@bookGhazal_Sadeghi-Kohan_Reimer_Hellebrand_2023, place=Erfurt, Germany, title=On Cryptography Effects on Interconnect Reliability, publisher=35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023, author=Ghazal, Abdulkarim and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille, year=2023 

@bookSadeghi-Kohan_Hellebrand_Wunderlich_2022, place=Online, title=EM-Aware Interconnect BIST, publisher=European Workshop on Silicon Lifecycle Management, March 18, 2022, author=Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2022 

@inproceedingsGräßler_Grewe_Kramer_2022, place=Manchester, title=Supporting Business Model Generation with Augmented Reality, booktitle=LUT Scientific and Expertise Publications, author=Gräßler, Iris and Grewe, Benedikt and Kramer, Hendrik, year=2022 

@bookSadeghi-Kohan_Hellebrand_2020, place=Ludwigsburg, title=Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects, publisher=32. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’20), 16. - 18. Februar 2020, author=Sadeghi-Kohan, Somayeh and Hellebrand, Sybille, year=2020 

@bookMaaz_Sprenger_Hellebrand_2019, place=Prien am Chiemsee, title=A Hybrid Space Compactor for Varying X-Rates, publisher=31. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’19), author=Maaz, Mohammad Urf and Sprenger, Alexander and Hellebrand, Sybille, year=2019 

@bookSprenger_Hellebrand_2018, place=Freiburg, Germany, title=Stochastische Kompaktierung für den Hochgeschwindigkeitstest, publisher=30. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’18), author=Sprenger, Alexander and Hellebrand, Sybille, year=2018 

@bookKampmann_Hellebrand_2018, place=19th Workshop on RTL and High Level Testing (WRTLT’18), Hefei, Anhui, China, title=Optimized Constraints for Scan-Chain Insertion for Faster-than-at-Speed Test, author=Kampmann, Matthias and Hellebrand, Sybille, year=2018 

@bookKampmann_Hellebrand_2017, place=29. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’17), Lübeck, Germany, title=X-tolerante Prüfzellengruppierung für den Test mit erhöhter Betriebsfrequenz, author=Kampmann, Matthias and Hellebrand, Sybille, year=2017 

@bookHellebrand_Indlekofer_Kampmann_Kochte_Liu_Wunderlich_2015, place=27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany, title=Effiziente Auswahl von Testfrequenzen für den Test kleiner Verzögerungsfehler, author=Hellebrand, Sybille and Indlekofer, Thomas and Kampmann, Matthias and Kochte, Michael and Liu, Chang and Wunderlich, Hans-Joachim, year=2015 

@bookCook_Rodriguez Gomez_Hellebrand_Indlekofer_Wunderlich_2013, place=14th Latin American Test Workshop, Cordoba, Argentina, title=Adaptive Test and Diagnosis of Intermittent Faults, author=Cook, Alejandro and Rodriguez Gomez, Laura and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim, year=2013 

@bookCook_Hellebrand_Wunderlich_2012, place=24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany, title=Eingebaute Selbstdiagnose mit zufälligen und deterministischen Mustern, author=Cook, Alejandro and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2012 

@bookFröse_Ibers_Hellebrand_2010, place=22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany, title=Testdatenkompression mit Hilfe der Netzwerkinfrastruktur, author=Fröse, Viktor and Ibers, Rüdiger and Hellebrand, Sybille, year=2010 

@bookCoym_Hellebrand_Ludwig_Straube_Wunderlich_G. Zoellin_2008, place=20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (Poster), Wien, Österreich, title=Ein verfeinertes elektrisches Modell für Teilchentreffer und dessen Auswirkung auf die Bewertung der Schaltungsempfindlichkeit, author=Coym, Torsten and Hellebrand, Sybille and Ludwig, Stefan and Straube, Bernd and Wunderlich, Hans-Joachim and G. Zoellin, Christian, year=2008 

@bookAmgalan_Hachmann_Hellebrand_Wunderlich_2008, place=20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Wien, Österreich, title=Testen mit Rücksetzpunkten - ein Ansatz zur Verbesserung der Ausbeute bei robusten Schaltungen, author=Amgalan, Uranmandakh and Hachmann, Christian and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2008 

@bookHellebrand_2007, place=5th IEEE East-West Design \'26; Test Symposium, Yerevan, Armenia (Invited Talk), title=Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing, author=Hellebrand, Sybille, year=2007 

@bookAli_Welzl_Hessler_Hellebrand_2007, place=DATE 2007 Friday Workshop on Diagnostic Services in Network-on-Chips, Nice, France, (Poster), title=An End-to-End Reliability Protocol to Address Transient Faults in Network on Chips, author=Ali, Muhammad and Welzl, Michael and Hessler, Sven and Hellebrand, Sybille, year=2007 

@bookOehler_Hellebrand_Wunderlich_2007, place=17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Erlangen, Germany, title=An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy, author=Oehler, Philipp and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2007 

@bookOehler_Hellebrand_2005, place=Kleinheubachertagung 2005, Miltenberg, Germany, title=A Low Power Design for Embedded DRAMs with Online Consistency Checking, author=Oehler, Philipp and Hellebrand, Sybille, year=2005 

@bookAli_Welzl_Hellebrand_2005, place=17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria, title=Dynamic Routing: A Prerequisite for Reliable NoCs, author=Ali, Muhammad and Welzl, Michael and Hellebrand, Sybille, year=2005 

