Fuchs, Christian. “Die Bedeutung der Fortschrittsbegriffe von Marcuse und Bloch im informationsgesellschaftlichen Kapitalismus (The implications of Marcuse’s and Bloch’s notions of progress in informational capitalism).” Utopie Kreativ 141/142, 2002, 724–36.

Fuchs, Christian. Concepts of Social Self-Organisation. INTAS-Project “Human Strategies in Complexity“-Research Report. Vienna: Vienna University of Technology, 2002.

Fuchs, Christian, and Annette Schlemm. The Self-Organisation of Society. INTAS-Project “Human Strategies in Complexity“-Research Paper. Vienna: Vienna University of Technology, 2002.

Hilleringmann, Ulrich, and K. Goser. “Optoelectronic System Integration on Silicon: Waveguides, Photodetectors, and VLSI CMOS Circuits on One Chip.”https://doi.org/10.1109/16.381978__IEEE Transactions on Electron Devices 42, no. 5 (2002): 841–46.https://doi.org/10.1109/16.381978 .

Schönstein, I., J. Müller, Ulrich Hilleringmann, and K. Goser. “Characterization of Submicron NMOS Devices Due to Visible Light Emission.”https://doi.org/10.1016/0167-9317(93)90092-j__Microelectronic Engineering 21, no. 1–4 (2002): 363–66.https://doi.org/10.1016/0167-9317(93)90092-j .

Hilleringmann, Ulrich, and K. Goser. “Results of Monolithic Integration of Optical Waveguides, Photodiodes and CMOS Circuits on Silicon.”https://doi.org/10.1016/0167-9317(92)90425-q__Microelectronic Engineering 19, no. 1–4 (2002): 211–14.https://doi.org/10.1016/0167-9317(92)90425-q .

Brass, E., Ulrich Hilleringmann, and K. Schumacher. “System Integration of Optical Devices and Analog CMOS Amplifiers.”https://doi.org/10.1109/4.297714__IEEE Journal of Solid-State Circuits 29, no. 8 (2002): 1006–10.https://doi.org/10.1109/4.297714 .

Brass, E., Ulrich Hilleringmann, and K. Schumacher. “System Integration of Optical Devices and Analog CMOS Amplifiers.”https://doi.org/10.1109/4.297714__IEEE Journal of Solid-State Circuits 29, no. 8 (2002): 1006–10.https://doi.org/10.1109/4.297714 .

Horstmann, J.T., Ulrich Hilleringmann, and K. Goser. “Characterisation of Sub-100 Nm-MOS-Transistors Processed by Optical Lithography and a Sidewall-Etchback Technique.”https://doi.org/10.1016/0167-9317(95)00280-4__Microelectronic Engineering 30, no. 1–4 (2002): 431–34.https://doi.org/10.1016/0167-9317(95)00280-4 .

Goser, K., Ulrich Hilleringmann, U. Rueckert, and K. Schumacher. “VLSI Technologies for Artificial Neural Networks.”https://doi.org/10.1109/40.42985__IEEE Micro 9, no. 6 (2002): 28–44.https://doi.org/10.1109/40.42985 .

Mankowski, V., Ulrich Hilleringmann, and K. Schumacher. “A Novel Insulation Technique for Smart Power Switching Devices and Very High Voltage ICs above 10 KV.”https://doi.org/10.1016/s0167-9317(00)00370-1__Microelectronic Engineering 53, no. 1–4 (2002): 525–28.https://doi.org/10.1016/s0167-9317(00)00370-1 .

Horstmann, J.T., Ulrich Hilleringmann, and K. Goser. “/f-Noise of Sub-100 Nm-MOS-Transistors Fabricated by a Special Deposition and Etchback Technique.”https://doi.org/10.1016/s0167-9317(00)00299-9__Microelectronic Engineering 53, no. 1–4 (2002): 213–16.https://doi.org/10.1016/s0167-9317(00)00299-9 .

Horstmann, J.T., Ulrich Hilleringmann, and K. Goser. “Noise Analysis of Sub-100 Nm-MOS-Transistors Fabricated by a Special Deposition and Etchback Technique.”https://doi.org/10.1109/iecon.2000.972560__In 2000 26th Annual Conference of the IEEE Industrial Electronics Society. IECON 2000. 2000 IEEE International Conference on Industrial Electronics, Control and Instrumentation. 21st Century Technologies and Industrial Opportunities (Cat. No.001). IEEE, 2002.https://doi.org/10.1109/iecon.2000.972560 .

Horstmann, J.T., Ulrich Hilleringmann, and K. Goser. “Noise Analysis of Sub-100 Nm-MOS-Transistors Fabricated by a Special Deposition and Etchback Technique.”https://doi.org/10.1109/iecon.2000.972560__In 2000 26th Annual Conference of the IEEE Industrial Electronics Society. IECON 2000. 2000 IEEE International Conference on Industrial Electronics, Control and Instrumentation. 21st Century Technologies and Industrial Opportunities (Cat. No.001). IEEE, 2002.https://doi.org/10.1109/iecon.2000.972560 .

Hilleringmann, Ulrich, K. Knospe, C. Heite, K. Schumacher, and K. Goser. “A Silicon Based Technology for Monolithic Integration of Waveguides and VLSI CMOS Circuits.”https://doi.org/10.1016/0167-9317(91)90231-2__Microelectronic Engineering 15, no. 1–4 (2002): 289–92.https://doi.org/10.1016/0167-9317(91)90231-2 .

Goser, K., Ulrich Hilleringmann, U. Rueckert, and K. Schumacher. “VLSI Technologies for Artificial Neural Networks.”https://doi.org/10.1109/40.42985__IEEE Micro 9, no. 6 (2002): 28–44.https://doi.org/10.1109/40.42985 .

Blum, F., A. Denisenko, R. Job, D. Borchert, W. Weber, J.V. Borany, Ulrich Hilleringmann, and W.R. Fahrner. “Nuclear Radiation Detectors on Various Type Diamonds.”https://doi.org/10.1109/iecon.1998.724097__In IECON ’98. Proceedings of the 24th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.980). IEEE, 2002.https://doi.org/10.1109/iecon.1998.724097 .

Meier, Torsten, V. Filinov, P. Thomas, I. Varga, M. Bonitz, V. Fortov, and S.W. Koch. “Interacting Electrons in a One-Dimensional Random Array of Scatterers: A Quantum Dynamics and Monte Carlo Study.”https://doi.org/10.1103/PhysRevB.65.165124__Physical Review B 65, no. 16 (2002).https://doi.org/10.1103/PhysRevB.65.165124 .

Meier, Torsten, S. Wachter, M. Maute, H. Kalt, I. Galbraith, C. Sieh, and S.W. Koch. “Excitation Induced Shift and Broadening of the Exciton Resonance.”https://doi.org/10.1016/S0921-4526(01)01400-4__Physica B: Condensed Matter 314, no. 1–4 (2002): 309–13.https://doi.org/10.1016/S0921-4526(01)01400-4 .

Meier, Torsten, and S.W. Koch. “Particles Get All Dressed Up.”https://doi.org/10.1088/2058-7058/15/2/36__Physics World 15, no. 2 (2002): 24–25.https://doi.org/10.1088/2058-7058/15/2/36 .