Low-Power Low-Data-Rate Wireless PPM Receiver Based on 13-Bits Barker Coded SAW Correlator with Scalable Data-Rate and Sensitivity
S. Abughannam, J.C. Scheytt, in: International Symposium on Circuits and Systems (ISCAS 2022), IEEE Xplore, Austin, Texas, USA, 2022.

Design and Measurements of a Low-power Low-Date-rate Direct-detection Wireless Receiver with Improved Co-channel Interference Robustness
S. Abughannam, S. Kruse, M. Iftekhar, J.C. Scheytt, in: German Microwave Conference 2022 (GeMiC 2022), Ulm, Germany, 2022.

Sensitivity Analysis of a Low-Power Wake-Up Receiver Using an RF Barker Code SAW Correlator and a Baseband Narrowband Correlator
S. Abughannam, C. Scheytt, in: IEEE International Symposium on Personal, Indoor and Mobile Radio Communications (PIMRC 2020) , IEEE, Virtuelle Konferenz, 2020.

Design and Fabrication of Barker Coded Surface Acoustic Wave (SAW) Correlator at 2.45 GHz for Low-Power Wake-up Receivers
S. Ballandras, S. Abughannam, E. Courjon, C. Scheytt, in: GeMiC 2020 - German Microwave Conference, 2020.

Improving Co-Channel Interference Robustness In Direct Detection Receivers Using A Surface Acoustic Wave (SAW) Correlator 
S. Abughannam, S. Fard, C. Scheytt, in: Asia-Pacific Microwave Conference (APMC), 2019.

System Analysis of a Wake-Up Receiver Based on Surface Acoustic Wave Correlator
S. Abughannam, C. Scheytt, in: 2nd URSI AT-RASC, IEEE, Spain/Gran Canaria/Meloneras, 2018, pp. 1–4.

Analog fault simulation automation at schematic level with random sampling techniques
L. Wu, M.K. Hussain, S. Abughannam, W. Müller, C. Scheytt, W. Ecker, in: 2018 13th International Conference on Design &; Technology of Integrated Systems In Nanoscale Era (DTIS)) , IEEE, Italy/Taormina, 2018.

 Low-Power wake up receiver based on Surface Acoustic Wave Correlator
S. Abughannam, C. Scheytt, in: Kleinheubacher Tagung 2017, Miltenberg, Germany, 2017, p. 47.

SPICE-Level Fault Injection with Likelihood Weighted Random Sampling - A Case Study
L. Wu, S. Abughannam, W. Müller, C. Scheytt, W. Ecker, in: 2nd Workshop on Resiliency in Embedded Electronic Systems (REES), Lausanne, Switzerland, 2017, p. 68.

Fault Injection and Mixed-Level Simulation for Analog Circuits - A Case Study
S. Abughannam, L. Wu, W. Müller, C. Scheytt, W. Ecker, C. Novello, in: Analog 2016 - VDE, 2016.