Wu L, Scheytt JC. Analysis and Design of a Charge Sampler With 70-GHz 1-dB Bandwidth in 130-nm SiGe BiCMOS. IEEE Transactions on Circuits and Systems I: Regular Papers. 2021;68(9):3668-3681. doi:10.1109/tcsi.2021.3094428

Wu L. Ultrabreitbandige Sampler in SiGe-BiCMOS-Technologie Für Analog-Digital-Wandler Mit Zeitversetzter Abtastung. Vol 402.; 2021.

Wu L, Weizel M, Scheytt C. Above 60 GHz Bandwidth 10 GS/s Sampling Rate Track-and-Hold Amplifier in 130 nm SiGe BiCMOS Technology. In: 2020 IEEE International Symposium on Circuits and Systems (ISCAS). IEEE; 2020. doi:10.1109/ISCAS45731.2020.9180947

Wu L, Weizel M, Scheytt C. 70 GHz Large-signal Bandwidth Sampler Using Current-mode Integrate-and-Hold Circuit in 130 nm SiGe BiCMOS Technology. In: Asia-Pacific Microwave Conference (APMC). ; 2019. doi:10.1109/APMC46564.2019.9038239

Wu L, Weizel M, Scheytt C. A 70 GHz Small-signal Bandwidth 40 GS/s Track-and-Hold Amplifier in 130 nm SiGe BiCMOS Technology. In: 26th IEEE International Conference on Electronics Circuits and Systems (ICECS). ; 2019. doi:10.1109/ICECS46596.2019.8965046

Wu L, Hussain MK, Abughannam S, Müller W, Scheytt C, Ecker W. Analog fault simulation automation at schematic level with random sampling techniques. In: 2018 13th International Conference on Design &; Technology of Integrated Systems In Nanoscale Era (DTIS)) . IEEE; 2018. doi:10.1109/DTIS.2018.8368549

Scheytt C, Wu L. Integrier und HalteSchaltung . Published online 2018.

Wu L, Abughannam S, Müller W, Scheytt C, Ecker W. SPICE-Level Fault Injection with Likelihood Weighted Random Sampling - A Case Study. In: 2nd Workshop on Resiliency in Embedded Electronic Systems (REES). ; 2017:68.

Abughannam S, Wu L, Müller W, Scheytt C, Ecker W, Novello C. Fault Injection and Mixed-Level Simulation for Analog Circuits - A Case Study. In: Analog 2016 - VDE. ; 2016.

Müller W, Wu L, Scheytt C, Becker M, Schoenberg S. On the Correlation of HW Faults and SW Errors. In: Mueller-Gritschneder D, Müller W, Mitra S, eds. Proceedings of the 1st International Workshop on Resiliency in Embedded Electronic Systems (REES 2014). ; 2015.