[{"language":[{"iso":"eng"}],"_id":"7334","publisher":"SPIE","user_id":"42514","doi":"10.1117/12.907821","author":[{"first_name":"Henning","last_name":"Höpfner","full_name":"Höpfner, Henning"},{"last_name":"Li","first_name":"Mingyuan","full_name":"Li, Mingyuan"},{"full_name":"Ludwig, Arne","last_name":"Ludwig","first_name":"Arne"},{"last_name":"Ludwig","first_name":"Astrid","full_name":"Ludwig, Astrid"},{"full_name":"Stromberg, Frank","last_name":"Stromberg","first_name":"Frank"},{"full_name":"Wende, Heiko","last_name":"Wende","first_name":"Heiko"},{"first_name":"Werner","last_name":"Keune","full_name":"Keune, Werner"},{"id":"37763","full_name":"Reuter, Dirk","first_name":"Dirk","last_name":"Reuter"},{"first_name":"Andreas D.","last_name":"Wieck","full_name":"Wieck, Andreas D."},{"last_name":"Gerhardt","first_name":"Nils C.","full_name":"Gerhardt, Nils C."},{"full_name":"Hofmann, Martin R.","first_name":"Martin R.","last_name":"Hofmann"}],"title":"Room temperature spin relaxation in quantum dot based spin-optoelectronic devices","year":"2012","status":"public","publication_status":"published","date_updated":"2022-01-06T07:03:35Z","date_created":"2019-01-31T11:17:59Z","department":[{"_id":"15"},{"_id":"230"}],"type":"conference","citation":{"apa":"Höpfner, H., Li, M., Ludwig, A., Ludwig, A., Stromberg, F., Wende, H., … Hofmann, M. R. (2012). Room temperature spin relaxation in quantum dot based spin-optoelectronic devices. In <i>Ultrafast Phenomena and Nanophotonics XVI</i>. SPIE. <a href=\"https://doi.org/10.1117/12.907821\">https://doi.org/10.1117/12.907821</a>","mla":"Höpfner, Henning, et al. “Room Temperature Spin Relaxation in Quantum Dot Based Spin-Optoelectronic Devices.” <i>Ultrafast Phenomena and Nanophotonics XVI</i>, SPIE, 2012, doi:<a href=\"https://doi.org/10.1117/12.907821\">10.1117/12.907821</a>.","ieee":"H. Höpfner <i>et al.</i>, “Room temperature spin relaxation in quantum dot based spin-optoelectronic devices,” in <i>Ultrafast Phenomena and Nanophotonics XVI</i>, 2012.","chicago":"Höpfner, Henning, Mingyuan Li, Arne Ludwig, Astrid Ludwig, Frank Stromberg, Heiko Wende, Werner Keune, et al. “Room Temperature Spin Relaxation in Quantum Dot Based Spin-Optoelectronic Devices.” In <i>Ultrafast Phenomena and Nanophotonics XVI</i>. SPIE, 2012. <a href=\"https://doi.org/10.1117/12.907821\">https://doi.org/10.1117/12.907821</a>.","ama":"Höpfner H, Li M, Ludwig A, et al. Room temperature spin relaxation in quantum dot based spin-optoelectronic devices. In: <i>Ultrafast Phenomena and Nanophotonics XVI</i>. SPIE; 2012. doi:<a href=\"https://doi.org/10.1117/12.907821\">10.1117/12.907821</a>","short":"H. Höpfner, M. Li, A. Ludwig, A. Ludwig, F. Stromberg, H. Wende, W. Keune, D. Reuter, A.D. Wieck, N.C. Gerhardt, M.R. Hofmann, in: Ultrafast Phenomena and Nanophotonics XVI, SPIE, 2012.","bibtex":"@inproceedings{Höpfner_Li_Ludwig_Ludwig_Stromberg_Wende_Keune_Reuter_Wieck_Gerhardt_et al._2012, title={Room temperature spin relaxation in quantum dot based spin-optoelectronic devices}, DOI={<a href=\"https://doi.org/10.1117/12.907821\">10.1117/12.907821</a>}, booktitle={Ultrafast Phenomena and Nanophotonics XVI}, publisher={SPIE}, author={Höpfner, Henning and Li, Mingyuan and Ludwig, Arne and Ludwig, Astrid and Stromberg, Frank and Wende, Heiko and Keune, Werner and Reuter, Dirk and Wieck, Andreas D. and Gerhardt, Nils C. and et al.}, year={2012} }"},"publication":"Ultrafast Phenomena and Nanophotonics XVI"},{"author":[{"last_name":"Li","first_name":"Yan","full_name":"Li, Yan"},{"first_name":"N.","last_name":"Sinitsyn","full_name":"Sinitsyn, N."},{"first_name":"D. L.","last_name":"Smith","full_name":"Smith, D. L."},{"id":"37763","first_name":"Dirk","last_name":"Reuter","full_name":"Reuter, Dirk"},{"last_name":"Wieck","first_name":"A. D.","full_name":"Wieck, A. D."},{"first_name":"D. R.","last_name":"Yakovlev","full_name":"Yakovlev, D. R."},{"first_name":"M.","last_name":"Bayer","full_name":"Bayer, M."},{"last_name":"Crooker","first_name":"S. A.","full_name":"Crooker, S. A."}],"publication_identifier":{"issn":["0031-9007","1079-7114"]},"status":"public","year":"2012","title":"Intrinsic Spin Fluctuations Reveal the Dynamical Response Function of Holes Coupled to Nuclear Spin Baths in (In,Ga)As Quantum Dots","intvolume":"       108","date_updated":"2022-01-06T07:03:35Z","publication_status":"published","language":[{"iso":"eng"}],"_id":"7338","publisher":"American Physical Society (APS)","volume":108,"doi":"10.1103/physrevlett.108.186603","user_id":"42514","citation":{"ieee":"Y. Li <i>et al.</i>, “Intrinsic Spin Fluctuations Reveal the Dynamical Response Function of Holes Coupled to Nuclear Spin Baths in (In,Ga)As Quantum Dots,” <i>Physical Review Letters</i>, vol. 108, no. 18, 2012.","apa":"Li, Y., Sinitsyn, N., Smith, D. L., Reuter, D., Wieck, A. D., Yakovlev, D. R., … Crooker, S. A. (2012). Intrinsic Spin Fluctuations Reveal the Dynamical Response Function of Holes Coupled to Nuclear Spin Baths in (In,Ga)As Quantum Dots. <i>Physical Review Letters</i>, <i>108</i>(18). <a href=\"https://doi.org/10.1103/physrevlett.108.186603\">https://doi.org/10.1103/physrevlett.108.186603</a>","short":"Y. Li, N. Sinitsyn, D.L. Smith, D. Reuter, A.D. Wieck, D.R. Yakovlev, M. Bayer, S.A. Crooker, Physical Review Letters 108 (2012).","chicago":"Li, Yan, N. Sinitsyn, D. L. Smith, Dirk Reuter, A. D. Wieck, D. R. Yakovlev, M. Bayer, and S. A. Crooker. “Intrinsic Spin Fluctuations Reveal the Dynamical Response Function of Holes Coupled to Nuclear Spin Baths in (In,Ga)As Quantum Dots.” <i>Physical Review Letters</i> 108, no. 18 (2012). <a href=\"https://doi.org/10.1103/physrevlett.108.186603\">https://doi.org/10.1103/physrevlett.108.186603</a>.","mla":"Li, Yan, et al. “Intrinsic Spin Fluctuations Reveal the Dynamical Response Function of Holes Coupled to Nuclear Spin Baths in (In,Ga)As Quantum Dots.” <i>Physical Review Letters</i>, vol. 108, no. 18, American Physical Society (APS), 2012, doi:<a href=\"https://doi.org/10.1103/physrevlett.108.186603\">10.1103/physrevlett.108.186603</a>.","bibtex":"@article{Li_Sinitsyn_Smith_Reuter_Wieck_Yakovlev_Bayer_Crooker_2012, title={Intrinsic Spin Fluctuations Reveal the Dynamical Response Function of Holes Coupled to Nuclear Spin Baths in (In,Ga)As Quantum Dots}, volume={108}, DOI={<a href=\"https://doi.org/10.1103/physrevlett.108.186603\">10.1103/physrevlett.108.186603</a>}, number={18}, journal={Physical Review Letters}, publisher={American Physical Society (APS)}, author={Li, Yan and Sinitsyn, N. and Smith, D. L. and Reuter, Dirk and Wieck, A. D. and Yakovlev, D. R. and Bayer, M. and Crooker, S. A.