[{"page":"39","publisher":"MDPI AG","_id":"17382","language":[{"iso":"eng"}],"doi":"10.3390/computation8020039","user_id":"71692","volume":8,"year":"2020","title":"Accurate Sampling with Noisy Forces from Approximate Computing","status":"public","publication_identifier":{"issn":["2079-3197"]},"author":[{"full_name":"Rengaraj, Varadarajan","first_name":"Varadarajan","last_name":"Rengaraj"},{"full_name":"Lass, Michael","first_name":"Michael","last_name":"Lass"},{"full_name":"Plessl, Christian","first_name":"Christian","last_name":"Plessl"},{"full_name":"Kühne, Thomas D.","first_name":"Thomas D.","last_name":"Kühne"}],"date_updated":"2022-01-06T06:53:10Z","intvolume":"         8","date_created":"2020-07-14T09:36:31Z","type":"journal_article","publication":"Computation","issue":"2","citation":{"mla":"Rengaraj, Varadarajan, et al. “Accurate Sampling with Noisy Forces from Approximate Computing.” <i>Computation</i>, vol. 8, no. 2, MDPI AG, 2020, p. 39, doi:<a href=\"https://doi.org/10.3390/computation8020039\">10.3390/computation8020039</a>.","bibtex":"@article{Rengaraj_Lass_Plessl_Kühne_2020, title={Accurate Sampling with Noisy Forces from Approximate Computing}, volume={8}, DOI={<a href=\"https://doi.org/10.3390/computation8020039\">10.3390/computation8020039</a>}, number={2}, journal={Computation}, publisher={MDPI AG}, author={Rengaraj, Varadarajan and Lass, Michael and Plessl, Christian and Kühne, Thomas D.}, year={2020}, pages={39} }","ama":"Rengaraj V, Lass M, Plessl C, Kühne TD. Accurate Sampling with Noisy Forces from Approximate Computing. <i>Computation</i>. 2020;8(2):39. doi:<a href=\"https://doi.org/10.3390/computation8020039\">10.3390/computation8020039</a>","ieee":"V. Rengaraj, M. Lass, C. Plessl, and T. D. Kühne, “Accurate Sampling with Noisy Forces from Approximate Computing,” <i>Computation</i>, vol. 8, no. 2, p. 39, 2020.","apa":"Rengaraj, V., Lass, M., Plessl, C., &#38; Kühne, T. D. (2020). Accurate Sampling with Noisy Forces from Approximate Computing. <i>Computation</i>, <i>8</i>(2), 39. <a href=\"https://doi.org/10.3390/computation8020039\">https://doi.org/10.3390/computation8020039</a>","short":"V. Rengaraj, M. Lass, C. Plessl, T.D. Kühne, Computation 8 (2020) 39.","chicago":"Rengaraj, Varadarajan, Michael Lass, Christian Plessl, and Thomas D. Kühne. “Accurate Sampling with Noisy Forces from Approximate Computing.” <i>Computation</i> 8, no. 2 (2020): 39. <a href=\"https://doi.org/10.3390/computation8020039\">https://doi.org/10.3390/computation8020039</a>."},"project":[{"name":"Computing Resources Provided by the Paderborn Center for Parallel Computing","_id":"52"}]},{"type":"journal_article","date_created":"2020-07-14T09:38:11Z","citation":{"apa":"Elgabarty, H., &#38; Kühne, T. D. (2020). Tumbling with a limp: local asymmetry in water’s hydrogen bond network and its consequences. <i>Phys. Chem. Chem. Phys.</i>, <i>22</i>, 10397–10411. <a href=\"https://doi.org/10.1039/C9CP06960G\">https://doi.org/10.1039/C9CP06960G</a>","ieee":"H. Elgabarty and T. D. Kühne, “Tumbling with a limp: local asymmetry in water’s hydrogen bond network and its consequences,” <i>Phys. Chem. Chem. Phys.</i>, vol. 22, pp. 10397–10411, 2020.","chicago":"Elgabarty, Hossam, and Thomas D. Kühne. “Tumbling with a Limp: Local Asymmetry in Water’s Hydrogen Bond Network and Its Consequences.” <i>Phys. Chem. Chem. Phys.</i> 22 (2020): 10397–411. <a href=\"https://doi.org/10.1039/C9CP06960G\">https://doi.org/10.1039/C9CP06960G</a>.","short":"H. Elgabarty, T.D. Kühne, Phys. Chem. Chem. Phys. 22 (2020) 10397–10411.","mla":"Elgabarty, Hossam, and Thomas D. Kühne. “Tumbling with a Limp: Local Asymmetry in Water’s Hydrogen Bond Network and Its Consequences.” <i>Phys. Chem. Chem. Phys.</i>, vol. 22, The Royal Society of Chemistry, 2020, pp. 10397–411, doi:<a href=\"https://doi.org/10.1039/C9CP06960G\">10.1039/C9CP06960G</a>.","ama":"Elgabarty H, Kühne TD. Tumbling with a limp: local asymmetry in water’s hydrogen bond network and its consequences. <i>Phys Chem Chem Phys</i>. 2020;22:10397-10411. doi:<a href=\"https://doi.org/10.1039/C9CP06960G\">10.1039/C9CP06960G</a>","bibtex":"@article{Elgabarty_Kühne_2020, title={Tumbling with a limp: local asymmetry in water’s hydrogen bond network and its consequences}, volume={22}, DOI={<a href=\"https://doi.org/10.1039/C9CP06960G\">10.1039/C9CP06960G</a>}, journal={Phys. Chem. Chem. Phys.}, publisher={The Royal Society of Chemistry}, author={Elgabarty, Hossam and Kühne, Thomas D.}, year={2020}, pages={10397–10411} }"},"publication":"Phys. Chem. Chem. Phys.","volume":22,"doi":"10.1039/C9CP06960G","user_id":"71692","language":[{"iso":"eng"}],"_id":"17384","publisher":"The Royal Society of Chemistry","page":"10397-10411","intvolume":"        22","date_updated":"2022-01-06T06:53:10Z","author":[{"last_name":"Elgabarty","first_name":"Hossam","full_name":"Elgabarty, Hossam"},{"full_name":"Kühne, Thomas D.","first_name":"Thomas D.","last_name":"Kühne"}],"status":"public","title":"Tumbling with a limp: local asymmetry in water's hydrogen bond network and its consequences","year":"2020"},{"date_created":"2020-07-14T09:41:47Z","department":[{"_id":"304"}],"type":"journal_article","publication":"The Journal of Chemical Physics","issue":"19","language":[{"iso":"eng"}],"doi":"10.1063/5.0007045","author":[{"full_name":"Kühne, Thomas D.","first_name":"Thomas D.","last_name":"Kühne"},{"last_name":"Iannuzzi","first_name":"Marcella","full_name":"Iannuzzi, Marcella"},{"full_name":"Del Ben, Mauro","last_name":"Del Ben","first_name":"Mauro"},{"first_name":"Vladimir V.","last_name":"Rybkin","full_name":"Rybkin, Vladimir V."},{"last_name":"Seewald","first_name":"Patrick","full_name":"Seewald, Patrick"},{"first_name":"Frederick","last_name":"Stein","full_name":"Stein, Frederick"},{"first_name":"Teodoro","last_name":"Laino","full_name":"Laino, Teodoro"},{"last_name":"Khaliullin","first_name":"Rustam Z.","full_name":"Khaliullin, Rustam Z."