Are Neural Bug Detectors Comparable to Software Developers on Variable Misuse Bugs?
C. Richter, J.F. Haltermann, M.-C. Jakobs, F. Pauck, S. Schott, H. Wehrheim, in: 37th IEEE/ACM International Conference on Automated Software Engineering, ACM, 2023.
LibreCat: /record/35426
DOI: 10.1145/3551349.3561156

Scaling Arbitrary Android App Analyses
F. Pauck, in: 37th IEEE/ACM International Conference on Automated Software Engineering, ACM, 2023.
LibreCat: /record/35427
DOI: 10.1145/3551349.3561339

MAAS: Hiding Trojans in Approximate Circuits
Q.A. Ahmed, M. Awais, M. Platzner, in: The 24th International Symposium on Quality Electronic Design (ISQED’23), San Francisco, Califorina USA, 2023.
LibreCat: /record/44194

Verifying Software and Reconfigurable Hardware Services
H. Wehrheim, M. Platzner, E. Bodden, P. Schubert, F. Pauck, M.-C. Jakobs, in: C.-J. Haake, F. Meyer auf der Heide, M. Platzner, H. Wachsmuth, H. Wehrheim (Eds.), On-The-Fly Computing -- Individualized IT-Services in Dynamic Markets, Heinz Nixdorf Institut, Universität Paderborn, Paderborn, 2023, pp. 125–144.
LibreCat: /record/45888
DOI: 10.5281/zenodo.8068583

On-The-Fly Computing -- Individualized IT-services in dynamic markets
C.-J. Haake, F. Meyer auf der Heide, M. Platzner, H. Wachsmuth, H. Wehrheim, On-The-Fly Computing -- Individualized IT-Services in Dynamic Markets, Heinz Nixdorf Institut, Universität Paderborn, Paderborn, 2023.
LibreCat: /record/45863
DOI: 10.17619/UNIPB/1-1797

Search Space Characterization for Approximate Logic Synthesis 
L.M. Witschen, T. Wiersema, L.D. Reuter, M. Platzner, in: 2022 59th ACM/IEEE Design Automation Conference (DAC), n.d.
LibreCat: /record/29945

MUSCAT: MUS-based Circuit Approximation Technique
L.M. Witschen, T. Wiersema, M. Artmann, M. Platzner, in: Design, Automation and Test in Europe (DATE), n.d.
LibreCat: /record/29865

Static data-flow analysis for software product lines in C
P. Schubert, P. Gazzillo, Z. Patterson, J. Braha, F. Schiebel, B. Hermann, S. Wei, E. Bodden, Automated Software Engineering 29 (2022).
LibreCat: /record/30511
DOI: 10.1007/s10515-022-00333-1

Learning Realistic Mutations: Bug Creation for Neural Bug Detectors
C. Richter, H. Wehrheim, in: 2022 IEEE Conference on Software Testing, Verification and Validation (ICST), 2022, pp. 162–173.
LibreCat: /record/32590
DOI: 10.1109/ICST53961.2022.00027

TSSB-3M: Mining single statement bugs at massive scale
C. Richter, H. Wehrheim, in: 2022 IEEE/ACM 19th International Conference on Mining Software Repositories (MSR), 2022, pp. 418–422.
LibreCat: /record/32591
DOI: 10.1145/3524842.3528505