@article{17382,
  author       = {{Rengaraj, Varadarajan and Lass, Michael and Plessl, Christian and Kühne, Thomas D.}},
  issn         = {{2079-3197}},
  journal      = {{Computation}},
  number       = {{2}},
  pages        = {{39}},
  publisher    = {{MDPI AG}},
  title        = {{{Accurate Sampling with Noisy Forces from Approximate Computing}}},
  doi          = {{10.3390/computation8020039}},
  volume       = {{8}},
  year         = {{2020}},
}

@article{17384,
  author       = {{Elgabarty, Hossam and Kühne, Thomas D.}},
  journal      = {{Phys. Chem. Chem. Phys.}},
  pages        = {{10397--10411}},
  publisher    = {{The Royal Society of Chemistry}},
  title        = {{{Tumbling with a limp: local asymmetry in water's hydrogen bond network and its consequences}}},
  doi          = {{10.1039/C9CP06960G}},
  volume       = {{22}},
  year         = {{2020}},
}

@article{17386,
  author       = {{Kühne, Thomas D. and Iannuzzi, Marcella and Del Ben, Mauro and Rybkin, Vladimir V. and Seewald, Patrick and Stein, Frederick and Laino, Teodoro and Khaliullin, Rustam Z. and Schütt, Ole and Schiffmann, Florian and al., et}},
  issn         = {{1089-7690}},
  journal      = {{The Journal of Chemical Physics}},
  number       = {{19}},
  pages        = {{194103}},
  publisher    = {{AIP Publishing}},
  title        = {{{CP2K: An electronic structure and molecular dynamics software package - Quickstep: Efficient and accurate electronic structure calculations}}},
  doi          = {{10.1063/5.0007045}},
  volume       = {{152}},
  year         = {{2020}},
}

@article{17433,
  author       = {{Wang, D. Q. and Reuter, Dirk and Wieck, A. D. and Hamilton, A. R. and Klochan, O.}},
  issn         = {{0003-6951}},
  journal      = {{Applied Physics Letters}},
  title        = {{{Two-dimensional lateral surface superlattices in GaAs heterostructures with independent control of carrier density and modulation potential}}},
  doi          = {{10.1063/5.0009462}},
  year         = {{2020}},
}

@article{17435,
  author       = {{Geier, M. and Freudenfeld, J. and Silva, J. T. and Umansky, V. and Reuter, Dirk and Wieck, A. D. and Brouwer, P. W. and Ludwig, S.}},
  issn         = {{2469-9950}},
  journal      = {{Physical Review B}},
  title        = {{{Electrostatic potential shape of gate-defined quantum point contacts}}},
  doi          = {{10.1103/physrevb.101.165429}},
  year         = {{2020}},
}

@article{17436,
  abstract     = {{<jats:p>The study of electron transport in low-dimensional systems is of importance, not only from a fundamental point of view, but also for future electronic and spintronic devices. In this context heterostructures containing a two-dimensional electron gas (2DEG) are a key technology. In particular GaAs/AlGaAs heterostructures, with a 2DEG at typically 100 nm below the surface, are widely studied. In order to explore electron transport in such systems, low-resistance ohmic contacts are required that connect the 2DEG to macroscopic measurement leads at the surface. Here we report on designing and measuring a dedicated device for unraveling the various resistance contributions in such contacts, which include pristine 2DEG series resistance, the 2DEG resistance under a contact, the contact resistance itself, and the influence of pressing a bonding wire onto a contact. We also report here a recipe for contacts with very low resistance values that remain below 10 Ω for annealing times between 20 and 350 s, hence providing the flexibility to use this method for materials with different 2DEG depths. The type of heating, temperature ramp rate and gas forming used for annealing is found to strongly influence the annealing process and hence the quality of the resulting contacts.</jats:p>}},
  author       = {{Javaid Iqbal, Muhammad and Reuter, Dirk and Wieck, Andreas Dirk and van der Wal, Caspar}},
  issn         = {{1286-0042}},
  journal      = {{The European Physical Journal Applied Physics}},
  title        = {{{Characterization of low-resistance ohmic contacts to a two-dimensional electron gas in a GaAs/AlGaAs heterostructure}}},
  doi          = {{10.1051/epjap/2020190202}},
  year         = {{2020}},
}