},{"first_name":"Ole","last_name":"Schütt","full_name":"Schütt, Ole"},{"first_name":"Florian","last_name":"Schiffmann","full_name":"Schiffmann, Florian"},{"last_name":"al.","first_name":"et","full_name":"al., et"}],"publication_identifier":{"issn":["1089-7690"]},"title":"CP2K: An electronic structure and molecular dynamics software package - Quickstep: Efficient and accurate electronic structure calculations","year":"2020","intvolume":"       152","date_updated":"2022-01-06T06:53:10Z","citation":{"mla":"Kühne, Thomas D., et al. “CP2K: An Electronic Structure and Molecular Dynamics Software Package - Quickstep: Efficient and Accurate Electronic Structure Calculations.” <i>The Journal of Chemical Physics</i>, vol. 152, no. 19, AIP Publishing, 2020, p. 194103, doi:<a href=\"https://doi.org/10.1063/5.0007045\">10.1063/5.0007045</a>.","bibtex":"@article{Kühne_Iannuzzi_Del Ben_Rybkin_Seewald_Stein_Laino_Khaliullin_Schütt_Schiffmann_et al._2020, title={CP2K: An electronic structure and molecular dynamics software package - Quickstep: Efficient and accurate electronic structure calculations}, volume={152}, DOI={<a href=\"https://doi.org/10.1063/5.0007045\">10.1063/5.0007045</a>}, number={19}, journal={The Journal of Chemical Physics}, publisher={AIP Publishing}, author={Kühne, Thomas D. and Iannuzzi, Marcella and Del Ben, Mauro and Rybkin, Vladimir V. and Seewald, Patrick and Stein, Frederick and Laino, Teodoro and Khaliullin, Rustam Z. and Schütt, Ole and Schiffmann, Florian and et al.}, year={2020}, pages={194103} }","ama":"Kühne TD, Iannuzzi M, Del Ben M, et al. CP2K: An electronic structure and molecular dynamics software package - Quickstep: Efficient and accurate electronic structure calculations. <i>The Journal of Chemical Physics</i>. 2020;152(19):194103. doi:<a href=\"https://doi.org/10.1063/5.0007045\">10.1063/5.0007045</a>","ieee":"T. D. Kühne <i>et al.</i>, “CP2K: An electronic structure and molecular dynamics software package - Quickstep: Efficient and accurate electronic structure calculations,” <i>The Journal of Chemical Physics</i>, vol. 152, no. 19, p. 194103, 2020.","apa":"Kühne, T. D., Iannuzzi, M., Del Ben, M., Rybkin, V. V., Seewald, P., Stein, F., … al.,  et. (2020). CP2K: An electronic structure and molecular dynamics software package - Quickstep: Efficient and accurate electronic structure calculations. <i>The Journal of Chemical Physics</i>, <i>152</i>(19), 194103. <a href=\"https://doi.org/10.1063/5.0007045\">https://doi.org/10.1063/5.0007045</a>","short":"T.D. Kühne, M. Iannuzzi, M. Del Ben, V.V. Rybkin, P. Seewald, F. Stein, T. Laino, R.Z. Khaliullin, O. Schütt, F. Schiffmann,  et al., The Journal of Chemical Physics 152 (2020) 194103.","chicago":"Kühne, Thomas D., Marcella Iannuzzi, Mauro Del Ben, Vladimir V. Rybkin, Patrick Seewald, Frederick Stein, Teodoro Laino, et al. “CP2K: An Electronic Structure and Molecular Dynamics Software Package - Quickstep: Efficient and Accurate Electronic Structure Calculations.” <i>The Journal of Chemical Physics</i> 152, no. 19 (2020): 194103. <a href=\"https://doi.org/10.1063/5.0007045\">https://doi.org/10.1063/5.0007045</a>."},"project":[{"name":"Computing Resources Provided by the Paderborn Center for Parallel Computing","_id":"52"}],"publisher":"AIP Publishing","_id":"17386","page":"194103","volume":152,"user_id":"71692","status":"public"},{"_id":"17433","language":[{"iso":"eng"}],"article_number":"032102","user_id":"42514","doi":"10.1063/5.0009462","publication_identifier":{"issn":["0003-6951","1077-3118"]},"author":[{"full_name":"Wang, D. Q.","first_name":"D. Q.","last_name":"Wang"},{"id":"37763","first_name":"Dirk","last_name":"Reuter","full_name":"Reuter, Dirk"},{"last_name":"Wieck","first_name":"A. D.","full_name":"Wieck, A. D."},{"first_name":"A. R.","last_name":"Hamilton","full_name":"Hamilton, A. R."},{"first_name":"O.","last_name":"Klochan","full_name":"Klochan, O."}],"status":"public","title":"Two-dimensional lateral surface superlattices in GaAs heterostructures with independent control of carrier density and modulation potential","year":"2020","publication_status":"published","date_updated":"2022-01-06T06:53:12Z","date_created":"2020-07-29T08:21:01Z","department":[{"_id":"15"},{"_id":"230"}],"type":"journal_article","citation":{"bibtex":"@article{Wang_Reuter_Wieck_Hamilton_Klochan_2020, title={Two-dimensional lateral surface superlattices in GaAs heterostructures with independent control of carrier density and modulation potential}, DOI={<a href=\"https://doi.org/10.1063/5.0009462\">10.1063/5.0009462</a>}, number={032102}, journal={Applied Physics Letters}, author={Wang, D. Q. and Reuter, Dirk and Wieck, A. D. and Hamilton, A. R. and Klochan, O.}, year={2020} }","ama":"Wang DQ, Reuter D, Wieck AD, Hamilton AR, Klochan O. Two-dimensional lateral surface superlattices in GaAs heterostructures with independent control of carrier density and modulation potential. <i>Applied Physics Letters</i>. 