Fuchs, Christian. Concepts of Social Self-Organisation. INTAS-Project “Human Strategies in Complexity“-Research Report. Vienna University of Technology, 2002.
LibreCat: /record/42744

Fuchs, Christian, and Annette Schlemm. The Self-Organisation of Society. INTAS-Project “Human Strategies in Complexity“-Research Paper. Vienna University of Technology, 2002.
LibreCat: /record/42741

Hilleringmann, Ulrich, and K. Goser. “Optoelectronic System Integration on Silicon: Waveguides, Photodetectors, and VLSI CMOS Circuits on One Chip.”10.1109/16.381978__IEEE Transactions on Electron Devices, vol. 42, no. 5, Institute of Electrical and Electronics Engineers (IEEE), 2002, pp. 841–46, doi:10.1109/16.381978.
LibreCat: /record/39904
DOI: 10.1109/16.381978

Schönstein, I., et al. “Characterization of Submicron NMOS Devices Due to Visible Light Emission.”10.1016/0167-9317(93)90092-j__Microelectronic Engineering, vol. 21, no. 1–4, Elsevier BV, 2002, pp. 363–66, doi:10.1016/0167-9317(93)90092-j.
LibreCat: /record/39912
DOI: 10.1016/0167-9317(93)90092-j

Hilleringmann, Ulrich, and K. Goser. “Results of Monolithic Integration of Optical Waveguides, Photodiodes and CMOS Circuits on Silicon.”10.1016/0167-9317(92)90425-q__Microelectronic Engineering, vol. 19, no. 1–4, Elsevier BV, 2002, pp. 211–14, doi:10.1016/0167-9317(92)90425-q.
LibreCat: /record/39914
DOI: 10.1016/0167-9317(92)90425-q

Brass, E., et al. “System Integration of Optical Devices and Analog CMOS Amplifiers.”10.1109/4.297714__IEEE Journal of Solid-State Circuits, vol. 29, no. 8, Institute of Electrical and Electronics Engineers (IEEE), 2002, pp. 1006–10, doi:10.1109/4.297714.
LibreCat: /record/39906
DOI: 10.1109/4.297714

Brass, E., et al. “System Integration of Optical Devices and Analog CMOS Amplifiers.”10.1109/4.297714__IEEE Journal of Solid-State Circuits, vol. 29, no. 8, Institute of Electrical and Electronics Engineers (IEEE), 2002, pp. 1006–10, doi:10.1109/4.297714.
LibreCat: /record/39907
DOI: 10.1109/4.297714

Horstmann, J. T., et al. “Characterisation of Sub-100 Nm-MOS-Transistors Processed by Optical Lithography and a Sidewall-Etchback Technique.”10.1016/0167-9317(95)00280-4__Microelectronic Engineering, vol. 30, no. 1–4, Elsevier BV, 2002, pp. 431–34, doi:10.1016/0167-9317(95)00280-4.
LibreCat: /record/39899
DOI: 10.1016/0167-9317(95)00280-4

Goser, K., et al. “VLSI Technologies for Artificial Neural Networks.”10.1109/40.42985__IEEE Micro, vol. 9, no. 6, Institute of Electrical and Electronics Engineers (IEEE), 2002, pp. 28–44, doi:10.1109/40.42985.
LibreCat: /record/39925
DOI: 10.1109/40.42985

Mankowski, V., et al. “A Novel Insulation Technique for Smart Power Switching Devices and Very High Voltage ICs above 10 KV.”10.1016/s0167-9317(00)00370-1__Microelectronic Engineering, vol. 53, no. 1–4, Elsevier BV, 2002, pp. 525–28, doi:10.1016/s0167-9317(00)00370-1.
LibreCat: /record/39882
DOI: 10.1016/s0167-9317(00)00370-1

Horstmann, J. T., et al. “/f-Noise of Sub-100 Nm-MOS-Transistors Fabricated by a Special Deposition and Etchback Technique.”10.1016/s0167-9317(00)00299-9__Microelectronic Engineering, vol. 53, no. 1–4, Elsevier BV, 2002, pp. 213–16, doi:10.1016/s0167-9317(00)00299-9.
LibreCat: /record/39879
DOI: 10.1016/s0167-9317(00)00299-9

