@inproceedings{13006,
  author       = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim and A. Ivaniuk, Alexander and V. Klimets, Yuri and N. Yarmolik, Vyacheslav}},
  booktitle    = {{17th IEEE VLSI Test Symposium (VTS'99)}},
  pages        = {{384--390}},
  publisher    = {{IEEE}},
  title        = {{{Error Detecting Refreshment for Embedded DRAMs}}},
  doi          = {{10.1109/vtest.1999.766693}},
  year         = {{1999}},
}

@inproceedings{13066,
  author       = {{N. Yarmolik, Vyacheslav and V. Bykov, Iuri and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  booktitle    = {{Third European Dependable Computing Conference (EDCC-3)}},
  title        = {{{Transparent Word-Oriented Memory BIST Based on Symmetric March Algorithms}}},
  year         = {{1999}},
}

@inproceedings{13067,
  author       = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim and N. Yarmolik, Vyacheslav}},
  booktitle    = {{Design Automation and Test in Europe (DATE'99)}},
  pages        = {{702--707}},
  title        = {{{Symmetric Transparent BIST for RAMs}}},
  year         = {{1999}},
}

@techreport{13029,
  author       = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  title        = {{{Test und Synthese schneller eingebetteter Systeme}}},
  year         = {{1998}},
}

@misc{13091,
  author       = {{N. Yarmolik, Vyacheslav and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  keywords     = {{WORKSHOP}},
  title        = {{{Efficient Consistency Checking for Embedded Memories}}},
  year         = {{1998}},
}

@misc{13092,
  author       = {{N. Yarmolik, Vyacheslav and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  keywords     = {{WORKSHOP}},
  title        = {{{Efficient Consistency Checking for Embedded Memories}}},
  year         = {{1998}},
}

@inbook{13060,
  author       = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig, Andre}},
  booktitle    = {{Mixed-Mode BIST Using Embedded Processors}},
  publisher    = {{Kluwer Academic Publishers}},
  title        = {{{Mixed-Mode BIST Using Embedded Processors}}},
  year         = {{1998}},
}

@article{13061,
  author       = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig, Andre}},
  journal      = {{Journal of Electronic Testing Theory and Applications - JETTA}},
  number       = {{1/2}},
  pages        = {{127--138}},
  title        = {{{Mixed-Mode BIST Using Embedded Processors}}},
  volume       = {{12}},
  year         = {{1998}},
}

@article{13064,
  author       = {{Hellebrand, Sybille and Hertwig, Andre and Wunderlich, Hans-Joachim}},
  journal      = {{IEEE Design and Test}},
  number       = {{4}},
  pages        = {{36--41}},
  publisher    = {{IEEE}},
  title        = {{{Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications}}},
  volume       = {{15}},
  year         = {{1998}},
}

@inproceedings{13007,
  author       = {{Hertwig, Andre and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  booktitle    = {{16th IEEE VLSI Test Symposium (VTS'98)}},
  pages        = {{296--302}},
  publisher    = {{IEEE}},
  title        = {{{Fast Self-Recovering Controllers}}},
  doi          = {{10.1109/vtest.1998.670883}},
  year         = {{1998}},
}

@inproceedings{13008,
  author       = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim and N. Yarmolik, Vyacheslav}},
  booktitle    = {{Design Automation and Test in Europe (DATE'98)}},
  pages        = {{173--179}},
  title        = {{{Self-Adjusting Output Data Compression: An Efficient BIST Technique for RAMs}}},
  doi          = {{10.1109/date.1998.655853}},
  year         = {{1998}},
}

@inproceedings{13063,
  author       = {{N. Yarmolik, Vyacheslav and V. Klimets, Yuri and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  booktitle    = {{Design & Diagnostics of Electronic Circuits & Systems (DDECS'98)}},
  pages        = {{27--33}},
  title        = {{{New Transparent RAM BIST Based on Self-Adjusting Output Data Compression}}},
  year         = {{1998}},
}

@misc{13089,
  author       = {{Tsai, Kun-Han and Hellebrand, Sybille and Rajski, Janusz and Marek-Sadowska, Malgorzata}},
  keywords     = {{WORKSHOP}},
  title        = {{{STARBIST: Scan Autocorrelated Random Pattern Generation}}},
  year         = {{1997}},
}

@misc{13090,
  author       = {{Hertwig, Andre and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  keywords     = {{WORKSHOP}},
  title        = {{{Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications}}},
  year         = {{1997}},
}

@inproceedings{13009,
  author       = {{Tsai, Kun-Han and Hellebrand, Sybille and Marek-Sadowska, Malgorzata and Rajski, Janusz}},
  booktitle    = {{34th ACM/IEEE Design Automation Conference (DAC'97)}},
  publisher    = {{IEEE}},
  title        = {{{STARBIST: Scan Autocorrelated Random Pattern Generation}}},
  doi          = {{10.1109/dac.1997.597194}},
  year         = {{1997}},
}

@misc{13087,
  author       = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  keywords     = {{WORKSHOP}},
  title        = {{{Using Embedded Processors for BIST}}},
  year         = {{1996}},
}

@misc{13088,
  author       = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig, Andre}},
  keywords     = {{WORKSHOP}},
  title        = {{{Mixed-Mode BIST Using Embedded Processors}}},
  year         = {{1996}},
}

@inproceedings{13010,
  author       = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig, Andre}},
  booktitle    = {{IEEE International Test Conference (ITC'96)}},
  pages        = {{195--204}},
  publisher    = {{IEEE}},
  title        = {{{Mixed-Mode BIST Using Embedded Processors}}},
  doi          = {{10.1109/test.1996.556962}},
  year         = {{1996}},
}

@techreport{13026,
  author       = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  title        = {{{Synthesis Procedures for Self-Testable Controllers}}},
  year         = {{1995}},
}

@techreport{13027,
  author       = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim and Goncalves, F. and Paulo Teixeira, Joao}},
  title        = {{{Evaluation of Self-Testable Controller Architectures Based on Realistic Fault Analysis}}},
  year         = {{1995}},
}