2020. doi:<a href=\"https://doi.org/10.1063/5.0009462\">10.1063/5.0009462</a>","mla":"Wang, D. Q., et al. “Two-Dimensional Lateral Surface Superlattices in GaAs Heterostructures with Independent Control of Carrier Density and Modulation Potential.” <i>Applied Physics Letters</i>, 032102, 2020, doi:<a href=\"https://doi.org/10.1063/5.0009462\">10.1063/5.0009462</a>.","chicago":"Wang, D. Q., Dirk Reuter, A. D. Wieck, A. R. Hamilton, and O. Klochan. “Two-Dimensional Lateral Surface Superlattices in GaAs Heterostructures with Independent Control of Carrier Density and Modulation Potential.” <i>Applied Physics Letters</i>, 2020. <a href=\"https://doi.org/10.1063/5.0009462\">https://doi.org/10.1063/5.0009462</a>.","short":"D.Q. Wang, D. Reuter, A.D. Wieck, A.R. Hamilton, O. Klochan, Applied Physics Letters (2020).","ieee":"D. Q. Wang, D. Reuter, A. D. Wieck, A. R. Hamilton, and O. Klochan, “Two-dimensional lateral surface superlattices in GaAs heterostructures with independent control of carrier density and modulation potential,” <i>Applied Physics Letters</i>, 2020.","apa":"Wang, D. Q., Reuter, D., Wieck, A. D., Hamilton, A. R., &#38; Klochan, O. (2020). Two-dimensional lateral surface superlattices in GaAs heterostructures with independent control of carrier density and modulation potential. <i>Applied Physics Letters</i>. <a href=\"https://doi.org/10.1063/5.0009462\">https://doi.org/10.1063/5.0009462</a>"},"publication":"Applied Physics Letters"},{"language":[{"iso":"eng"}],"_id":"17435","doi":"10.1103/physrevb.101.165429","user_id":"42514","publication_identifier":{"issn":["2469-9950","2469-9969"]},"author":[{"full_name":"Geier, M.","first_name":"M.","last_name":"Geier"},{"full_name":"Freudenfeld, J.","last_name":"Freudenfeld","first_name":"J."},{"last_name":"Silva","first_name":"J. T.","full_name":"Silva, J. T."},{"first_name":"V.","last_name":"Umansky","full_name":"Umansky, V."},{"first_name":"Dirk","last_name":"Reuter","full_name":"Reuter, Dirk","id":"37763"},{"full_name":"Wieck, A. D.","first_name":"A. D.","last_name":"Wieck"},{"last_name":"Brouwer","first_name":"P. W.","full_name":"Brouwer, P. W."},{"full_name":"Ludwig, S.","last_name":"Ludwig","first_name":"S."}],"status":"public","year":"2020","title":"Electrostatic potential shape of gate-defined quantum point contacts","date_updated":"2022-01-06T06:53:12Z","publication_status":"published","date_created":"2020-07-29T08:27:47Z","department":[{"_id":"15"},{"_id":"230"}],"type":"journal_article","citation":{"mla":"Geier, M., et al. “Electrostatic Potential Shape of Gate-Defined Quantum Point Contacts.” <i>Physical Review B</i>, 2020, doi:<a href=\"https://doi.org/10.1103/physrevb.101.165429\">10.1103/physrevb.101.165429</a>.","apa":"Geier, M., Freudenfeld, J., Silva, J. T., Umansky, V., Reuter, D., Wieck, A. D., … Ludwig, S. (2020). Electrostatic potential shape of gate-defined quantum point contacts. <i>Physical Review B</i>. <a href=\"https://doi.org/10.1103/physrevb.101.165429\">https://doi.org/10.1103/physrevb.101.165429</a>","ieee":"M. Geier <i>et al.</i>, “Electrostatic potential shape of gate-defined quantum point contacts,” <i>Physical Review B</i>, 2020.","short":"M. Geier, J. Freudenfeld, J.T. Silva, V. Umansky, D. Reuter, A.D. Wieck, P.W. Brouwer, S. Ludwig, Physical Review B (2020).","ama":"Geier M, Freudenfeld J, Silva JT, et al. Electrostatic potential shape of gate-defined quantum point contacts. <i>Physical Review B</i>. 2020. doi:<a href=\"https://doi.org/10.1103/physrevb.101.165429\">10.1103/physrevb.101.165429</a>","chicago":"Geier, M., J. Freudenfeld, J. T. Silva, V. Umansky, Dirk Reuter, A. D. Wieck, P. W. Brouwer, and S. Ludwig. “Electrostatic Potential Shape of Gate-Defined Quantum Point Contacts.” <i>Physical Review B</i>, 2020. <a href=\"https://doi.org/10.1103/physrevb.101.165429\">https://doi.org/10.1103/physrevb.101.165429</a>.","bibtex":"@article{Geier_Freudenfeld_Silva_Umansky_Reuter_Wieck_Brouwer_Ludwig_2020, title={Electrostatic potential shape of gate-defined quantum point contacts}, DOI={<a href=\"https://doi.org/10.1103/physrevb.101.165429\">10.1103/physrevb.101.165429</a>}, journal={Physical Review B}, author={Geier, M. and Freudenfeld, J. and Silva, J. T. and Umansky, V. and Reuter, Dirk and Wieck, A. D. and Brouwer, P. W. and Ludwig, S.}, year={2020} }"},"publication":"Physical Review B"},{"citation":{"apa":"Javaid Iqbal, M., Reuter, D., Wieck, A. D., &#38; van der Wal, C. (2020). Characterization of low-resistance ohmic contacts to a two-dimensional electron gas in a GaAs/AlGaAs heterostructure. <i>The European Physical Journal Applied Physics</i>. <a href=\"https://doi.org/10.1051/epjap/2020190202\">https://doi.org/10.1051/epjap/2020190202</a>","ieee":"M. Javaid Iqbal, D. Reuter, A. D. Wieck, and C. van der Wal, “Characterization of low-resistance ohmic contacts to a two-dimensional electron gas in a GaAs/AlGaAs heterostructure,” <i>The European Physical Journal Applied Physics</i>, 2020.","chicago":"Javaid Iqbal, Muhammad, Dirk Reuter, Andreas Dirk Wieck, and Caspar van der Wal. “Characterization of Low-Resistance Ohmic Contacts to a Two-Dimensional Electron Gas in a GaAs/AlGaAs Heterostructure.” <i>The European Physical Journal Applied Physics</i>, 2020. <a href=\"https://doi.org/10.1051/epjap/2020190202\">https://doi.org/10.1051/epjap/2020190202</a>.","short":"M. Javaid Iqbal, D. Reuter, A.D. Wieck, C. van der Wal, The European Physical Journal Applied Physics (2020).","mla":"Javaid Iqbal, Muhammad, et al. “Characterization of Low-Resistance Ohmic Contacts to a Two-Dimensional Electron Gas in a GaAs/AlGaAs Heterostructure.” <i>The European Physical Journal Applied Physics</i>, 20101, 2020, doi:<a href=\"https://doi.org/10.1051/epjap/2020190202\">10.1051/epjap/2020190202</a>.","ama":"Javaid Iqbal M, Reuter D, Wieck AD, van der Wal C. Characterization of low-resistance ohmic contacts to a two-dimensional electron gas in a GaAs/AlGaAs heterostructure. <i>The European Physical Journal Applied Physics</i>. 