Horstmann, J. T., et al. “Noise Analysis of Sub-100 Nm-MOS-Transistors Fabricated by a Special Deposition and Etchback Technique.”10.1109/iecon.2000.972560__2000 26th Annual Conference of the IEEE Industrial Electronics Society. IECON 2000. 2000 IEEE International Conference on Industrial Electronics, Control and Instrumentation. 21st Century Technologies and Industrial Opportunities (Cat. No.001), IEEE, 2002, doi:10.1109/iecon.2000.972560.
LibreCat: /record/39880
DOI: 10.1109/iecon.2000.972560

Horstmann, J. T., et al. “Noise Analysis of Sub-100 Nm-MOS-Transistors Fabricated by a Special Deposition and Etchback Technique.”10.1109/iecon.2000.972560__2000 26th Annual Conference of the IEEE Industrial Electronics Society. IECON 2000. 2000 IEEE International Conference on Industrial Electronics, Control and Instrumentation. 21st Century Technologies and Industrial Opportunities (Cat. No.001), IEEE, 2002, doi:10.1109/iecon.2000.972560.
LibreCat: /record/39881
DOI: 10.1109/iecon.2000.972560

Hilleringmann, Ulrich, et al. “A Silicon Based Technology for Monolithic Integration of Waveguides and VLSI CMOS Circuits.”10.1016/0167-9317(91)90231-2__Microelectronic Engineering, vol. 15, no. 1–4, Elsevier BV, 2002, pp. 289–92, doi:10.1016/0167-9317(91)90231-2.
LibreCat: /record/39919
DOI: 10.1016/0167-9317(91)90231-2

Goser, K., et al. “VLSI Technologies for Artificial Neural Networks.”10.1109/40.42985__IEEE Micro, vol. 9, no. 6, Institute of Electrical and Electronics Engineers (IEEE), 2002, pp. 28–44, doi:10.1109/40.42985.
LibreCat: /record/39926
DOI: 10.1109/40.42985

Blum, F., et al. “Nuclear Radiation Detectors on Various Type Diamonds.”10.1109/iecon.1998.724097__IECON ’98. Proceedings of the 24th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.980), IEEE, 2002, doi:10.1109/iecon.1998.724097.
LibreCat: /record/39892
DOI: 10.1109/iecon.1998.724097

Meier, Torsten, et al. “Interacting Electrons in a One-Dimensional Random Array of Scatterers: A Quantum Dynamics and Monte Carlo Study.”10.1103/PhysRevB.65.165124__Physical Review B, vol. 65, no. 16, 165124, American Physical Society, 2002, doi:10.1103/PhysRevB.65.165124.
LibreCat: /record/43294
DOI: 10.1103/PhysRevB.65.165124

Meier, Torsten, et al. “Excitation Induced Shift and Broadening of the Exciton Resonance.”10.1016/S0921-4526(01)01400-4__Physica B: Condensed Matter, vol. 314, no. 1–4, North-Holland, 2002, pp. 309–13, doi:10.1016/S0921-4526(01)01400-4.
LibreCat: /record/43295
DOI: 10.1016/S0921-4526(01)01400-4

Meier, Torsten, and S. W. Koch. “Particles Get All Dressed Up.”10.1088/2058-7058/15/2/36__Physics World, vol. 15, no. 2, IOP Publishing, 2002, pp. 24–25, doi:10.1088/2058-7058/15/2/36.
LibreCat: /record/43292
DOI: 10.1088/2058-7058/15/2/36

Meier, Torsten, et al. “Optically Induced Coherent Intraband Dynamics in Disordered Semiconductors.”10.1103/PhysRevB.65.085306__Physical Review B, vol. 65, no. 8, 085306, American Physical Society, 2002, doi:10.1103/PhysRevB.65.085306.
LibreCat: /record/43291
DOI: 10.1103/PhysRevB.65.085306