@inbookKöhler_Kupfer_Troschitz_Gude_2022, place=Cham, title=Clinching in In Situ CT—A Novel Validation Method for Mechanical Joining Processes, DOI=10.1007/978-3-031-06212-4_75, booktitle=The Minerals, Metals &; Materials Series, publisher=Springer International Publishing, author=Köhler, Daniel and Kupfer, Robert and Troschitz, Juliane and Gude, Maik, year=2022 

@articleNguyen Quang Do_Krüger_Hill_Ali_Bodden_2018, title=Debugging Static Analysis, DOI=10.1109/TSE.2018.2868349, journal=IEEE Transactions on Software Engineering, author=Nguyen Quang Do, Lisa and Krüger, Stefan and Hill, Patrick and Ali, Karim and Bodden, Eric, year=2018, pages=1–1 

@articleBruns_Eichen_Gasteiger_2017, title=Mathematics-related Competence of Early Childhood Teachers Visiting a Continuous Professional Development Course: An Intervention Study, volume=19, number=3, journal=Mathematics Teacher Education and Development (MTED), author=Bruns, Julia and Eichen, Lars and Gasteiger, Hedwig, year=2017, pages=76–93 

@inproceedingsSprock_Sextro_2014, title=Time-efficient dynamic analysis of structures exhibiting nonlinear peak bending, DOI=10.1109/I2MTC.2014.6860760, booktitle=Instrumentation and Measurement Technology Conference (MTC) Proceedings, 2014 IEEE International, author=Sprock, Christian and Sextro, Walter, year=2014, pages=320–324 

@inproceedingsKrupp_Müller_2010, place=Dresden, title=A Systematic Approach to Combined HW/SW System Test, DOI=10.1109/DATE.2010.5457186, booktitle=Proceedings of DATE’10, publisher=IEEE, author=Krupp, Alexander and Müller, Wolfgang, year=2010 

@bookWoehrle_Plessl_Thiele_2009, place=Computer Engineering and Networks Lab, ETH Zurich, title=Rupeas: Ruby Powered Event Analysis DSL, author=Woehrle, Matthias and Plessl, Christian and Thiele, Lothar, year=2009 

@inproceedingsWoehrle_Plessl_Lim_Beutel_Thiele_2008, place=Los Alamitos, CA, USA, title=EvAnT: Analysis and Checking of event traces for Wireless Sensor Networks, DOI=10.1109/SUTC.2008.24, booktitle=IEEE Int. Conf. on Sensor Networks, Ubiquitous, and Trustworthy Computing (SUTC), publisher=IEEE Computer Society, author=Woehrle, Matthias and Plessl, Christian and Lim, Roman and Beutel, Jan and Thiele, Lothar, year=2008, pages=201–208 

@inproceedingsWoehrle_Plessl_Beutel_Thiele_2007, place=New York, NY, USA, title=Increasing the Reliability of Wireless Sensor Networks with a Distributed Testing Framework, DOI=10.1145/1278972.1278996, booktitle=Proc. Workshop on Embedded Networked Sensors (EmNets), publisher=ACM, author=Woehrle, Matthias and Plessl, Christian and Beutel, Jan and Thiele, Lothar, year=2007, pages=93–97 

@inproceedingsBeutel_Dyer_Lim_Plessl_Woehrle_Yuecel_Thiele_2007, place=Piscataway, NJ, USA, title=Automated Wireless Sensor Network Testing, DOI=10.1109/INSS.2007.4297445, booktitle=Proc. Int. Conf. Networked Sensing Systems (INSS), publisher=IEEE, author=Beutel, Jan and Dyer, Matthias and Lim, Roman and Plessl, Christian and Woehrle, Matthias and Yuecel, Mustafa and Thiele, Lothar, year=2007, pages=303–303 

@inproceedingsKrupp_Müller_2006, place=Munich, Germany, title=Classification Trees for Functional Coverage and Random Test Generation, DOI=10.1109/DATE.2006.243902, booktitle=Proceedings of the Design Automation &; Test in Europe Conference, publisher=IEEE, author=Krupp, Alexander and Müller, Wolfgang, year=2006 

@inproceedingsGroßmann_Müller_2006, place=Paphos, Cyprus, title=A Formal Behavioral Semantics for TestML, DOI=10.1109/ISoLA.2006.37, booktitle=Proc. of ISOLA 06, author=Großmann, Jürgen and Müller, Wolfgang, year=2006