2020. doi:<a href=\"https://doi.org/10.1051/epjap/2020190202\">10.1051/epjap/2020190202</a>","bibtex":"@article{Javaid Iqbal_Reuter_Wieck_van der Wal_2020, title={Characterization of low-resistance ohmic contacts to a two-dimensional electron gas in a GaAs/AlGaAs heterostructure}, DOI={<a href=\"https://doi.org/10.1051/epjap/2020190202\">10.1051/epjap/2020190202</a>}, number={20101}, journal={The European Physical Journal Applied Physics}, author={Javaid Iqbal, Muhammad and Reuter, Dirk and Wieck, Andreas Dirk and van der Wal, Caspar}, year={2020} }"},"publication":"The European Physical Journal Applied Physics","abstract":[{"lang":"eng","text":"<jats:p>The study of electron transport in low-dimensional systems is of importance, not only from a fundamental point of view, but also for future electronic and spintronic devices. In this context heterostructures containing a two-dimensional electron gas (2DEG) are a key technology. In particular GaAs/AlGaAs heterostructures, with a 2DEG at typically 100 nm below the surface, are widely studied. In order to explore electron transport in such systems, low-resistance ohmic contacts are required that connect the 2DEG to macroscopic measurement leads at the surface. Here we report on designing and measuring a dedicated device for unraveling the various resistance contributions in such contacts, which include pristine 2DEG series resistance, the 2DEG resistance under a contact, the contact resistance itself, and the influence of pressing a bonding wire onto a contact. We also report here a recipe for contacts with very low resistance values that remain below 10 Ω for annealing times between 20 and 350 s, hence providing the flexibility to use this method for materials with different 2DEG depths. The type of heating, temperature ramp rate and gas forming used for annealing is found to strongly influence the annealing process and hence the quality of the resulting contacts.</jats:p>"}],"date_created":"2020-07-29T08:29:26Z","department":[{"_id":"15"},{"_id":"230"}],"type":"journal_article","author":[{"first_name":"Muhammad","last_name":"Javaid Iqbal","full_name":"Javaid Iqbal, Muhammad"},{"first_name":"Dirk","last_name":"Reuter","full_name":"Reuter, Dirk","id":"37763"},{"last_name":"Wieck","first_name":"Andreas Dirk","full_name":"Wieck, Andreas Dirk"},{"last_name":"van der Wal","first_name":"Caspar","full_name":"van der Wal, Caspar"}],"publication_identifier":{"issn":["1286-0042","1286-0050"]},"status":"public","title":"Characterization of low-resistance ohmic contacts to a two-dimensional electron gas in a GaAs/AlGaAs heterostructure","year":"2020","date_updated":"2022-01-06T06:53:12Z","publication_status":"published","language":[{"iso":"eng"}],"_id":"17436","article_number":"20101","doi":"10.1051/epjap/2020190202","user_id":"42514"},{"publication":"Physical Review B","citation":{"bibtex":"@article{Ebler_Labud_Rai_Reuter_Wieck_Ludwig_2020, title={Electrical detection of excitonic states by time-resolved conductance measurements}, DOI={<a href=\"https://doi.org/10.1103/physrevb.101.125303\">10.1103/physrevb.101.125303</a>}, journal={Physical Review B}, author={Ebler, C. and Labud, P. A. and Rai, A. K. and Reuter, Dirk and Wieck, A. D. and Ludwig, A.}, year={2020} }","ama":"Ebler C, Labud PA, Rai AK, Reuter D, Wieck AD, Ludwig A. Electrical detection of excitonic states by time-resolved conductance measurements. <i>Physical Review B</i>. 2020. doi:<a href=\"https://doi.org/10.1103/physrevb.101.125303\">10.1103/physrevb.101.125303</a>","mla":"Ebler, C., et al. “Electrical Detection of Excitonic States by Time-Resolved Conductance Measurements.” <i>Physical Review B</i>, 2020, doi:<a href=\"https://doi.org/10.1103/physrevb.101.125303\">10.1103/physrevb.101.125303</a>.","chicago":"Ebler, C., P. A. Labud, A. K. Rai, Dirk Reuter, A. D. Wieck, and A. Ludwig. “Electrical Detection of Excitonic States by Time-Resolved Conductance Measurements.” <i>Physical Review B</i>, 2020. <a href=\"https://doi.org/10.1103/physrevb.101.125303\">https://doi.org/10.1103/physrevb.101.125303</a>.","short":"C. Ebler, P.A. Labud, A.K. Rai, D. Reuter, A.D. Wieck, A. Ludwig, Physical Review B (2020).","ieee":"C. Ebler, P. A. Labud, A. K. Rai, D. Reuter, A. D. Wieck, and A. Ludwig, “Electrical detection of excitonic states by time-resolved conductance measurements,” <i>Physical Review B</i>, 2020.","apa":"Ebler, C., Labud, P. A., Rai, A. K., Reuter, D., Wieck, A. D., &#38; Ludwig, A. (2020). Electrical detection of excitonic states by time-resolved conductance measurements. <i>Physical Review B</i>. <a href=\"https://doi.org/10.1103/physrevb.101.125303\">https://doi.org/10.1103/physrevb.101.125303</a>"},"type":"journal_article","department":[{"_id":"15"},{"_id":"230"}],"date_created":"2020-07-29T08:30:34Z","publication_status":"published","date_updated":"2022-01-06T06:53:12Z","year":"2020","title":"Electrical detection of excitonic states by time-resolved conductance measurements","status":"public","publication_identifier":{"issn":["2469-9950","2469-9969"]},"author":[{"last_name":"Ebler","first_name":"C.","full_name":"Ebler, C."},{"first_name":"P. A.","last_name":"Labud","full_name":"Labud, P. A."},{"full_name":"Rai, A. K.","last_name":"Rai","first_name":"A. K."},{"id":"37763","last_name":"Reuter","first_name":"Dirk","full_name":"Reuter, Dirk"},{"first_name":"A. D.","last_name":"Wieck","full_name":"Wieck, A. D."},{"full_name":"Ludwig, A.","first_name":"A.","last_name":"Ludwig"}],"user_id":"42514","doi":"10.1103/physrevb.101.125303","_id":"17437","language":[{"iso":"eng"}]},{"intvolume":"     12156","date_updated":"2022-01-06T06:53:20Z","publication_identifier":{"isbn":["978-3-030-54920-6"]},"status":"public","year":"2020","title":"Structural Information and Communication Complexity - 27th International Colloquium, SIROCCO 2020, Paderborn, Germany, June 29 - July 1, 2020, Proceedings","editor":[{"last_name":"Werneck Richa","first_name":"Andrea","full_name":"Werneck Richa, Andrea"},{"id":"20792","first_name":"Christian","last_name":"Scheideler","full_name":"Scheideler, Christian"}],"volume":12156,"doi":"10.1007/978-3-030-54921-3","user_id":"15504","_id":"17836","series_title":"Lecture Notes in Computer Science","publisher":"Springer","language":[{"iso":"eng"}],"project":[{"_id":"1","name":"SFB 