}, year={2012} }","ama":"Li Y, Sinitsyn N, Smith DL, et al. Intrinsic Spin Fluctuations Reveal the Dynamical Response Function of Holes Coupled to Nuclear Spin Baths in (In,Ga)As Quantum Dots. <i>Physical Review Letters</i>. 2012;108(18). doi:<a href=\"https://doi.org/10.1103/physrevlett.108.186603\">10.1103/physrevlett.108.186603</a>"},"publication":"Physical Review Letters","issue":"18","date_created":"2019-01-31T11:29:12Z","department":[{"_id":"15"},{"_id":"230"}],"type":"journal_article"},{"publication_identifier":{"issn":["1098-0121","1550-235X"]},"author":[{"last_name":"Kampmeier","first_name":"J.","full_name":"Kampmeier, J."},{"last_name":"Rashad","first_name":"M.","full_name":"Rashad, M."},{"first_name":"U.","last_name":"Woggon","full_name":"Woggon, U."},{"first_name":"M.","last_name":"Ruth","full_name":"Ruth, M."},{"full_name":"Meier, Cedrik","orcid":"https://orcid.org/0000-0002-3787-3572","first_name":"Cedrik","last_name":"Meier","id":"20798"},{"full_name":"Schikora, D.","first_name":"D.","last_name":"Schikora"},{"first_name":"K.","last_name":"Lischka","full_name":"Lischka, K."},{"full_name":"Pawlis, A.","first_name":"A.","last_name":"Pawlis"}],"year":"2012","title":"Enhanced photoluminescence of colloidal nanocrystals embedded in epitaxially grown semiconductor microstructures","status":"public","intvolume":"        85","date_updated":"2022-01-06T07:03:39Z","publication_status":"published","language":[{"iso":"eng"}],"_id":"7492","publisher":"American Physical Society (APS)","volume":85,"doi":"10.1103/physrevb.85.155405","user_id":"20798","citation":{"apa":"Kampmeier, J., Rashad, M., Woggon, U., Ruth, M., Meier, C., Schikora, D., … Pawlis, A. (2012). Enhanced photoluminescence of colloidal nanocrystals embedded in epitaxially grown semiconductor microstructures. <i>Physical Review B</i>, <i>85</i>(15). <a href=\"https://doi.org/10.1103/physrevb.85.155405\">https://doi.org/10.1103/physrevb.85.155405</a>","ieee":"J. Kampmeier <i>et al.</i>, “Enhanced photoluminescence of colloidal nanocrystals embedded in epitaxially grown semiconductor microstructures,” <i>Physical Review B</i>, vol. 85, no. 15, 2012.","chicago":"Kampmeier, J., M. Rashad, U. Woggon, M. Ruth, Cedrik Meier, D. Schikora, K. Lischka, and A. Pawlis. “Enhanced Photoluminescence of Colloidal Nanocrystals Embedded in Epitaxially Grown Semiconductor Microstructures.” <i>Physical Review B</i> 85, no. 15 (2012). <a href=\"https://doi.org/10.1103/physrevb.85.155405\">https://doi.org/10.1103/physrevb.85.155405</a>.","short":"J. Kampmeier, M. Rashad, U. Woggon, M. Ruth, C. Meier, D. Schikora, K. Lischka, A. Pawlis, Physical Review B 85 (2012).","mla":"Kampmeier, J., et al. “Enhanced Photoluminescence of Colloidal Nanocrystals Embedded in Epitaxially Grown Semiconductor Microstructures.” <i>Physical Review B</i>, vol. 85, no. 15, American Physical Society (APS), 2012, doi:<a href=\"https://doi.org/10.1103/physrevb.85.155405\">10.1103/physrevb.85.155405</a>.","ama":"Kampmeier J, Rashad M, Woggon U, et al. Enhanced photoluminescence of colloidal nanocrystals embedded in epitaxially grown semiconductor microstructures. <i>Physical Review B</i>. 2012;85(15). doi:<a href=\"https://doi.org/10.1103/physrevb.85.155405\">10.1103/physrevb.85.155405</a>","bibtex":"@article{Kampmeier_Rashad_Woggon_Ruth_Meier_Schikora_Lischka_Pawlis_2012, title={Enhanced photoluminescence of colloidal nanocrystals embedded in epitaxially grown semiconductor microstructures}, volume={85}, DOI={<a href=\"https://doi.org/10.1103/physrevb.85.155405\">10.1103/physrevb.85.155405</a>}, number={15}, journal={Physical Review B}, publisher={American Physical Society (APS)}, author={Kampmeier, J. and Rashad, M. and Woggon, U. and Ruth, M. and Meier, Cedrik and Schikora, D. and Lischka, K. and Pawlis, A.}, year={2012} }"},"publication":"Physical Review B","issue":"15","date_created":"2019-02-04T14:31:38Z","department":[{"_id":"15"},{"_id":"230"},{"_id":"35"},{"_id":"287"}],"type":"journal_article"},{"citation":{"ieee":"M. Mlynarski, B. Güldali, S. Weißleder, and G. Engels, “Model-Based Testing: Achievements and Future Challenges,” in <i>Advances in Computers</i>, vol. 86, A.  Hurson and A. Memon, Eds. Elsevier, 2012, pp. 1–39.","apa":"Mlynarski, M., Güldali, B., Weißleder, S., &#38; Engels, G. (2012). Model-Based Testing: Achievements and Future Challenges. In A.  Hurson &#38; A. Memon (Eds.), <i>Advances in Computers</i> (Vol. 86, pp. 1–39). Elsevier. <a href=\"http://dx.doi.org/10.1016/B978-0-12-396535-6.00001-6\">http://dx.doi.org/10.1016/B978-0-12-396535-6.00001-6</a>","chicago":"Mlynarski, Michael, Baris Güldali, Stephan Weißleder, and Gregor Engels. “Model-Based Testing: Achievements and Future Challenges.” In <i>Advances in Computers</i>, edited by Ali  Hurson and Atif Memon, 86:1–39. Advances in Computers. Elsevier, 2012. <a href=\"http://dx.doi.org/10.1016/B978-0-12-396535-6.00001-6\">http://dx.doi.org/10.1016/B978-0-12-396535-6.00001-6</a>.","short":"M. Mlynarski, B. Güldali, S. Weißleder, G. Engels, in: A.  