@inproceedingsHellebrand_Sadeghi-Kohan_Wunderlich, title=Functional Safety and Reliability of Interconnects throughout the Silicon Life Cycle, booktitle=International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024, author=Hellebrand, Sybille and Sadeghi-Kohan, Somayeh and Wunderlich, Hans-Joachim, pages=1 
LibreCat: /record/52743

@bookStiballe_Reimer_Sadeghi-Kohan_Hellebrand_2024, place=Darmstadt, Germany, title=Modeling Crosstalk-induced Interconnect Delay with Polynomial Regression, publisher=37. ITG / GMM / GI -Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”  (TuZ’24), Feb. 2024, author=Stiballe, Alisa and Reimer, Jan Dennis and Sadeghi-Kohan, Somayeh and Hellebrand, Sybille, year=2024 
LibreCat: /record/50284

@bookUstimova_Sadeghi-Kohan_Hellebrand_2024, place=Darmstadt, Germany, title=Crosstalk-Aware Simulation of Interconnects Using Artificial Neural Networks, publisher=37. ITG / GMM / GI -Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”  (TuZ’24), Feb. 2024, author=Ustimova, Magdalina  and Sadeghi-Kohan, Somayeh and Hellebrand, Sybille, year=2024 
LibreCat: /record/51799

@bookGhazal_Sadeghi-Kohan_Reimer_Hellebrand_2023, place=Erfurt, Germany, title=On Cryptography Effects on Interconnect Reliability, publisher=35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023, author=Ghazal, Abdulkarim and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille, year=2023 
LibreCat: /record/35204

@inproceedingsBadran_Sadeghi-Kohan_Reimer_Hellebrand_2023, place=Venice, Italy, title=Approximate Computing: Balancing Performance, Power, Reliability, and Safety, booktitle=28th IEEE European Test Symposium (ETS’23), May 2023, author=Badran, Abdalrhman  and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille, year=2023 
LibreCat: /record/41875

@inproceedingsSadeghi-Kohan_Hellebrand_Wunderlich_2023, title=Low Power Streaming of Sensor Data Using Gray Code-Based Approximate Communication, DOI=10.1109/dsn-w58399.2023.00056, booktitle=2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W), publisher=IEEE, author=Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2023 
LibreCat: /record/46739
DOI: 10.1109/dsn-w58399.2023.00056

@inproceedingsSadeghi-Kohan_Reimer_Hellebrand_Wunderlich_2023, place=Beijing, China, title=Optimizing the Streaming of Sensor Data with Approximate Communication, booktitle=IEEE Asian Test Symposium (ATS’23), October 2023, author=Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2023 
LibreCat: /record/46738

@articleSadeghi-Kohan_Hellebrand_Wunderlich_2023, title=Workload-Aware Periodic Interconnect BIST, DOI=10.1109/mdat.2023.3298849, journal=IEEE Design &;Test, publisher=Institute of Electrical and Electronics Engineers (IEEE), author=Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2023, pages=1–1 
LibreCat: /record/46264
DOI: 10.1109/mdat.2023.3298849

@articleSadeghi-Kohan_Hellebrand_Wunderlich_2022, title=Stress-Aware Periodic Test of Interconnects, DOI=10.1007/s10836-021-05979-5, journal=Journal of Electronic Testing, publisher=Springer Science and Business Media LLC, author=Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2022 
LibreCat: /record/29351
DOI: 10.1007/s10836-021-05979-5

@bookSadeghi-Kohan_Hellebrand_Wunderlich_2022, place=Online, title=EM-Aware Interconnect BIST, publisher=European Workshop on Silicon Lifecycle Management, March 18, 2022, author=Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2022 
LibreCat: /record/29890

@inproceedingsSprenger_Sadeghi-Kohan_Reimer_Hellebrand_2020, place=Virtual Conference - Originally Frascati (Rome), Italy, title=Variation-Aware Test for Logic Interconnects using Neural Networks - A Case Study, booktitle=IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20), October 2020, author=Sprenger, Alexander and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille, year=2020 
LibreCat: /record/19422

@bookSadeghi-Kohan_Hellebrand_2020, place=Ludwigsburg, title=Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects, publisher=32. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’20), 16. - 18. Februar 2020, author=Sadeghi-Kohan, Somayeh and Hellebrand, Sybille, year=2020 
LibreCat: /record/15419