@bookOehler_Hellebrand_2005, place=17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria, title=Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study, author=Oehler, Philipp and Hellebrand, Sybille, year=2005 

@bookHellebrand_Wuertenberger_S. Tautermann_2004, place=9th IEEE European Test Symposium, Ajaccio, Corsica, France, title=Data Compression for Multiple Scan Chains Using Dictionaries with Corrections, author=Hellebrand, Sybille and Wuertenberger, Armin and S. Tautermann, Christofer, year=2004 

@bookHellebrand_Wuertenberger_2002, place=IEEE International Workshop on Test Resource Partitioning, Baltimore, MD, USA, title=Alternating Run-Length Coding: A Technique for Improved Test Data Compression, author=Hellebrand, Sybille and Wuertenberger, Armin, year=2002 

@bookLiang_Hellebrand_Wunderlich_2001, place=IEEE European Test Workshop, Stockholm, Sweden, title=Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST, author=Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2001 

@bookHellebrand_Liang_Wunderlich_2000, place=IEEE European Test Workshop, Cascais, Portugal, title=A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters, author=Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim, year=2000 

@bookHellebrand_Wunderlich_N. Yarmolik_1999, place=11th GI/ITG/GMM/IEEE Workshop, title=Exploiting Symmetries to Speed Up Transparent BIST, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and N. Yarmolik, Vyacheslav, year=1999 

@bookN. Yarmolik_Hellebrand_Wunderlich_1998, place=5th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, title=Efficient Consistency Checking for Embedded Memories, author=N. Yarmolik, Vyacheslav and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1998 

@bookN. Yarmolik_Hellebrand_Wunderlich_1998, place=10th GI/ITG/GMM/IEEE Workshop, title=Efficient Consistency Checking for Embedded Memories, author=N. Yarmolik, Vyacheslav and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1998 

@bookTsai_Hellebrand_Rajski_Marek-Sadowska_1997, place=4th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, title=STARBIST: Scan Autocorrelated Random Pattern Generation, author=Tsai, Kun-Han and Hellebrand, Sybille and Rajski, Janusz and Marek-Sadowska, Malgorzata, year=1997 

@bookHertwig_Hellebrand_Wunderlich_1997, place=3rd IEEE International On-Line Testing Workshop, Crete, Greece, title=Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications, author=Hertwig, Andre and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1997 

@bookHellebrand_Wunderlich_1996, place=3rd IEEE International Test Synthesis Workshop, Santa Barbara, CA, title=Using Embedded Processors for BIST, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1996 

@bookHellebrand_Wunderlich_Hertwig_1996, place=2nd IEEE International On-Line Testing Workshop. Biarritz, France, title=Mixed-Mode BIST Using Embedded Processors, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig, Andre, year=1996 

@bookHellebrand_Reeb_Tarnick_Wunderlich_1995, place=2nd IEEE International Test Synthesis Workshop, Santa Barbara, CA, title=Pattern Generation for a Deterministic BIST Scheme, author=Hellebrand, Sybille and Reeb, Birgit and Tarnick, Steffen and Wunderlich, Hans-Joachim, year=1995 

@bookVenkataraman_Rajski_Hellebrand_Tarnick_1994, place=6th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Vaals, The Netherlands, title=Effiziente Testsatzkodierung für Prüfpfad-basierte Selbsttestarchitekturen, author=Venkataraman, Srikanth and Rajski, Janusz and Hellebrand, Sybille and Tarnick, Steffen, year=1994 

@bookHellebrand_Wunderlich_1994, place=6th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Vaals, The Netherlands, title=Ein Verfahren zur testfreundlichen Steuerwerkssynthese, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1994 

@bookHellebrand_Paulo Teixeira_Wunderlich_1994, place=1st IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, title=Synthesis for Testability - the ARCHIMEDES Approach, author=Hellebrand, Sybille and Paulo Teixeira, Joao and Wunderlich, Hans-Joachim, year=1994 

@bookHellebrand_Tarnick_Rajski_Courtois_1993, place=5th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Holzhau, Germany, title=Effiziente Erzeugung deterministischer Muster im Selbsttest, author=Hellebrand, Sybille and Tarnick, Steffen and Rajski, Janusz and Courtois, Bernard, year=1993 

@bookHellebrand_Wunderlich_1993, place=ARCHIMEDES Open Workshop on “Synthesis - Architectural Testability Support”, Montpellier, France, title=Synthesis of Self-Testable Controllers, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1993 

@bookHellebrand_Tarnick_Rajski_Courtois_1992, place=IEEE Design for Testability Workshop, Vail, CO, USA, title=Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs, author=Hellebrand, Sybille and Tarnick, Steffen and Rajski, Janusz and Courtois, Bernard, year=1992 

@bookHellebrand_Tarnick_Rajski_Courtois_1992, place=Workshop on New Directions for Testing, Montreal, Canada, title=Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs, author=Hellebrand, Sybille and Tarnick, Steffen and Rajski, Janusz and Courtois, Bernard, year=1992 

@bookHellebrand_Wunderlich_F. Haberl_1990, place=IEEE Design for Testability Workshop, Vail, CO, USA, title=Generating Pseudo-Exhaustive Vectors for External Testing, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and F. Haberl, Oliver, year=1990