Hurson, A. Memon (Eds.), Advances in Computers, Elsevier, 2012, pp. 1–39.","mla":"Mlynarski, Michael, et al. “Model-Based Testing: Achievements and Future Challenges.” <i>Advances in Computers</i>, edited by Ali  Hurson and Atif Memon, vol. 86, Elsevier, 2012, pp. 1–39, doi:<a href=\"http://dx.doi.org/10.1016/B978-0-12-396535-6.00001-6\">http://dx.doi.org/10.1016/B978-0-12-396535-6.00001-6</a>.","bibtex":"@inbook{Mlynarski_Güldali_Weißleder_Engels_2012, series={Advances in Computers}, title={Model-Based Testing: Achievements and Future Challenges}, volume={86}, DOI={<a href=\"http://dx.doi.org/10.1016/B978-0-12-396535-6.00001-6\">http://dx.doi.org/10.1016/B978-0-12-396535-6.00001-6</a>}, booktitle={Advances in Computers}, publisher={Elsevier}, author={Mlynarski, Michael and Güldali, Baris and Weißleder, Stephan and Engels, Gregor}, editor={ Hurson, Ali and Memon, AtifEditors}, year={2012}, pages={1–39}, collection={Advances in Computers} }","ama":"Mlynarski M, Güldali B, Weißleder S, Engels G. Model-Based Testing: Achievements and Future Challenges. In:  Hurson A, Memon A, eds. <i>Advances in Computers</i>. Vol 86. Advances in Computers. Elsevier; 2012:1-39. doi:<a href=\"http://dx.doi.org/10.1016/B978-0-12-396535-6.00001-6\">http://dx.doi.org/10.1016/B978-0-12-396535-6.00001-6</a>"},"user_id":"52534","editor":[{"last_name":" Hurson","first_name":"Ali","full_name":" Hurson, Ali"},{"full_name":"Memon, Atif","last_name":"Memon","first_name":"Atif"}],"volume":86,"page":"1 - 39","_id":"7557","publisher":"Elsevier","status":"public","type":"book_chapter","department":[{"_id":"66"}],"date_created":"2019-02-05T13:13:04Z","abstract":[{"lang":"eng","text":"Software systems are part of our everyday life and they become more complex day by day. The ever-growing complexity of software and high quality requirements pose tough challenges to quality assurance. The quality of a software system can be measured by software testing. However, if manually done, testing is a time-consuming and error-prone task. Especially test case design and test execution are the most cost-intensive activities in testing. In the previous 20&#xa0;years, many automation tools have been introduced for automating test execution by using test scripts. However, the effort for creating and maintaining test scripts remains. Model-based testing (MBT) aims at improving this part by systematizing and automating the test case design. Thereby, test cases or automatable test scripts can be generated systematically from test models. MBT is already known for several years, but it currently gains a great momentum due to advanced tool support and innovative methodological approaches. This chapter aims at giving an overview of MBT and summarizes recent achievements in MBT. Experiences with using the MBT approach are illustrated by reporting on some success stories. Finally, open issues and future research challenges are discussed."}],"publication":"Advances in Computers","doi":"http://dx.doi.org/10.1016/B978-0-12-396535-6.00001-6","language":[{"iso":"eng"}],"series_title":"Advances in Computers","date_updated":"2022-01-06T07:03:39Z","intvolume":"        86","year":"2012","title":"Model-Based Testing: Achievements and Future Challenges","author":[{"last_name":"Mlynarski","first_name":"Michael","full_name":"Mlynarski, Michael"},{"last_name":"Güldali","first_name":"Baris","full_name":"Güldali, Baris"},{"last_name":"Weißleder","first_name":"Stephan","full_name":"Weißleder, Stephan"},{"full_name":"Engels, Gregor","last_name":"Engels","first_name":"Gregor","id":"107"}]},{"publication":"MRS Proceedings","abstract":[{"text":"Two methods to create biomimetic anti-reflection nanostructures in ordinary glass microscope object slides are presented. One technique is based on a nanosphere lithography process combined with physical vapour deposition of nickel and reactive ion etching (RIE). The other uses plasma induced dewetting of a smooth nickel surface. The amount of reflected light was measured and a method to simulate the reflectivity from an atomic force microscopy (AFM) topography scan of the glass surface is presented. The reflectivity for visible light at normal incidence was reduced to 20-50 % of the original value with both methods and the simulation gives results in good agreement to the measurement.","lang":"eng"}],"date_created":"2018-08-23T13:29:50Z","type":"journal_article","department":[{"_id":"15"},{"_id":"286"}],"year":"2012","title":"Self-Organized Nanostructure Formation for Anti-Reflection Glass Surfaces","author":[{"last_name":"Achtelik","first_name":"Jörn","full_name":"Achtelik, Jörn"},{"full_name":"Kemper, Ricarda M.","first_name":"Ricarda M.","last_name":"Kemper"},{"full_name":"Sievers, Werner","first_name":"Werner","last_name":"Sievers"},{"full_name":"Lindner, Jörg","first_name":"Jörg","last_name":"Lindner"}],"publication_identifier":{"issn":["1946-4274"]},"date_updated":"2022-01-06T07:00:18Z","publication_status":"published","intvolume":"      1389","article_type":"original","language":[{"iso":"eng"}],"doi":"10.1557/opl.2012.491","citation":{"mla":"Achtelik, Jörn, et al. “Self-Organized Nanostructure Formation for Anti-Reflection Glass Surfaces.” <i>MRS Proceedings</i>, vol. 1389, Cambridge University Press (CUP), 2012, doi:<a href=\"https://doi.org/10.1557/opl.2012.491\">10.1557/opl.2012.491</a>.","ama":"Achtelik J, Kemper RM, Sievers W, Lindner J. Self-Organized Nanostructure Formation for Anti-Reflection Glass Surfaces. <i>MRS Proceedings</i>. 2012;1389. doi:<a href=\"https://doi.org/10.1557/opl.2012.491\">10.1557/opl.2012.491</a>","bibtex":"@article{Achtelik_Kemper_Sievers_Lindner_2012, title={Self-Organized Nanostructure Formation for Anti-Reflection Glass Surfaces}, volume={1389}, DOI={<a href=\"https://doi.org/10.1557/opl.2012.491\">10.1557/opl.2012.491</a>}, journal={MRS Proceedings}, publisher={Cambridge University Press (CUP)}, author={Achtelik, Jörn and Kemper, Ricarda M. and Sievers, Werner and Lindner, Jörg}, year={2012} }","apa":"Achtelik, J., Kemper, R. M., Sievers, W., &#38; Lindner, J. (2012). Self-Organized Nanostructure Formation for Anti-Reflection Glass Surfaces. <i>MRS Proceedings</i>, <i>1389</i>. <a href=\"https://doi.org/10.1557/opl.2012.491\">https://doi.org/10.1557/opl.2012.491</a>","ieee":"J. Achtelik, R. M. Kemper, W. Sievers, and J. Lindner, “Self-Organized Nanostructure Formation for Anti-Reflection Glass Surfaces,” <i>MRS Proceedings</i>, vol. 1389, 2012.","short":"J. Achtelik, R.M. Kemper, W. Sievers, J. Lindner, MRS Proceedings 1389 (2012).","chicago":"Achtelik, Jörn, Ricarda M. Kemper, Werner Sievers, and Jörg Lindner. “Self-Organized Nanostructure Formation for Anti-Reflection Glass Surfaces.” <i>MRS Proceedings</i> 1389 (2012). <a href=\"https://doi.org/10.1557/opl.2012.491\">https://doi.org/10.1557/opl.2012.491</a>."