901"},{"_id":"5","name":"SFB 901 - Subproject A1"},{"name":"SFB 901 - Project Area A","_id":"2"}],"citation":{"ieee":"A. Werneck Richa and C. Scheideler, Eds., <i>Structural Information and Communication Complexity - 27th International Colloquium, SIROCCO 2020, Paderborn, Germany, June 29 - July 1, 2020, Proceedings</i>, vol. 12156. Springer, 2020.","apa":"Werneck Richa, A., &#38; Scheideler, C. (Eds.). (2020). <i>Structural Information and Communication Complexity - 27th International Colloquium, SIROCCO 2020, Paderborn, Germany, June 29 - July 1, 2020, Proceedings</i> (Vol. 12156). Springer. <a href=\"https://doi.org/10.1007/978-3-030-54921-3\">https://doi.org/10.1007/978-3-030-54921-3</a>","chicago":"Werneck Richa, Andrea, and Christian Scheideler, eds. <i>Structural Information and Communication Complexity - 27th International Colloquium, SIROCCO 2020, Paderborn, Germany, June 29 - July 1, 2020, Proceedings</i>. Vol. 12156. Lecture Notes in Computer Science. Springer, 2020. <a href=\"https://doi.org/10.1007/978-3-030-54921-3\">https://doi.org/10.1007/978-3-030-54921-3</a>.","short":"A. Werneck Richa, C. Scheideler, eds., Structural Information and Communication Complexity - 27th International Colloquium, SIROCCO 2020, Paderborn, Germany, June 29 - July 1, 2020, Proceedings, Springer, 2020.","mla":"Werneck Richa, Andrea, and Christian Scheideler, editors. <i>Structural Information and Communication Complexity - 27th International Colloquium, SIROCCO 2020, Paderborn, Germany, June 29 - July 1, 2020, Proceedings</i>. Vol. 12156, Springer, 2020, doi:<a href=\"https://doi.org/10.1007/978-3-030-54921-3\">10.1007/978-3-030-54921-3</a>.","bibtex":"@book{Werneck Richa_Scheideler_2020, series={Lecture Notes in Computer Science}, title={Structural Information and Communication Complexity - 27th International Colloquium, SIROCCO 2020, Paderborn, Germany, June 29 - July 1, 2020, Proceedings}, volume={12156}, DOI={<a href=\"https://doi.org/10.1007/978-3-030-54921-3\">10.1007/978-3-030-54921-3</a>}, publisher={Springer}, year={2020}, collection={Lecture Notes in Computer Science} }","ama":"Werneck Richa A, Scheideler C, eds. <i>Structural Information and Communication Complexity - 27th International Colloquium, SIROCCO 2020, Paderborn, Germany, June 29 - July 1, 2020, Proceedings</i>. Vol 12156. Springer; 2020. doi:<a href=\"https://doi.org/10.1007/978-3-030-54921-3\">10.1007/978-3-030-54921-3</a>"},"department":[{"_id":"79"}],"type":"conference_editor","date_created":"2020-08-12T07:54:22Z"},{"language":[{"iso":"eng"}],"_id":"17839","publisher":"ACM","doi":"10.1145/3350755","user_id":"15504","editor":[{"id":"20792","last_name":"Scheideler","first_name":"Christian","full_name":"Scheideler, Christian"},{"last_name":"Spear","first_name":"Michael","full_name":"Spear, Michael"}],"status":"public","title":"SPAA '20: 32nd ACM Symposium on Parallelism in Algorithms and Architectures, Virtual Event, USA, July 15-17, 2020","year":"2020","publication_identifier":{"isbn":["978-1-4503-6935-0"]},"date_updated":"2022-01-06T06:53:20Z","date_created":"2020-08-12T07:57:10Z","type":"conference_editor","department":[{"_id":"79"}],"citation":{"ieee":"C. Scheideler and M. Spear, Eds., <i>SPAA ’20: 32nd ACM Symposium on Parallelism in Algorithms and Architectures, Virtual Event, USA, July 15-17, 2020</i>. ACM, 2020.","apa":"Scheideler, C., &#38; Spear, M. (Eds.). (2020). <i>SPAA ’20: 32nd ACM Symposium on Parallelism in Algorithms and Architectures, Virtual Event, USA, July 15-17, 2020</i>. ACM. <a href=\"https://doi.org/10.1145/3350755\">https://doi.org/10.1145/3350755</a>","chicago":"Scheideler, Christian, and Michael Spear, eds. <i>SPAA ’20: 32nd ACM Symposium on Parallelism in Algorithms and Architectures, Virtual Event, USA, July 15-17, 2020</i>. ACM, 2020. <a href=\"https://doi.org/10.1145/3350755\">https://doi.org/10.1145/3350755</a>.","short":"C. Scheideler, M. Spear, eds., SPAA ’20: 32nd ACM Symposium on Parallelism in Algorithms and Architectures, Virtual Event, USA, July 15-17, 2020, ACM, 2020.","mla":"Scheideler, Christian, and Michael Spear, editors. <i>SPAA ’20: 32nd ACM Symposium on Parallelism in Algorithms and Architectures, Virtual Event, USA, July 15-17, 2020</i>. ACM, 2020, doi:<a href=\"https://doi.org/10.1145/3350755\">10.1145/3350755</a>.","bibtex":"@book{Scheideler_Spear_2020, title={SPAA ’20: 32nd ACM Symposium on Parallelism in Algorithms and Architectures, Virtual Event, USA, July 15-17, 2020}, DOI={<a href=\"https://doi.org/10.1145/3350755\">10.1145/3350755</a>}, publisher={ACM}, year={2020} }","ama":"Scheideler C, Spear M, eds. <i>SPAA ’20: 32nd ACM Symposium on Parallelism in Algorithms and Architectures, Virtual Event, USA, July 15-17, 2020</i>. ACM; 2020. doi:<a href=\"https://doi.org/10.1145/3350755\">10.1145/3350755</a>"},"project":[{"name":"SFB 901","_id":"1"},{"_id":"2","name":"SFB 901 - Project Area A"},{"_id":"5","name":"SFB 901 - Subproject A1"}]},{"_id":"18779","language":[{"iso":"ger"}],"publisher":"(im Druck)","user_id":"21240","editor":[{"first_name":"Isabelle","last_name":"Chave","full_name":"Chave, Isabelle"}],"status":"public","title":"Die Wiedereinrichtung der Bauhütten in Europa im 19. und 20. Jahrhundert","year":"2020","author":[{"id":"499","full_name":"Seng, Eva- Maria","first_name":"Eva- Maria","last_name":"Seng"},{"full_name":"Silvestri, Marco","last_name":"Silvestri","first_name":"Marco"}],"date_updated":"2022-01-06T06:53:52Z","date_created":"2020-09-01T12:30:25Z","place":"Paris","type":"book_chapter","department":[{"_id":"443"}],"publication":"LE CHANTIER CATHÉDRAL EN EUROPE diffusion et sauvegarde des savoirs, savoir-faire et matériaux du Moyen Âge à nos jours","citation":{"ieee":"E.