Sander, Tom, et al. “Detection of Defects on Irregularly Structured Surfaces Using Supervised and Semi-Supervised Learning Methods.”10.1109/ssi56489.2022.9901433__2022 Smart Systems Integration (SSI), IEEE, 2022, doi:10.1109/ssi56489.2022.9901433.
LibreCat: /record/33510
DOI: 10.1109/ssi56489.2022.9901433