},"status":"public","conference":{"end_date":"2011-12-02","start_date":"2011-11-28","name":"MRS Fall Meeting 2011","location":"Boston (USA)"},"publisher":"Cambridge University Press (CUP)","_id":"4114","user_id":"55706","volume":1389},{"ddc":["530"],"user_id":"20798","volume":9,"page":"1028-1031","_id":"4131","publisher":"Wiley","has_accepted_license":"1","status":"public","file_date_updated":"2018-08-27T11:35:10Z","citation":{"bibtex":"@article{Kemper_Häberlen_Schupp_Weinl_Bürger_Ruth_Meier_Niendorf_Maier_Lischka_et al._2012, title={Formation of defects in cubic GaN grown on nano-patterned 3C-SiC (001)}, volume={9}, DOI={<a href=\"https://doi.org/10.1002/pssc.201100174\">10.1002/pssc.201100174</a>}, number={3–4}, journal={physica status solidi (c)}, publisher={Wiley}, author={Kemper, R. M. and Häberlen, M. and Schupp, T. and Weinl, M. and Bürger, M. and Ruth, M. and Meier, Cedrik and Niendorf, T. and Maier, H. J. and Lischka, K. and et al.}, year={2012}, pages={1028–1031} }","ama":"Kemper RM, Häberlen M, Schupp T, et al. Formation of defects in cubic GaN grown on nano-patterned 3C-SiC (001). <i>physica status solidi (c)</i>. 2012;9(3-4):1028-1031. doi:<a href=\"https://doi.org/10.1002/pssc.201100174\">10.1002/pssc.201100174</a>","mla":"Kemper, R. M., et al. “Formation of Defects in Cubic GaN Grown on Nano-Patterned 3C-SiC (001).” <i>Physica Status Solidi (C)</i>, vol. 9, no. 3–4, Wiley, 2012, pp. 1028–31, doi:<a href=\"https://doi.org/10.1002/pssc.201100174\">10.1002/pssc.201100174</a>.","chicago":"Kemper, R. M., M. Häberlen, T. Schupp, M. Weinl, M. Bürger, M. Ruth, Cedrik Meier, et al. “Formation of Defects in Cubic GaN Grown on Nano-Patterned 3C-SiC (001).” <i>Physica Status Solidi (C)</i> 9, no. 3–4 (2012): 1028–31. <a href=\"https://doi.org/10.1002/pssc.201100174\">https://doi.org/10.1002/pssc.201100174</a>.","short":"R.M. Kemper, M. Häberlen, T. Schupp, M. Weinl, M. Bürger, M. Ruth, C. Meier, T. Niendorf, H.J. Maier, K. Lischka, D.J. As, J. Lindner, Physica Status Solidi (C) 9 (2012) 1028–1031.","ieee":"R. M. Kemper <i>et al.</i>, “Formation of defects in cubic GaN grown on nano-patterned 3C-SiC (001),” <i>physica status solidi (c)</i>, vol. 9, no. 3–4, pp. 1028–1031, 2012.","apa":"Kemper, R. M., Häberlen, M., Schupp, T., Weinl, M., Bürger, M., Ruth, M., … Lindner, J. (2012). Formation of defects in cubic GaN grown on nano-patterned 3C-SiC (001). <i>Physica Status Solidi (C)</i>, <i>9</i>(3–4), 1028–1031. <a href=\"https://doi.org/10.1002/pssc.201100174\">https://doi.org/10.1002/pssc.201100174</a>"},"doi":"10.1002/pssc.201100174","language":[{"iso":"eng"}],"date_updated":"2022-01-06T07:00:23Z","publication_status":"published","intvolume":"         9","article_type":"original","title":"Formation of defects in cubic GaN grown on nano-patterned 3C-SiC (001)","year":"2012","publication_identifier":{"issn":["1862-6351"]},"author":[{"full_name":"Kemper, R. M.","last_name":"Kemper","first_name":"R. M."},{"first_name":"M.","last_name":"Häberlen","full_name":"Häberlen, M."},{"last_name":"Schupp","first_name":"T.","full_name":"Schupp, T."},{"full_name":"Weinl, M.","first_name":"M.","last_name":"Weinl"},{"last_name":"Bürger","first_name":"M.","full_name":"Bürger, M."},{"full_name":"Ruth, M.","last_name":"Ruth","first_name":"M."},{"full_name":"Meier, Cedrik","orcid":"https://orcid.org/0000-0002-3787-3572","last_name":"Meier","first_name":"Cedrik","id":"20798"},{"full_name":"Niendorf, T.","last_name":"Niendorf","first_name":"T."},{"last_name":"Maier","first_name":"H. J.","full_name":"Maier, H. J."},{"last_name":"Lischka","first_name":"K.","full_name":"Lischka, K."},{"last_name":"As","first_name":"D. J.","full_name":"As, D. J."},{"last_name":"Lindner","first_name":"Jörg","full_name":"Lindner, Jörg"}],"type":"journal_article","department":[{"_id":"286"},{"_id":"287"},{"_id":"15"},{"_id":"230"},{"_id":"35"}],"file":[{"date_created":"2018-08-27T11:35:10Z","creator":"hclaudia","success":1,"content_type":"application/pdf","file_id":"4132","file_size":848414,"access_level":"closed","file_name":"Formation of defects in cubic GaN grown on nano-patterned 3C-SiC 001.pdf","date_updated":"2018-08-27T11:35:10Z","relation":"main_file"}],"date_created":"2018-08-27T11:31:07Z","abstract":[{"text":"We report an anisotropic formation of defects in cubic GaN grown on nano-patterned 3C-SiC/Si (001) by molecular\r\nbeam epitaxy. Nano-patterning of 3C-SiC/Si (001) is achieved by nanosphere lithography and a reactive\r\nion etching process. Atomic force microscopy and scanning electron microscopy show that the selectivearea-\r\ngrown cubic GaN nucleates in two structurally different domains, which most probably originate from the\r\nsubstrate. In adjacent domains the formation of defects, especially hexagonal inclusions, is different and leads to\r\ntwo different surface morphologies. The dominant phase within these domains was measured by electron backscatter\r\ndiffraction. Optical properties were investigated by micro-photoluminescence and cathodoluminescence spectroscopy.","lang":"eng"}],"publication":"physica status solidi (c)","issue":"3-4"},{"user_id":"55706","language":[{"iso":"eng"}],"_id":"4133","date_updated":"2022-01-06T07:00:23Z","conference":{"name":"European Microscopy Congress (EMC) 2012","start_date":"2012-09-16","location":"Manchester (UK)","end_date":"2012-09-21"},"author":[{"last_name":"Kemper","first_name":"R.M.","full_name":"Kemper, R.M."},{"first_name":"L.","last_name":"Hiller","full_name":"Hiller, L."},{"first_name":"T.","last_name":"Stauden","full_name":"Stauden, T."},{"full_name":"Pezoldt, J. ","first_name":"J. ","last_name":"Pezoldt"},{"last_name":"Meertens","first_name":"D.","full_name":"Meertens, D."},{"last_name":"Luysberg","first_name":"M. ","full_name":"Luysberg, M. 