-M. Seng and M. Silvestri, “Die Wiedereinrichtung der Bauhütten in Europa im 19. und 20. Jahrhundert,” in <i>LE CHANTIER CATHÉDRAL EN EUROPE diffusion et sauvegarde des savoirs, savoir-faire et matériaux du Moyen Âge à nos jours</i>, I. Chave, Ed. Paris: (im Druck), 2020.","apa":"Seng, E.-M., &#38; Silvestri, M. (2020). Die Wiedereinrichtung der Bauhütten in Europa im 19. und 20. Jahrhundert. In I. Chave (Ed.), <i>LE CHANTIER CATHÉDRAL EN EUROPE diffusion et sauvegarde des savoirs, savoir-faire et matériaux du Moyen Âge à nos jours</i>. Paris: (im Druck).","short":"E.-M. Seng, M. Silvestri, in: I. Chave (Ed.), LE CHANTIER CATHÉDRAL EN EUROPE diffusion et sauvegarde des savoirs, savoir-faire et matériaux du Moyen Âge à nos jours, (im Druck), Paris, 2020.","chicago":"Seng, Eva- Maria, and Marco Silvestri. “Die Wiedereinrichtung der Bauhütten in Europa im 19. und 20. Jahrhundert.” In <i>LE CHANTIER CATHÉDRAL EN EUROPE diffusion et sauvegarde des savoirs, savoir-faire et matériaux du Moyen Âge à nos jours</i>, edited by Isabelle Chave. Paris: (im Druck), 2020.","mla":"Seng, Eva-Maria, and Marco Silvestri. “Die Wiedereinrichtung der Bauhütten in Europa im 19. und 20. Jahrhundert.” <i>LE CHANTIER CATHÉDRAL EN EUROPE diffusion et sauvegarde des savoirs, savoir-faire et matériaux du Moyen Âge à nos jours</i>, edited by Isabelle Chave, (im Druck), 2020.","bibtex":"@inbook{Seng_Silvestri_2020, place={Paris}, title={Die Wiedereinrichtung der Bauhütten in Europa im 19. und 20. Jahrhundert}, booktitle={LE CHANTIER CATHÉDRAL EN EUROPE diffusion et sauvegarde des savoirs, savoir-faire et matériaux du Moyen Âge à nos jours}, publisher={(im Druck)}, author={Seng, Eva- Maria and Silvestri, Marco}, editor={Chave, IsabelleEditor}, year={2020} }","ama":"Seng E-M, Silvestri M. Die Wiedereinrichtung der Bauhütten in Europa im 19. und 20. Jahrhundert. In: Chave I, ed. <i>LE CHANTIER CATHÉDRAL EN EUROPE diffusion et sauvegarde des savoirs, savoir-faire et matériaux du Moyen Âge à nos jours</i>. Paris: (im Druck); 2020."}},{"type":"book_chapter","department":[{"_id":"534"},{"_id":"624"},{"_id":"27"},{"_id":"66"},{"_id":"219"}],"place":"Cham","date_created":"2020-09-01T13:49:42Z","publication":"Industrializing Additive Manufacturing","citation":{"mla":"Nickchen, Tobias, et al. “Opportunities of 3D Machine Learning for Manufacturability Analysis and Component Recognition in the Additive Manufacturing Process Chain.” <i>Industrializing Additive Manufacturing</i>, 2020, doi:<a href=\"https://doi.org/10.1007/978-3-030-54334-1_4\">10.1007/978-3-030-54334-1_4</a>.","ama":"Nickchen T, Engels G, Lohn J. Opportunities of 3D Machine Learning for Manufacturability Analysis and Component Recognition in the Additive Manufacturing Process Chain. In: <i>Industrializing Additive Manufacturing</i>. Cham; 2020. doi:<a href=\"https://doi.org/10.1007/978-3-030-54334-1_4\">10.1007/978-3-030-54334-1_4</a>","bibtex":"@inbook{Nickchen_Engels_Lohn_2020, place={Cham}, title={Opportunities of 3D Machine Learning for Manufacturability Analysis and Component Recognition in the Additive Manufacturing Process Chain}, DOI={<a href=\"https://doi.org/10.1007/978-3-030-54334-1_4\">10.1007/978-3-030-54334-1_4</a>}, booktitle={Industrializing Additive Manufacturing}, author={Nickchen, Tobias and Engels, Gregor and Lohn, Johannes}, year={2020} }","apa":"Nickchen, T., Engels, G., &#38; Lohn, J. (2020). Opportunities of 3D Machine Learning for Manufacturability Analysis and Component Recognition in the Additive Manufacturing Process Chain. In <i>Industrializing Additive Manufacturing</i>. Cham. <a href=\"https://doi.org/10.1007/978-3-030-54334-1_4\">https://doi.org/10.1007/978-3-030-54334-1_4</a>","ieee":"T. Nickchen, G. Engels, and J. Lohn, “Opportunities of 3D Machine Learning for Manufacturability Analysis and Component Recognition in the Additive Manufacturing Process Chain,” in <i>Industrializing Additive Manufacturing</i>, Cham, 2020.","chicago":"Nickchen, Tobias, Gregor Engels, and Johannes Lohn. “Opportunities of 3D Machine Learning for Manufacturability Analysis and Component Recognition in the Additive Manufacturing Process Chain.” In <i>Industrializing Additive Manufacturing</i>. Cham, 2020. <a href=\"https://doi.org/10.1007/978-3-030-54334-1_4\">https://doi.org/10.1007/978-3-030-54334-1_4</a>.","short":"T. Nickchen, G. Engels, J. Lohn, in: Industrializing Additive Manufacturing, Cham, 2020."},"ddc":["000"],"doi":"10.1007/978-3-030-54334-1_4","user_id":"27340","_id":"18789","language":[{"iso":"eng"}],"date_updated":"2022-01-06T06:53:52Z","publication_status":"published","status":"public","year":"2020","title":"Opportunities of 3D Machine Learning for Manufacturability Analysis and Component Recognition in the Additive Manufacturing Process Chain","conference":{"end_date":"2020-09-03","start_date":"2020-09-01"},"publication_identifier":{"isbn":["9783030543334","9783030543341"]},"author":[{"last_name":"Nickchen","first_name":"Tobias","full_name":"Nickchen, Tobias"},{"last_name":"Engels","first_name":"Gregor","full_name":"Engels, Gregor"},{"first_name":"Johannes","last_name":"Lohn","full_name":"Lohn, Johannes"}]},{"_id":"19178","language":[{"iso":"ger"}],"user_id":"32252","conference":{"end_date":"2020-03-04","location":"Würzburg","start_date":"2020-03-03","name":"20. Kolloquium Gemeinsame Forschung in der Klebtechnik"},"author":[{"id":"32252","last_name":"Kowatz","first_name":"Jannik","full_name":"Kowatz, Jannik"},{"id":"537","last_name":"Teutenberg","first_name":"Dominik","full_name":"Teutenberg, Dominik"},{"first_name":"Gerson","orcid":"0000-0002-2763-1246","last_name":"Meschut","full_name":"Meschut, Gerson","id":"32056"}],"corporate_editor":["DECHEMA, Gesellschaft für Chemische Technik und Biotechnologie e.V."],"title":"Auslegungsmethode für zyklisch beanspruchte Stahl/CFK-Klebverbindungen unter besonderer Berücksichtigung des