@inproceedingsSadeghi-Kohan_Hellebrand_2020, place=Virtual Conference - Originally San Diego, CA, USA, title=Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects, DOI=10.1109/vts48691.2020.9107591, booktitle=38th IEEE VLSI Test Symposium (VTS), publisher=IEEE, author=Sadeghi-Kohan, Somayeh and Hellebrand, Sybille, year=2020 
LibreCat: /record/29200
DOI: 10.1109/vts48691.2020.9107591

@inproceedingsRezaeizadeh Rookerd_Sadeghi-Kohan_Navabi_2018, title=Performance and Energy Enhancement through an Online Single/Multi Level Mode Switching Cache Architecture, DOI=10.1145/3194554.3194599, booktitle=Proceedings of the 2018 on Great Lakes Symposium on VLSI, publisher=ACM, author=Rezaeizadeh Rookerd, Ramin and Sadeghi-Kohan, Somayeh and Navabi, Zainalabedin, year=2018 
LibreCat: /record/29460
DOI: 10.1145/3194554.3194599

@inproceedingsSadeghi-Kohan_Vafaei_Navabi_2018, title=Near-Optimal Node Selection Procedure for Aging Monitor Placement, DOI=10.1109/iolts.2018.8474120, booktitle=2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS), publisher=IEEE, author=Sadeghi-Kohan, Somayeh and Vafaei, Arash and Navabi, Zainalabedin, year=2018 
LibreCat: /record/29459
DOI: 10.1109/iolts.2018.8474120

@articleSadeghi-Kohan_Kamal_Navabi_2017, title=Self-Adjusting Monitor for Measuring Aging Rate and Advancement, volume=8, DOI=10.1109/tetc.2017.2771441, number=3, journal=IEEE Transactions on Emerging Topics in Computing, publisher=Institute of Electrical and Electronics Engineers (IEEE), author=Sadeghi-Kohan, Somayeh and Kamal, Mehdi and Navabi, Zainalabedin, year=2017, pages=627–641 
LibreCat: /record/29462
DOI: 10.1109/tetc.2017.2771441

@inproceedingsJenihhin_Kamkin_Navabi_Sadeghi-Kohan_2017, title=Universal mitigation of NBTI-induced aging by design randomization, DOI=10.1109/ewdts.2016.7807635, booktitle=2016 IEEE East-West Design &; Test Symposium (EWDTS), publisher=IEEE, author=Jenihhin, Maksim and Kamkin, Alexander and Navabi, Zainalabedin and Sadeghi-Kohan, Somayeh, year=2017 
LibreCat: /record/29463
DOI: 10.1109/ewdts.2016.7807635

@inproceedingsSadeghi-Kohan_Kamran_Forooghifar_Navabi_2015, title=Aging in digital circuits and age monitoring: Object-oriented modeling and evaluation, DOI=10.1109/dtis.2015.7127373, booktitle=2015 10th International Conference on Design &; Technology of Integrated Systems in Nanoscale Era (DTIS), publisher=IEEE, author=Sadeghi-Kohan, Somayeh and Kamran, Arezoo and Forooghifar, Farnaz and Navabi, Zainalabedin, year=2015 
LibreCat: /record/29465
DOI: 10.1109/dtis.2015.7127373

@inproceedingsSadeghi-Kohan_Kamal_McNeil_Prinetto_Navabi_2015, title=Online self adjusting progressive age monitoring of timing variations, DOI=10.1109/dtis.2015.7127368, booktitle=2015 10th International Conference on Design &; Technology of Integrated Systems in Nanoscale Era (DTIS), publisher=IEEE, author=Sadeghi-Kohan, Somayeh and Kamal, Mehdi and McNeil, John and Prinetto, Paolo and Navabi, Zain, year=2015 
LibreCat: /record/29466
DOI: 10.1109/dtis.2015.7127368

@articleAlizadeh_Behnam_Sadeghi-Kohan_2014, title=A Scalable Formal Debugging Approach with Auto-Correction Capability based on Static Slicing and Dynamic Ranking for RTL Datapath Designs, DOI=10.1109/tc.2014.2329687, journal=IEEE Transactions on Computers, publisher=Institute of Electrical and Electronics Engineers (IEEE), author=Alizadeh, Bijan and Behnam, Payman and Sadeghi-Kohan, Somayeh, year=2014, pages=1–1 
LibreCat: /record/46266
DOI: 10.1109/tc.2014.2329687