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Lecture Notes in Computer Science. Berlin, Heidelberg, 2012. <a href=\"https://doi.org/10.1007/978-3-642-33179-4_48\">https://doi.org/10.1007/978-3-642-33179-4_48</a>.","mla":"Suess, Tim, et al. “Asynchronous Occlusion Culling on Heterogeneous PC Clusters for Distributed 3D Scenes.” <i>Advances in Visual Computing</i>, vol. 7431, 2012, pp. 502–12, doi:<a href=\"https://doi.org/10.1007/978-3-642-33179-4_48\">10.1007/978-3-642-33179-4_48</a>.","ama":"Suess T, Koch C, Jähn C, Fischer M, Meyer auf der Heide F. Asynchronous Occlusion Culling on Heterogeneous PC Clusters for Distributed 3D Scenes. In: <i>Advances in Visual Computing</i>. Vol 7431. Lecture Notes in Computer Science. ; 2012:502-512. doi:<a href=\"https://doi.org/10.1007/978-3-642-33179-4_48\">10.1007/978-3-642-33179-4_48</a>","bibtex":"@inproceedings{Suess_Koch_Jähn_Fischer_Meyer auf der Heide_2012, place={Berlin, Heidelberg}, series={Lecture Notes in Computer Science}, title={Asynchronous Occlusion Culling on Heterogeneous PC Clusters for Distributed 3D Scenes}, volume={7431}, DOI={<a href=\"https://doi.org/10.1007/978-3-642-33179-4_48\">10.1007/978-3-642-33179-4_48</a>}, booktitle={Advances in Visual Computing}, author={Suess, Tim and Koch, Clemens and Jähn, Claudius and Fischer, Matthias and Meyer auf der Heide, Friedhelm}, year={2012}, pages={502–512}, collection={Lecture Notes in Computer Science} }"},"place":"Berlin, Heidelberg","status":"public","volume":7431,"user_id":"15415","_id":"16408","page":"502-512","abstract":[{"text":"We present a parallel rendering system for heterogeneous PC clusters to visualize massive models. One single, powerful visualization node is supported by a group of backend nodes with weak graphics performance. While the visualization node renders the visible objects, the backend nodes asynchronously perform visibility tests and supply the front end with visible scene objects. The visualization node stores only currently visible objects in its memory, while the scene is distributed among the backend nodes’ memory without redundancy. To efficiently compute the occlusion tests in spite of that each backend node stores only a fraction of the original geometry, we complete the scene by adding highly simplified versions of the objects stored on other nodes. We test our system with 15 backend nodes. It is able to render a ≈ 350,M polygons (≈ 8.5,GiB) large aircraft model with 20, to 30,fps and thus allows a walk-through in real-time.\r\n","lang":"eng"}],"publication":"Advances in Visual Computing","department":[{"_id":"63"}],"type":"conference","date_created":"2020-04-06T07:40:57Z","intvolume":"      7431","publication_status":"published","date_updated":"2022-01-06T06:52:50Z","author":[{"full_name":"Suess, Tim","first_name":"Tim","last_name":"Suess"},{"last_name":"Koch","first_name":"Clemens","full_name":"Koch, Clemens"},{"first_name":"Claudius","last_name":"Jähn","full_name":"Jähn, Claudius"},{"id":"146","full_name":"Fischer, Matthias","first_name":"Matthias","last_name":"Fischer"},{"last_name":"Meyer auf der Heide","first_name":"Friedhelm","full_name":"Meyer auf der Heide, Friedhelm","id":"15523"}],"publication_identifier":{"isbn":["9783642331787","9783642331794"],"issn":["0302-9743","1611-3349"]},"year":"2012","title":"Asynchronous Occlusion Culling on Heterogeneous PC Clusters for Distributed 3D Scenes","doi":"10.1007/978-3-642-33179-4_48","language":[{"iso":"eng"}],"series_title":"Lecture Notes in Computer Science"},{"publication_identifier":{"isbn":["9783942267588"]},"author":[{"first_name":"A.","last_name":"Bagsik","full_name":"Bagsik, A."},{"full_name":"Schöppner, Volker","last_name":"Schöppner","first_name":"Volker","id":"20530"},{"full_name":"Klemp, E.","first_name":"E.","last_name":"Klemp"}],"status":"public","title":"Tensile and Flexural Properties of Fused Deposition Modeling Parts Manufactured with ULTEM*9085","year":"2012","intvolume":"         1","date_updated":"2022-04-25T07:58:51Z","_id":"22164","language":[{"iso":"eng"}],"page":"129-134","volume":1,"user_id":"70729","citation":{"short":"A. Bagsik, V. Schöppner, E. Klemp, in: 1st International Conference on Thermo-Mechanically Graded Materials, 2012, pp. 129–134.","chicago":"Bagsik, A., Volker Schöppner, and E. Klemp. “Tensile and Flexural Properties of Fused Deposition Modeling Parts Manufactured with ULTEM*9085.” In <i>1st International Conference on Thermo-Mechanically Graded Materials</i>, 1:129–34, 2012.","apa":"Bagsik, A., Schöppner, V., &#38; Klemp, E. (2012). Tensile and Flexural Properties of Fused Deposition Modeling Parts Manufactured with ULTEM*9085. <i>1st International Conference on Thermo-Mechanically Graded Materials</i>, <i>1</i>, 129–134.","ieee":"A. Bagsik, V. Schöppner, and E. Klemp, “Tensile and Flexural Properties of Fused Deposition Modeling Parts Manufactured with ULTEM*9085,” in <i>1st International Conference on Thermo-Mechanically Graded Materials</i>, 2012, vol. 1, pp. 129–134.","ama":"Bagsik A, Schöppner V, Klemp E. Tensile and Flexural Properties of Fused Deposition Modeling Parts Manufactured with ULTEM*9085. In: <i>1st International Conference on Thermo-Mechanically Graded Materials</i>. Vol 1. ; 2012:129-134.","bibtex":"@inproceedings{Bagsik_Schöppner_Klemp_2012, title={Tensile and Flexural Properties of Fused Deposition Modeling Parts Manufactured with ULTEM*9085}, volume={1}, booktitle={1st International Conference on Thermo-Mechanically Graded Materials}, author={Bagsik, A. and Schöppner, Volker and Klemp, E.}, year={2012}, pages={129–134} }","mla":"Bagsik, A., et al. “Tensile and Flexural Properties of Fused Deposition Modeling Parts Manufactured with ULTEM*9085.” <i>1st International Conference on Thermo-Mechanically Graded Materials</i>, vol. 1, 2012, pp. 129–34."