Rissfortschritts","status":"public","year":"2020","date_updated":"2022-01-06T06:53:59Z","date_created":"2020-09-09T07:54:20Z","department":[{"_id":"157"}],"type":"conference","citation":{"bibtex":"@inproceedings{Kowatz_Teutenberg_Meschut_2020, title={Auslegungsmethode für zyklisch beanspruchte Stahl/CFK-Klebverbindungen unter besonderer Berücksichtigung des Rissfortschritts}, booktitle={20. Kolloquium Gemeinsame Forschung in der Klebtechnik}, author={Kowatz, Jannik and Teutenberg, Dominik and Meschut, Gerson}, editor={DECHEMA, Gesellschaft für Chemische Technik und Biotechnologie e.V.Editor}, year={2020} }","ama":"Kowatz J, Teutenberg D, Meschut G. Auslegungsmethode für zyklisch beanspruchte Stahl/CFK-Klebverbindungen unter besonderer Berücksichtigung des Rissfortschritts. In: DECHEMA, Gesellschaft für Chemische Technik und Biotechnologie e.V., ed. <i>20. Kolloquium Gemeinsame Forschung in der Klebtechnik</i>. ; 2020.","mla":"Kowatz, Jannik, et al. “Auslegungsmethode für zyklisch beanspruchte Stahl/CFK-Klebverbindungen unter besonderer Berücksichtigung des Rissfortschritts.” <i>20. Kolloquium Gemeinsame Forschung in der Klebtechnik</i>, edited by DECHEMA, Gesellschaft für Chemische Technik und Biotechnologie e.V., 2020.","chicago":"Kowatz, Jannik, Dominik Teutenberg, and Gerson Meschut. “Auslegungsmethode für zyklisch beanspruchte Stahl/CFK-Klebverbindungen unter besonderer Berücksichtigung des Rissfortschritts.” In <i>20. Kolloquium Gemeinsame Forschung in der Klebtechnik</i>, edited by DECHEMA, Gesellschaft für Chemische Technik und Biotechnologie e.V., 2020.","short":"J. Kowatz, D. Teutenberg, G. Meschut, in: DECHEMA, Gesellschaft für Chemische Technik und Biotechnologie e.V. (Ed.), 20. Kolloquium Gemeinsame Forschung in der Klebtechnik, 2020.","ieee":"J. Kowatz, D. Teutenberg, and G. Meschut, “Auslegungsmethode für zyklisch beanspruchte Stahl/CFK-Klebverbindungen unter besonderer Berücksichtigung des Rissfortschritts,” in <i>20. Kolloquium Gemeinsame Forschung in der Klebtechnik</i>, Würzburg, 2020.","apa":"Kowatz, J., Teutenberg, D., &#38; Meschut, G. (2020). Auslegungsmethode für zyklisch beanspruchte Stahl/CFK-Klebverbindungen unter besonderer Berücksichtigung des Rissfortschritts. In DECHEMA, Gesellschaft für Chemische Technik und Biotechnologie e.V. (Ed.), <i>20. Kolloquium Gemeinsame Forschung in der Klebtechnik</i>. Würzburg."},"publication":"20. Kolloquium Gemeinsame Forschung in der Klebtechnik"},{"date_updated":"2022-01-06T06:55:56Z","year":"2020","status":"public","title":"Which future do we want? It's up to us! - 4 future scenarios for automation 2030","author":[{"full_name":"Gräßler, Iris","orcid":"0000-0001-5765-971X","last_name":"Gräßler","first_name":"Iris","id":"47565"},{"full_name":"Bettenhausen, Kurt D.","first_name":"Kurt D.","last_name":"Bettenhausen"},{"full_name":"Bilgic, Attila M.","first_name":"Attila M.","last_name":"Bilgic"},{"full_name":"Dirzus, Dagmar","first_name":"Dagmar","last_name":"Dirzus"}],"user_id":"77594","page":"500-507","main_file_link":[{"url":"https://doi.org/10.1515/auto-2020-0057"}],"language":[{"iso":"eng"}],"_id":"23515","issue":"68 (6)","publication":"at-Automatisierungstechnik 68(6)","citation":{"apa":"Gräßler, I., Bettenhausen, K. D., Bilgic, A. M., &#38; Dirzus, D. (2020). Which future do we want? It’s up to us! - 4 future scenarios for automation 2030. <i>At-Automatisierungstechnik 68(6)</i>, <i>68 (6)</i>, 500–507.","mla":"Gräßler, Iris, et al. “Which Future Do We Want? It’s up to Us! - 4 Future Scenarios for Automation 2030.” <i>At-Automatisierungstechnik 68(6)</i>, no. 68 (6), 2020, pp. 500–07.","ieee":"I. Gräßler, K. D. Bettenhausen, A. M. Bilgic, and D. Dirzus, “Which future do we want? It’s up to us! - 4 future scenarios for automation 2030,” <i>at-Automatisierungstechnik 68(6)</i>, no. 68 (6), pp. 500–507, 2020.","chicago":"Gräßler, Iris, Kurt D. Bettenhausen, Attila M. Bilgic, and Dagmar Dirzus. “Which Future Do We Want? It’s up to Us! - 4 Future Scenarios for Automation 2030.” <i>At-Automatisierungstechnik 68(6)</i>, no. 68 (6) (2020): 500–507.","ama":"Gräßler I, Bettenhausen KD, Bilgic AM, Dirzus D. Which future do we want? It’s up to us! - 4 future scenarios for automation 2030. <i>at-Automatisierungstechnik 68(6)</i>. 2020;(68 (6)):500-507.","short":"I. Gräßler, K.D. Bettenhausen, A.M. Bilgic, D. Dirzus, At-Automatisierungstechnik 68(6) (2020) 500–507.","bibtex":"@article{Gräßler_Bettenhausen_Bilgic_Dirzus_2020, title={Which future do we want? It’s up to us! - 4 future scenarios for automation 2030}, number={68 (6)}, journal={at-Automatisierungstechnik 68(6)}, author={Gräßler, Iris and Bettenhausen, Kurt D. and Bilgic, Attila M. and Dirzus, Dagmar}, year={2020}, pages={500–507} }"},"type":"journal_article","department":[{"_id":"152"}],"date_created":"2021-08-24T09:54:30Z"},{"citation":{"short":"I. Gräßler, P. Scholle, H. Thiele, in: V. Sandor (Ed.), Integrated Design Engineering. Interdisciplinary and Holistic Product Development, Springer International Publishing Switzerland, 2020, pp. 507–529.","chicago":"Gräßler, Iris, Philipp Scholle, and Henrik Thiele. “Scenario Technique.” In <i>Integrated Design Engineering. Interdisciplinary and Holistic Product Development</i>, edited by Vajna Sandor, 507–29. Kapitel 20. Springer International Publishing Switzerland, 2020. <a href=\"https://doi.org/10.1007/978-3-030-19357-7\">https://doi.org/10.1007/978-3-030-19357-7</a>.","apa":"Gräßler, I., Scholle, P., &#38; Thiele, H. (2020). Scenario Technique. In V. Sandor (Ed.), <i>Integrated Design Engineering. Interdisciplinary and Holistic Product Development</i> (pp. 507–529). Springer International Publishing Switzerland. <a href=\"https://doi.org/10.1007/978-3-030-19357-7\">https://doi.org/10.1007/978-3-030-19357-7</a>","ieee":"I. Gräßler, P. Scholle, and H. Thiele, “Scenario