16, no. 7, American Chemical Society (ACS), 2000, pp. 3010–18, doi:10.1021/la9903649.
LibreCat: /record/42051
DOI: 10.1021/la9903649

Müller, Stefan, et al. “Shear-Induced States of Orientation of the Lamellar Phase of C<sub>12</sub>E<sub>4</sub>/Water.”10.1021/la9904105__Langmuir, vol. 15, no. 22, American Chemical Society (ACS), 1999, pp. 7558–64, doi:10.1021/la9904105.
LibreCat: /record/35371
DOI: 10.1021/la9904105

Buey, Julio, et al. “Metallomesogens Presenting Blue Phases in a Glassy State and in Metallomesogen/Nematic Mixtures.”10.1039/a900374f__Chemical Communications, no. 5, Royal Society of Chemistry (RSC), 1999, pp. 441–42, doi:10.1039/a900374f.
LibreCat: /record/40223
DOI: 10.1039/a900374f

Schmidt, Gudrun, et al. “Shear Orientation of Lyotropic Hexagonal Phases.”10.1021/jp9725745__The Journal of Physical Chemistry B, vol. 102, no. 3, American Chemical Society (ACS), 1998, pp. 507–13, doi:10.1021/jp9725745.
LibreCat: /record/35373
DOI: 10.1021/jp9725745

Lukaschek, Michail, et al. “Shear-Induced Alignment of a Hexagonal Lyotropic Liquid Crystal as Studied by Rheo-NMR.”10.1021/la00009a050__Langmuir, vol. 11, no. 9, American Chemical Society (ACS), 1995, pp. 3590–94, doi:10.1021/la00009a050.
LibreCat: /record/35382
DOI: 10.1021/la00009a050

Kratzat, Krystyna, et al. “A Doubly Branched Nonionic Oligooxyethylene V-Amphiphile: Effect of Molecular Geometry on Liquid-Crystalline Phase Behavior, 3.”10.1006/jcis.1994.1095__Journal of Colloid and Interface Science, vol. 163, no. 1, Elsevier BV, 1994, pp. 190–98, doi:10.1006/jcis.1994.1095.
LibreCat: /record/35384
DOI: 10.1006/jcis.1994.1095