},"publication":"1st International Conference on Thermo-Mechanically Graded Materials","quality_controlled":"1","abstract":[{"lang":"eng","text":"Generative production techniques have the advantage of manufacturing parts via an additive process without needing a forming tool. One of these additive manufacturing technologies is \"Fused Deposition Modeling\" (FDM). It is one of the most used additive manufacturing processes to produce prototypes and end-use parts. From a 3D-CAD data set, components and assemblies are manufactured out of thermoplastic material layer by layer by means of an additive process. An extrusion head deposits the molten thermoplastic filament to create each layer with a particular tool path. Due to the thermal fusion the material bonds with the layer beneath and solidifies. Thus a permanent bonding of two layers is formed. In this paper the mechanical data of parts, manufactured with the system Fortus 400mc from Stratasys with the material Ultem*9085 are presented. Tensile and flexural tests according to both, the ASTM and the ISO standard, are conducted. Test specimens are generated with the standard parameters of the native software in different build directions. The tests show different strength and strain characteristics that depend on the given structure as a result of the build direction. Furthermore tensile specimens according to the ASTM standard are generated with changed parameters of the native software to increase the mechanical strength properties. The results are compared to injection molded strength properties."}],"date_created":"2021-05-14T07:24:35Z","department":[{"_id":"219"},{"_id":"624"},{"_id":"367"},{"_id":"321"},{"_id":"9"}],"type":"conference"},{"author":[{"full_name":"Bagsik, A.","last_name":"Bagsik","first_name":"A."},{"first_name":"Volker","last_name":"Schöppner","full_name":"Schöppner, Volker","id":"20530"},{"full_name":"Klemp, E.","first_name":"E.","last_name":"Klemp"}],"title":"Extensive Analysis of the mechanical strength properties of Fused Deposition Modeling Parts manufactured with ULTEM 9085","year":"2012","intvolume":"         5","date_updated":"2022-04-25T08:05:52Z","language":[{"iso":"eng"}],"doi":"https://www.tib.eu/de/suchen/id/TIBKAT%3A756276616","publication":"5th International Conference on Polymer and Mould Innovations","abstract":[{"lang":"eng","text":"Generative production techniques have the advantage of manufacturing parts via an additive process without needing a forming tool. One of these additive manufacturing technologies is “Fused Deposition Modeling” (FDM). It is one of the most used additive manufacturing processes to produce prototypes and end-use parts. From a 3D-CAD data set, components and assemblies are manufactured out of thermoplastic material layer by layer by means of an additive process. An extrusion head deposits the molten thermoplastic filament to create each layer with a particular tool path. In this paper the mechanical data of parts, manufactured with the system Fortus 400mc from Stratasys with the material Ultem*9085 are presented. Tensile specimens are generated with the standard parameters as well as with changed parameters of the native software to analyze the influence of these parameters on the mechanical strength properties. The tensile tests show different strength and strain characteristics that depend on the given structure and as a result of the build direction. Furthermore the toolpath parameters have an effect on the strength characteristics and the break behavior. In addition, tensile specimens are tested under the influence of different temperatures and after a thermal cycling. "}],"date_created":"2021-05-07T13:23:04Z","department":[{"_id":"219"},{"_id":"624"},{"_id":"367"},{"_id":"321"},{"_id":"9"}],"type":"conference","status":"public","_id":"22024","publisher":"Centre for Polymer and Material Technology, Univ. College, Ghent Univ.","page":"266-272","volume":5,"user_id":"70729","citation":{"mla":"Bagsik, A., et al. “Extensive Analysis of the Mechanical Strength Properties of Fused Deposition Modeling Parts Manufactured with ULTEM 9085.” <i>5th International Conference on Polymer and Mould Innovations</i>, vol. 5, Centre for Polymer and Material Technology, Univ. College, Ghent Univ., 2012, pp. 266–72, doi:<a href=\"https://www.tib.eu/de/suchen/id/TIBKAT%3A756276616\">https://www.tib.eu/de/suchen/id/TIBKAT%3A756276616</a>.","bibtex":"@inproceedings{Bagsik_Schöppner_Klemp_2012, place={Ghent}, title={Extensive Analysis of the mechanical strength properties of Fused Deposition Modeling Parts manufactured with ULTEM 9085}, volume={5}, DOI={<a href=\"https://www.tib.eu/de/suchen/id/TIBKAT%3A756276616\">https://www.tib.eu/de/suchen/id/TIBKAT%3A756276616</a>}, booktitle={5th International Conference on Polymer and Mould Innovations}, publisher={Centre for Polymer and Material Technology, Univ. College, Ghent Univ.}, author={Bagsik, A. and Schöppner, Volker and Klemp, E.}, year={2012}, pages={266–272} }","ama":"Bagsik A, Schöppner V, Klemp E. Extensive Analysis of the mechanical strength properties of Fused Deposition Modeling Parts manufactured with ULTEM 9085. In: <i>5th International Conference on Polymer and Mould Innovations</i>. Vol 5. Centre for Polymer and Material Technology, Univ. College, Ghent Univ.; 2012:266-272. doi:<a href=\"https://www.tib.eu/de/suchen/id/TIBKAT%3A756276616\">https://www.tib.eu/de/suchen/id/TIBKAT%3A756276616</a>","ieee":"A. Bagsik, V. Schöppner, and E. Klemp, “Extensive Analysis of the mechanical strength properties of Fused Deposition Modeling Parts manufactured with ULTEM 9085,” in <i>5th International Conference on Polymer and Mould Innovations</i>, 2012, vol. 5, pp. 266–272, doi: <a href=\"https://www.tib.eu/de/suchen/id/TIBKAT%3A756276616\">https://www.tib.eu/de/suchen/id/TIBKAT%3A756276616</a>.","apa":"Bagsik, A., Schöppner, V., &#38; Klemp, E. (2012). Extensive Analysis of the mechanical strength properties of Fused Deposition Modeling Parts manufactured with ULTEM 9085. <i>5th International Conference on Polymer and Mould Innovations</i>, <i>5</i>, 266–272. <a href=\"https://www.tib.eu/de/suchen/id/TIBKAT%3A756276616\">https://www.tib.eu/de/suchen/id/TIBKAT%3A756276616</a>","short":"A. Bagsik, V. Schöppner, E. Klemp, in: 5th International Conference on Polymer and Mould Innovations, Centre for Polymer and Material Technology, Univ. College, Ghent Univ., Ghent, 2012, pp. 266–272.","chicago":"Bagsik, A., Volker Schöppner, and E. Klemp. “Extensive Analysis of the Mechanical Strength Properties of Fused Deposition Modeling Parts Manufactured with ULTEM 9085.” In <i>5th International Conference on Polymer and Mould Innovations</i>, 5:266–72. Ghent: Centre for Polymer and Material Technology, Univ. College, Ghent Univ., 2012. <a href=\"https://www.tib.eu/de/suchen/id/TIBKAT%3A756276616\">https://www.tib.eu/de/suchen/id/TIBKAT%3A756276616</a>."