Technique,” in <i>Integrated Design Engineering. Interdisciplinary and Holistic Product Development</i>, V. Sandor, Ed. Springer International Publishing Switzerland, 2020, pp. 507–529.","ama":"Gräßler I, Scholle P, Thiele H. Scenario Technique. In: Sandor V, ed. <i>Integrated Design Engineering. Interdisciplinary and Holistic Product Development</i>. Kapitel 20. Springer International Publishing Switzerland; 2020:507-529. doi:<a href=\"https://doi.org/10.1007/978-3-030-19357-7\">10.1007/978-3-030-19357-7</a>","bibtex":"@inbook{Gräßler_Scholle_Thiele_2020, series={Kapitel 20}, title={Scenario Technique}, DOI={<a href=\"https://doi.org/10.1007/978-3-030-19357-7\">10.1007/978-3-030-19357-7</a>}, booktitle={Integrated Design Engineering. Interdisciplinary and Holistic Product Development}, publisher={Springer International Publishing Switzerland}, author={Gräßler, Iris and Scholle, Philipp and Thiele, Henrik}, editor={Sandor, VajnaEditor}, year={2020}, pages={507–529}, collection={Kapitel 20} }","mla":"Gräßler, Iris, et al. “Scenario Technique.” <i>Integrated Design Engineering. Interdisciplinary and Holistic Product Development</i>, edited by Vajna Sandor, Springer International Publishing Switzerland, 2020, pp. 507–29, doi:<a href=\"https://doi.org/10.1007/978-3-030-19357-7\">10.1007/978-3-030-19357-7</a>."},"publication":"Integrated Design Engineering. Interdisciplinary and Holistic Product Development","department":[{"_id":"152"}],"type":"book_chapter","date_created":"2021-08-25T12:52:04Z","date_updated":"2022-01-06T06:55:56Z","publication_identifier":{"isbn":["978-3-030-19356-0"]},"author":[{"full_name":"Gräßler, Iris","last_name":"Gräßler","first_name":"Iris","orcid":"0000-0001-5765-971X","id":"47565"},{"last_name":"Scholle","first_name":"Philipp","full_name":"Scholle, Philipp"},{"id":"33419","last_name":"Thiele","first_name":"Henrik","full_name":"Thiele, Henrik"}],"title":"Scenario Technique","status":"public","year":"2020","editor":[{"full_name":"Sandor, Vajna","first_name":"Vajna","last_name":"Sandor"}],"user_id":"21240","doi":"10.1007/978-3-030-19357-7","_id":"23522","series_title":"Kapitel 20","publisher":"Springer International Publishing Switzerland","language":[{"iso":"eng"}],"page":"507-529"},{"type":"journal_article","department":[{"_id":"633"}],"date_created":"2021-09-01T09:07:00Z","abstract":[{"text":"<jats:p>Grazing-incidence wide-angle X-ray scattering (GIWAXS) has become an increasingly popular technique for quantitative structural characterization and comparison of thin films. For this purpose, accurate intensity normalization and peak position determination are crucial. At present, few tools exist to estimate the uncertainties of these measurements. Here, a simulation package is introduced called <jats:italic>GIWAXS-SIIRkit</jats:italic>, where SIIR stands for scattering intensity, indexing and refraction. The package contains several tools that are freely available for download and can be executed in MATLAB. The package includes three functionalities: estimation of the relative scattering intensity and the corresponding uncertainty based on experimental setup and sample dimensions; extraction and indexing of peak positions to approximate the crystal structure of organic materials starting from calibrated GIWAXS patterns; and analysis of the effects of refraction on peak positions. Each tool is based on a graphical user interface and designed to have a short learning curve. A user guide is provided with detailed usage instruction, tips for adding functionality and customization, and exemplary files.</jats:p>","lang":"eng"}],"publication":"Journal of Applied Crystallography","citation":{"ama":"Savikhin V, Steinrück H-G, Liang R-Z, et al. GIWAXS-SIIRkit: scattering intensity, indexing and refraction calculation toolkit for grazing-incidence wide-angle X-ray scattering of organic materials. <i>Journal of Applied Crystallography</i>. 2020;53:1108-1129. doi:<a href=\"https://doi.org/10.1107/s1600576720005476\">10.1107/s1600576720005476</a>","bibtex":"@article{Savikhin_Steinrück_Liang_Collins_Oosterhout_Beaujuge_Toney_2020, title={GIWAXS-SIIRkit: scattering intensity, indexing and refraction calculation toolkit for grazing-incidence wide-angle X-ray scattering of organic materials}, volume={53}, DOI={<a href=\"https://doi.org/10.1107/s1600576720005476\">10.1107/s1600576720005476</a>}, journal={Journal of Applied Crystallography}, author={Savikhin, Victoria and Steinrück, Hans-Georg and Liang, Ru-Ze and Collins, Brian A. and Oosterhout, Stefan D. and Beaujuge, Pierre M. and Toney, Michael F.}, year={2020}, pages={1108–1129} }","mla":"Savikhin, Victoria, et al. “GIWAXS-SIIRkit: Scattering Intensity, Indexing and Refraction Calculation Toolkit for Grazing-Incidence Wide-Angle X-Ray Scattering of Organic Materials.” <i>Journal of Applied Crystallography</i>, vol. 53, 2020, pp. 1108–29, doi:<a href=\"https://doi.org/10.1107/s1600576720005476\">10.1107/s1600576720005476</a>.","chicago":"Savikhin, Victoria, Hans-Georg Steinrück, Ru-Ze Liang, Brian A. Collins, Stefan D. Oosterhout, Pierre M. Beaujuge, and Michael F. Toney. “GIWAXS-SIIRkit: Scattering Intensity, Indexing and Refraction Calculation Toolkit for Grazing-Incidence Wide-Angle X-Ray Scattering of Organic Materials.” <i>Journal of Applied Crystallography</i> 53 (2020): 1108–29. <a href=\"https://doi.org/10.1107/s1600576720005476\">https://doi.org/10.1107/s1600576720005476</a>.","short":"V. Savikhin, H.-G. Steinrück, R.-Z. Liang, B.A. Collins, S.D. Oosterhout, P.M. Beaujuge, M.F. Toney, Journal of Applied Crystallography 53 (2020) 1108–1129.","apa":"Savikhin, V., Steinrück, H.-G., Liang, R.-Z., Collins, B. A., Oosterhout, S. D., Beaujuge, P. M., &#38; Toney, M. F. (2020). 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