@article{17437,
  author       = {{Ebler, C. and Labud, P. A. and Rai, A. K. and Reuter, Dirk and Wieck, A. D. and Ludwig, A.}},
  issn         = {{2469-9950}},
  journal      = {{Physical Review B}},
  title        = {{{Electrical detection of excitonic states by time-resolved conductance measurements}}},
  doi          = {{10.1103/physrevb.101.125303}},
  year         = {{2020}},
}

@proceedings{17836,
  editor       = {{Werneck Richa, Andrea and Scheideler, Christian}},
  isbn         = {{978-3-030-54920-6}},
  publisher    = {{Springer}},
  title        = {{{Structural Information and Communication Complexity - 27th International Colloquium, SIROCCO 2020, Paderborn, Germany, June 29 - July 1, 2020, Proceedings}}},
  doi          = {{10.1007/978-3-030-54921-3}},
  volume       = {{12156}},
  year         = {{2020}},
}

@proceedings{17839,
  editor       = {{Scheideler, Christian and Spear, Michael}},
  isbn         = {{978-1-4503-6935-0}},
  publisher    = {{ACM}},
  title        = {{{SPAA '20: 32nd ACM Symposium on Parallelism in Algorithms and Architectures, Virtual Event, USA, July 15-17, 2020}}},
  doi          = {{10.1145/3350755}},
  year         = {{2020}},
}

@inbook{18779,
  author       = {{Seng, Eva- Maria and Silvestri, Marco}},
  booktitle    = {{LE CHANTIER CATHÉDRAL EN EUROPE diffusion et sauvegarde des savoirs, savoir-faire et matériaux du Moyen Âge à nos jours}},
  editor       = {{Chave, Isabelle}},
  publisher    = {{(im Druck)}},
  title        = {{{Die Wiedereinrichtung der Bauhütten in Europa im 19. und 20. Jahrhundert}}},
  year         = {{2020}},
}

@inbook{18789,
  author       = {{Nickchen, Tobias and Engels, Gregor and Lohn, Johannes}},
  booktitle    = {{Industrializing Additive Manufacturing}},
  isbn         = {{9783030543334}},
  title        = {{{Opportunities of 3D Machine Learning for Manufacturability Analysis and Component Recognition in the Additive Manufacturing Process Chain}}},
  doi          = {{10.1007/978-3-030-54334-1_4}},
  year         = {{2020}},
}

@inproceedings{19178,
  author       = {{Kowatz, Jannik and Teutenberg, Dominik and Meschut, Gerson}},
  booktitle    = {{20. Kolloquium Gemeinsame Forschung in der Klebtechnik}},
  location     = {{Würzburg}},
  title        = {{{Auslegungsmethode für zyklisch beanspruchte Stahl/CFK-Klebverbindungen unter besonderer Berücksichtigung des Rissfortschritts}}},
  year         = {{2020}},
}

@article{23515,
  author       = {{Gräßler, Iris and Bettenhausen, Kurt D. and Bilgic, Attila M. and Dirzus, Dagmar}},
  journal      = {{at-Automatisierungstechnik 68(6)}},
  number       = {{68 (6)}},
  pages        = {{500--507}},
  title        = {{{Which future do we want? It's up to us! - 4 future scenarios for automation 2030}}},
  year         = {{2020}},
}

@inbook{23522,
  author       = {{Gräßler, Iris and Scholle, Philipp and Thiele, Henrik}},
  booktitle    = {{Integrated Design Engineering. Interdisciplinary and Holistic Product Development}},
  editor       = {{Sandor, Vajna}},
  isbn         = {{978-3-030-19356-0}},
  pages        = {{507--529}},
  publisher    = {{Springer International Publishing Switzerland}},
  title        = {{{Scenario Technique}}},
  doi          = {{10.1007/978-3-030-19357-7}},
  year         = {{2020}},
}