},"quality_controlled":"1","place":"Ghent"},{"status":"public","page":"48 - 76","funded_apc":"1","_id":"6088","user_id":"42165","volume":20,"citation":{"chicago":"Hilkenmeier, Frederic, Ingrid Scharlau, Katharina Weiß, and Christian N. L. Olivers. “The Dynamics of Prior Entry in Serial Visual Processing.” <i>Visual Cognition</i> 20, no. 1 (2012): 48–76.","short":"F. Hilkenmeier, I. Scharlau, K. Weiß, C.N.L. Olivers, Visual Cognition 20 (2012) 48–76.","apa":"Hilkenmeier, F., Scharlau, I., Weiß, K., &#38; Olivers, C. N. L. (2012). The dynamics of prior entry in serial visual processing. <i>Visual Cognition</i>, <i>20</i>(1), 48–76.","ieee":"F. Hilkenmeier, I. Scharlau, K. Weiß, and C. N. L. Olivers, “The dynamics of prior entry in serial visual processing.,” <i>Visual Cognition</i>, vol. 20, no. 1, pp. 48–76, 2012.","ama":"Hilkenmeier F, Scharlau I, Weiß K, Olivers CNL. The dynamics of prior entry in serial visual processing. <i>Visual Cognition</i>. 2012;20(1):48-76.","bibtex":"@article{Hilkenmeier_Scharlau_Weiß_Olivers_2012, title={The dynamics of prior entry in serial visual processing.}, volume={20}, number={1}, journal={Visual Cognition}, author={Hilkenmeier, Frederic and Scharlau, Ingrid and Weiß, Katharina and Olivers, Christian N. L.}, year={2012}, pages={48–76} }","mla":"Hilkenmeier, Frederic, et al. “The Dynamics of Prior Entry in Serial Visual Processing.” <i>Visual Cognition</i>, vol. 20, no. 1, 2012, pp. 48–76."},"title":"The dynamics of prior entry in serial visual processing.","year":"2012","publication_identifier":{"issn":["1350-6285"]},"author":[{"first_name":"Frederic","last_name":"Hilkenmeier","full_name":"Hilkenmeier, Frederic"},{"last_name":"Scharlau","first_name":"Ingrid","orcid":"0000-0003-2364-9489","full_name":"Scharlau, Ingrid","id":"451"},{"full_name":"Weiß, Katharina","last_name":"Weiß","first_name":"Katharina"},{"full_name":"Olivers, Christian N. L.","last_name":"Olivers","first_name":"Christian N. L."}],"publication_status":"published","date_updated":"2022-06-06T16:36:51Z","intvolume":"        20","language":[{"iso":"eng"}],"publication":"Visual Cognition","issue":"1","abstract":[{"text":"An attended stimulus reduces the perceptual latency of a later stimulus at the same location, leading to the intriguing finding that the perceived order between the two is often reversed. This prior-entry effect has been well established in a number of different cueing paradigms, mostly involving spatial attentional shifts. Here we assess the time-course of prior entry when all stimuli appear in rapid serial presentation at one location. Our findings indicate that the size of the attentional enhancement is strongly affected by the stimulus onset asynchrony between cue and target, with a rapid early peak, followed by decay. When task-irrelevant cues are used, the cueing effect on prior entry is short-lived and peaks as early as 50 ms. The benefit extends to about 100 ms when task-relevant cues are employed. These results fit with a straightforward computational model of transient attentional enhancement, peaking about 80 100 ms after stimulus detection. (PsycINFO Database Record (c) 20","lang":"eng"}],"date_created":"2018-12-10T07:07:45Z","keyword":["serial visual processing","prior entry dynamics","cueing paradigms","Cues","Visual Perception","Visual Search"],"type":"journal_article","department":[{"_id":"424"}]},{"year":"2012","title":"“Seit ein Gespräch wir sind und hören voneinander” – eine Einführung","status":"public","author":[{"last_name":"Rauh","first_name":"B.","full_name":"Rauh, B."},{"full_name":"Laubenstein, Désirée","first_name":"Désirée","last_name":"Laubenstein","id":"52682"},{"last_name":"Anken","first_name":"L.","full_name":"Anken, L."},{"full_name":"Auer, H.-L.","first_name":"H.-L.","last_name":"Auer"}],"date_updated":"2023-01-10T08:46:21Z","page":"9-11","publisher":"Athena","_id":"35663","language":[{"iso":"eng"}],"user_id":"58446","editor":[{"full_name":"Rauh, B.","last_name":"Rauh","first_name":"B."},{"first_name":"D.","last_name":"Laubenstein","full_name":"Laubenstein, D."},{"full_name":"Anken, L.","last_name":"Anken","first_name":"L."},{"first_name":"H.-L.","last_name":"Auer","full_name":"Auer, H.-L."}],"publication":"Förderschwerpunkt Lernen – wohin?","citation":{"apa":"Rauh, B., Laubenstein, D., Anken, L., &#38; Auer, H.-L. (2012). “Seit ein Gespräch wir sind und hören voneinander” – eine Einführung. In B. Rauh, D. Laubenstein, L. Anken, &#38; H.-L. Auer (Eds.), <i>Förderschwerpunkt Lernen – wohin?</i> (pp. 9–11). Athena.","ieee":"B. Rauh, D. Laubenstein, L. Anken, and H.-L. Auer, “‘Seit ein Gespräch wir sind und hören voneinander’ – eine Einführung,” in <i>Förderschwerpunkt Lernen – wohin?</i>, B. Rauh, D. Laubenstein, L. Anken, and H.-L. Auer, Eds. Oberhausen: Athena, 2012, pp. 9–11.","short":"B. Rauh, D. Laubenstein, L. Anken, H.-L. Auer, in: B. Rauh, D. Laubenstein, L. Anken, H.-L. Auer (Eds.), Förderschwerpunkt Lernen – Wohin?, Athena, Oberhausen, 2012, pp. 9–11.","chicago":"Rauh, B., Désirée Laubenstein, L. Anken, and H.-L. Auer. “‘Seit Ein Gespräch Wir Sind Und Hören Voneinander’ – Eine Einführung.” In <i>Förderschwerpunkt Lernen – Wohin?</i>, edited by B. Rauh, D. Laubenstein, L. Anken, and H.-L. Auer, 9–11. Oberhausen: Athena, 2012.","mla":"Rauh, B., et al. “‘Seit Ein Gespräch Wir Sind Und Hören Voneinander’ – Eine Einführung.” <i>Förderschwerpunkt Lernen – Wohin?</i>, edited by B. Rauh et al., Athena, 2012, pp. 9–11.","ama":"Rauh B, Laubenstein D, Anken L, Auer H-L. “Seit ein Gespräch wir sind und hören voneinander” – eine Einführung. In: Rauh B, Laubenstein D, Anken L, Auer H-L, eds. <i>Förderschwerpunkt Lernen – Wohin?</i>. Athena; 2012:9-11.","bibtex":"@inbook{Rauh_Laubenstein_Anken_Auer_2012, place={Oberhausen}, title={“Seit ein Gespräch wir sind und hören voneinander” – eine Einführung}, booktitle={Förderschwerpunkt Lernen – wohin?}, publisher={Athena}, author={Rauh, B. and Laubenstein, Désirée and Anken, L. and Auer, H.-L.}, editor={Rauh, B. and Laubenstein, D. and Anken, L. and Auer, H.-L.