@article{23599,
  abstract     = {{<jats:p>Grazing-incidence wide-angle X-ray scattering (GIWAXS) has become an increasingly popular technique for quantitative structural characterization and comparison of thin films. For this purpose, accurate intensity normalization and peak position determination are crucial. At present, few tools exist to estimate the uncertainties of these measurements. Here, a simulation package is introduced called <jats:italic>GIWAXS-SIIRkit</jats:italic>, where SIIR stands for scattering intensity, indexing and refraction. The package contains several tools that are freely available for download and can be executed in MATLAB. The package includes three functionalities: estimation of the relative scattering intensity and the corresponding uncertainty based on experimental setup and sample dimensions; extraction and indexing of peak positions to approximate the crystal structure of organic materials starting from calibrated GIWAXS patterns; and analysis of the effects of refraction on peak positions. Each tool is based on a graphical user interface and designed to have a short learning curve. A user guide is provided with detailed usage instruction, tips for adding functionality and customization, and exemplary files.</jats:p>}},
  author       = {{Savikhin, Victoria and Steinrück, Hans-Georg and Liang, Ru-Ze and Collins, Brian A. and Oosterhout, Stefan D. and Beaujuge, Pierre M. and Toney, Michael F.}},
  issn         = {{1600-5767}},
  journal      = {{Journal of Applied Crystallography}},
  pages        = {{1108--1129}},
  title        = {{{GIWAXS-SIIRkit: scattering intensity, indexing and refraction calculation toolkit for grazing-incidence wide-angle X-ray scattering of organic materials}}},
  doi          = {{10.1107/s1600576720005476}},
  volume       = {{53}},
  year         = {{2020}},
}

@article{23605,
  author       = {{Paulsen, Bryan D. and Wu, Ruiheng and Takacs, Christopher J. and Steinrück, Hans-Georg and Strzalka, Joseph and Zhang, Qingteng and Toney, Michael F. and Rivnay, Jonathan}},
  issn         = {{0935-9648}},
  journal      = {{Advanced Materials}},
  pages        = {{2003404}},
  title        = {{{Time‐Resolved Structural Kinetics of an Organic Mixed Ionic–Electronic Conductor}}},
  doi          = {{10.1002/adma.202003404}},
  volume       = {{32}},
  year         = {{2020}},
}

@article{23781,
  author       = {{Patil, Mayurkumar P. and Vaidya, Prakash D. and Kenig, Eugeny}},
  issn         = {{2470-1343}},
  journal      = {{ACS Omega}},
  pages        = {{27043--27049}},
  title        = {{{Kinetics of Carbon Dioxide Removal Using N-Acetylglucosamine}}},
  doi          = {{10.1021/acsomega.0c02076}},
  volume       = {{5}},
  year         = {{2020}},
}

@inproceedings{24011,
  author       = {{Joy, Tintu David and Kullmer, Gunter and Risse, Lena}},
  location     = {{Hamburg}},
  pages        = {{207--216}},
  title        = {{{Vorhersage der Rissinitiierung in 3D-Strukturen mit ADAPCRACK3D}}},
  volume       = {{DVM-Bericht 252}},
  year         = {{2020}},
}

@inproceedings{20321,
  author       = {{Göddecke, Johannes and Meschut, Gerson and Teutenberg, Dominik and Ummenhofer, Thomas and Albiez, Matthias and Damm, Jannis and Matzenmiller, Anton and Kötz, Fabian}},
  booktitle    = {{20. Kolloquium Gemeinsame Forschung in der Klebtechnik}},
  title        = {{{Experimentelle und numerische Untersuchung der Dämpfungseigenschaften geklebter Strukturen unter dynamischer Beanspruchung}}},
  year         = {{2020}},
}

@inproceedings{20331,
  author       = {{Ditz, Michael and Meschut, Gerson and Schwarze, Thomas and Smart, Dominic}},
  location     = {{Würzburg}},
  title        = {{{Entwicklung und Qualifizierung einer rechnergestützten Auswertemethode zur Differenzierung der Versagensanteile klebtechnisch gefügter Proben}}},
  year         = {{2020}},
}