}, year={2012}, pages={9–11} }"},"extern":"1","place":"Oberhausen","date_created":"2023-01-10T08:45:35Z","type":"book_chapter","department":[{"_id":"454"}]},{"extern":"1","citation":{"short":"B. Rauh, D. Laubenstein, H.-L. Auer, in: B. Rauh, D. Laubenstein, L. Anken, H.-L. Auer (Eds.), Förderschwerpunkt Lernen – Wohin?, Athena, Oberhausen, 2012, pp. 13–31.","chicago":"Rauh, B., Désirée Laubenstein, and H.-L. Auer. “Für Welches Ziel Und Zu Welchem Zweck Braucht Man Heute Noch Einen Förderschwerpunkt Lernen? .” In <i>Förderschwerpunkt Lernen – Wohin?</i>, edited by B. Rauh, D. Laubenstein, L. Anken, and H.-L. Auer, 13–31. Oberhausen: Athena, 2012.","ieee":"B. Rauh, D. Laubenstein, and H.-L. Auer, “Für welches Ziel und zu welchem Zweck braucht man heute noch einen Förderschwerpunkt Lernen? ,” in <i>Förderschwerpunkt Lernen – wohin?</i>, B. Rauh, D. Laubenstein, L. Anken, and H.-L. Auer, Eds. Oberhausen: Athena, 2012, pp. 13–31.","apa":"Rauh, B., Laubenstein, D., &#38; Auer, H.-L. (2012). Für welches Ziel und zu welchem Zweck braucht man heute noch einen Förderschwerpunkt Lernen? . In B. Rauh, D. Laubenstein, L. Anken, &#38; H.-L. Auer (Eds.), <i>Förderschwerpunkt Lernen – wohin?</i> (pp. 13–31). Athena.","bibtex":"@inbook{Rauh_Laubenstein_Auer_2012, place={Oberhausen}, title={Für welches Ziel und zu welchem Zweck braucht man heute noch einen Förderschwerpunkt Lernen? }, booktitle={Förderschwerpunkt Lernen – wohin?}, publisher={Athena}, author={Rauh, B. and Laubenstein, Désirée and Auer, H.-L.}, editor={Rauh, B. and Laubenstein, D. and Anken, L. and Auer, H.-L.}, year={2012}, pages={13–31} }","ama":"Rauh B, Laubenstein D, Auer H-L. Für welches Ziel und zu welchem Zweck braucht man heute noch einen Förderschwerpunkt Lernen? . In: Rauh B, Laubenstein D, Anken L, Auer H-L, eds. <i>Förderschwerpunkt Lernen – Wohin?</i>. Athena; 2012:13-31.","mla":"Rauh, B., et al. “Für Welches Ziel Und Zu Welchem Zweck Braucht Man Heute Noch Einen Förderschwerpunkt Lernen? .” <i>Förderschwerpunkt Lernen – Wohin?</i>, edited by B. Rauh et al., Athena, 2012, pp. 13–31."},"publication":"Förderschwerpunkt Lernen – wohin?","department":[{"_id":"454"}],"type":"book_chapter","place":"Oberhausen","date_created":"2023-01-10T08:49:56Z","date_updated":"2023-01-10T08:50:45Z","author":[{"full_name":"Rauh, B.","first_name":"B.","last_name":"Rauh"},{"full_name":"Laubenstein, Désirée","first_name":"Désirée","last_name":"Laubenstein","id":"52682"},{"last_name":"Auer","first_name":"H.-L.","full_name":"Auer, H.-L."}],"title":"Für welches Ziel und zu welchem Zweck braucht man heute noch einen Förderschwerpunkt Lernen? ","status":"public","year":"2012","editor":[{"first_name":"B.","last_name":"Rauh","full_name":"Rauh, B."},{"full_name":"Laubenstein, D.","first_name":"D.","last_name":"Laubenstein"},{"full_name":"Anken, L.","first_name":"L.","last_name":"Anken"},{"last_name":"Auer","first_name":"H.-L.","full_name":"Auer, H.-L."}],"user_id":"58446","language":[{"iso":"eng"}],"_id":"35670","publisher":"Athena","page":"13-31"},{"language":[{"iso":"eng"}],"_id":"35675","page":"115-131","editor":[{"last_name":"Rauh","first_name":"B.","full_name":"Rauh, B."},{"first_name":"D.","last_name":"Laubenstein","full_name":"Laubenstein, D."},{"last_name":"Anken","first_name":"L.","full_name":"Anken, L."},{"last_name":"Auer","first_name":"H.-L.","full_name":"Auer, H.-L."}],"user_id":"58446","author":[{"id":"52682","first_name":"Désirée","last_name":"Laubenstein","full_name":"Laubenstein, Désirée"},{"full_name":"Rauh, B.","last_name":"Rauh","first_name":"B."}],"title":"Konstruktionen der Akteure im Förderschwerpunkt Lernen über Gegenwart und Zukunft ihres Gegenstandes – Ergebnisse der qualitativen Analyse von Expertendiskussionen.","year":"2012","status":"public","date_updated":"2023-01-10T08:55:33Z","place":"Oberhausen","date_created":"2023-01-10T08:54:30Z","department":[{"_id":"454"}],"type":"book_chapter","citation":{"bibtex":"@inbook{Laubenstein_Rauh_2012, place={Oberhausen}, title={Konstruktionen der Akteure im Förderschwerpunkt Lernen über Gegenwart und Zukunft ihres Gegenstandes – Ergebnisse der qualitativen Analyse von Expertendiskussionen.}, booktitle={Förderschwerpunkt Lernen – wohin?}, author={Laubenstein, Désirée and Rauh, B.}, editor={Rauh, B. and Laubenstein, D. and Anken, L. and Auer, H.-L.}, year={2012}, pages={115–131} }","ama":"Laubenstein D, Rauh B. Konstruktionen der Akteure im Förderschwerpunkt Lernen über Gegenwart und Zukunft ihres Gegenstandes – Ergebnisse der qualitativen Analyse von Expertendiskussionen. In: Rauh B, Laubenstein D, Anken L, Auer H-L, eds. <i>Förderschwerpunkt Lernen – Wohin?</i>. ; 2012:115-131.","mla":"Laubenstein, Désirée, and B. Rauh. “Konstruktionen Der Akteure Im Förderschwerpunkt Lernen Über Gegenwart Und Zukunft Ihres Gegenstandes – Ergebnisse Der Qualitativen Analyse von Expertendiskussionen.” <i>Förderschwerpunkt Lernen – Wohin?</i>, edited by B. Rauh et al., 2012, pp. 115–31.","chicago":"Laubenstein, Désirée, and B. Rauh. “Konstruktionen Der Akteure Im Förderschwerpunkt Lernen Über Gegenwart Und Zukunft Ihres Gegenstandes – Ergebnisse Der Qualitativen Analyse von Expertendiskussionen.” In <i>Förderschwerpunkt Lernen – Wohin?</i>, edited by B. Rauh, D. Laubenstein, L. Anken, and H.-L. Auer, 115–31. Oberhausen, 2012.","short":"D. Laubenstein, B. Rauh, in: B. Rauh, D. Laubenstein, L. Anken, H.-L. Auer (Eds.), Förderschwerpunkt Lernen – Wohin?, Oberhausen, 2012, pp. 115–131.","ieee":"D. Laubenstein and B. Rauh, “Konstruktionen der Akteure im Förderschwerpunkt Lernen über Gegenwart und Zukunft ihres Gegenstandes – Ergebnisse der qualitativen Analyse von Expertendiskussionen.,” in <i>Förderschwerpunkt Lernen – wohin?</i>, B. Rauh, D. Laubenstein, L. Anken, and H.-L. Auer, Eds. Oberhausen, 2012, pp. 115–131.","apa":"Laubenstein, D., &#38; Rauh, B. (2012). Konstruktionen der Akteure im Förderschwerpunkt Lernen über Gegenwart und Zukunft ihres Gegenstandes – Ergebnisse der qualitativen Analyse von Expertendiskussionen. In B. Rauh, D. Laubenstein, L. Anken, &#38; H.-L. Auer (Eds.), <i>Förderschwerpunkt Lernen – wohin?</i> (pp. 115–131)."},"publication":"Förderschwerpunkt Lernen – wohin?","extern":"1"}]